Evaluation of the ionization quenching effect in an organic plastic scintillator using kV x-rays and a modified Birks model with explicit account of secondary electrons

2020 ◽  
Vol 131 ◽  
pp. 106222 ◽  
Author(s):  
Grichar Valdes Santurio ◽  
Massimo Pinto ◽  
Claus E. Andersen
2018 ◽  
Vol 89 (10) ◽  
pp. 103112 ◽  
Author(s):  
Qingyuan Hu ◽  
Jiamin Ning ◽  
Fan Ye ◽  
Shijian Meng ◽  
Yi Qin ◽  
...  

1994 ◽  
Vol 38 ◽  
pp. 127-137
Author(s):  
Maria F. Ebel ◽  
Robert Svagera ◽  
Horst Ebel ◽  
Robert Hobl ◽  
Michael Mantler ◽  
...  

The measurement of the total electron yield (TEY) emitted from a solid specimen when irradiated by monochromatic x-rays is used for quantitative information on the specimen. For this purpose one has to determine the increase of TEY in the course of a variation of the photon energy from below to above the absorption edges of the specimen elements. These increases are the analytical quantities and are correlated with the composition of the specimen. The detected electrons are photo, Auger and secondary electrons. Most of them lost some of their original kinetic energy due to inelastic collisions along their path from the atom of origin to the surface. Low energy electrons are especially found in the secondary electron peak with electron energies of less than 20eV. Electrically nonconductive specimens under x-irradiation tend to positive surface charging.


The velocity distribution of the secondary electrons produced by bombarding a metallic face with a stream of primary electrons has been a matter of interest ever since the beginning of the study of secondary electron emission. As early as in 1908, Richardson and von Baeyer independently showed that slow moving electrons were copiously reflected from conducting faces. Farnsworth showed that for primary electrons having velocities less than 9 volts, most of the secondary electrons had velocities equal to the primary. As the primary potential was increased, the percentage of the reflected electrons decreased gradually but was appreciable at 110 volts. Davisson and Kunsman obtained reflected electrons even at primary potentials of 1000 and 1500 volts in the cases of some metal faces. At higher potentials we have also the electrons that undergo the Davisson and Germer scattering from the many crystal facets on the bombarded targets. As the potential is increased, the number of electrons with low velocities increases steadily and at large applied potentials, we have a large percentage of these in the secondary beam. These conclusions followed as a result of the work of Farnsworth who studied the distribution of velocities of the secondary electrons by the retarding potential method. He did not actually calculate the energy distribution from his curves but has drawn attention to the above conclusions. A careful investigation of the velocity distribution of the secondary electrons from various conducting faces was made by Rudberg at primary potentials ranging up to about 1000 volts. He adopted a magnetic deflection method similar to the one used in the analysis of the β rays and of the electrons excited by X-rays. The method had indeed been used by previous workers for the study of secondary emission, but Rudberg improved the technique considerably and obtained better focussing conditions. His results suggest that there are three groups of electrons in the secondary beam. The first group contains electrons returning with the same velocity as the primary. In the second group of electrons, we have those which undergo inelastic collisions with the orbital and structure electrons and hence are returned with some loss of energy. Richardson has drawn attention to the well-marked minimum between the two groups in Rudberg’s curves and infers that free electrons are not involved in the collisions. Finally there is the third group which contains the slow secondary electrons. The second and the third groups appear to be definitely connected with each other since they are both predominant at high primary potentials and become negligible at low primary potentials. Richardson suggests that the third group is the result of the excitation accompanying the inelastic collisions.


The importance of secondary electron emission in its relation to the excitation of soft X-rays has been pointed out in a recent paper by Prof. O. W. Richardson. He has shown that at every potential where there is an increased excitation of soft X-rays, there is correspondingly an increase in the emission of secondary electrons, and has discussed at some length the mechanism of the generation of secondary electrons. It was therefore felt that a much clearer idea of the phenomenon of soft X-ray excitation from metallic surfaces could be had by studying the secondary electron emission from polycrystalline and single crystal faces. As early as in 1908 Richardson showed that slowly moving electrons are reflected in considerable proportion from metallic plates. Davisson and Kunsman, in a series of papers commencing from 1921, showed that at low voltages up to about 9 volts most of the secondary electrons were purely reflected electrons with velocities the same as the incident electrons. The percentage of the reflected electrons fell rapidly as the applied potential was increased above 9 volts, while that of low velocity electrons increased steadily. Farnsworth, with improved apparatus, added much valuable information regarding the generation of secondary electrons and the conditions operating in such cases. These observers showed that the total emission of secondary electrons from a metal surface depended on the applied potential, the nature of the surface and the previous heat treatment of the metal. They also found that the ratio of the secondary beam to the primary increases with applied potential and becomes greater than 1 after a certain potential, depending on the nature of the bombarded metal, is reached.


The results of the various investigations which have been carried out during the last few years on the critical potentials for the excitation of soft X-rays, and for the production of secondary electrons, from solids, have shown that the effects occurring at solid surfaces under electronic bombardment in vacuo are more complex than was anticipated when this line of investigation was begun, and that they cannot be interpreted in any simple way in terms of the displacements of electrons within the atoms of the target. The work of various investigators* on the distribution of velocities among the electrons leaving a surface subjected to bombardment by primary electrons of known energy, has shown that a certain number of the electrons leaving the bombarded surface have energies practically equal to that of the primary stream, suggesting that a readily detectable proportion of the primary electrons is scattered or reflected at the target surface without appreciable loss of energy. The proportion of such electrons is greatest for small bombarding energies, e.g ., about 10 volts, and decreases as the voltage accelerating the primary electrons increases. The other marked feature in the velocity distribution curves, for bombarding voltages up to about 1000, is a group having a sharp maximum at about 10 volts. Apart from these features the distribution is a more or less continuous one, the number of electrons having a given velocity increasing as that velocity increases, except that after achieving a small maximum at about 25 volts less than the primary voltage, the curve falls to a minimum before rising to the very sharp peak indicating true reflection There are no indications of maxima for electron energies differing from the primary by amounts corresponding to those required to effect characteristic electron transitions within the atoms of the target. Moreover, there appears to be nothing in the velocity distribution curves for the secondary emission to correspond to the discontinuities which have been found by various investigators to occur in the current-voltage curves of the secondary electron current from a bombarded surface, or in the current-voltage curves of the photoelectric effect of the soft X-radiation excited by the bombardment. As regards the latter effect an explanation is to hand on the view that the proportion of the primary electrons whose energy is converted, in part, to photoelectrically active radiation is so small that indications of the various different energy transfers suggested by the critical potential curves are swamped in the velocity distribution curves of the secondary electrons. It is, however, more difficult to reconcile the absence of any correlation between the discontinuities which have been observed in the current-voltage curves for secondary electron emission, and the velocity distribution of the latter.


1940 ◽  
Vol 23 (3) ◽  
pp. 391-400 ◽  
Author(s):  
Roy M. Whelden ◽  
Charles E. Buchwald ◽  
Franklin S. Cooper ◽  
Caryl P. Haskins

A study has been undertaken of the rate of inactivation of spores of the ascomycete fungus Aspergillus niger when bombarded in vacuum, with homogeneous beams of cathode rays of energies from 4 to 15 electron kv. and current densities of 1 x 10–7 to 3 x 10–6 amperes per square cm. These velocities and densities are in the range of those of showers of secondary electrons produced in biological materials irradiated with moderately soft x-rays, and so may be made to serve as quantitative indicators of the mechanics of x-ray action. Four qualitative effects are described.


1994 ◽  
Vol 38 ◽  
pp. 325-335
Author(s):  
Horst Ebel ◽  
Robert Svagera ◽  
Maria F. Ebel ◽  
Norbert Zagler

An irradiation of solid samples with x-rays causes an electron emission from the sample surface, owing to photoabsorption. These electrons can be detected under vacuum conditions and are photo, Auger and secondary electrons. Due to inelastic collisions most of these electrons have lost some of their original kinetic energy along the path from the atom of origin to the surface. With nondispersive electron detection the total electron yield (TEY) is observed. For measurements performed with a tunable x-ray monochromator information on the qualitative composition can be obtained by the following procedure. The photon energy has to be timed from below to above of one of the absorption edges of a given element. In case of its presence in the specimen an increase of the TEY-signal can be observed.


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