Effect of trace impurities on the creep behavior of a near α titanium alloy

2008 ◽  
Vol 59 (6) ◽  
pp. 591-594 ◽  
Author(s):  
H MISHRA ◽  
D SATYANARAYANA ◽  
T NANDY ◽  
P SAGAR
Keyword(s):  
Titanium Alloy ◽  
Creep Behavior ◽  
Trace Impurities

Effect of nano-Y2O3 addition on the creep behavior of an as-cast near-α titanium alloy

2021 ◽  
pp. 111249
Author(s):  
Zhuangzhuang Zheng ◽  
Fantao Kong ◽  
Yuyong Chen ◽  
Xiaopeng Wang
Keyword(s):  
Titanium Alloy ◽  
Creep Behavior ◽  
Y2o3 Addition

MODELING OF THE COOL CREEPIN THE FRAMEWORK OF THE HARDENING THEORIES ON THE STEPWISE LOADING

2021 ◽  
Author(s):  
S. P. Pomytkin ◽  
◽  
K. А. Gukasjan ◽  
Keyword(s):  
Titanium Alloy ◽  
Experimental Method ◽  
Creep Behavior ◽  
Constitutive Equations ◽  
Room Temperature ◽  
Stress Change ◽  
Material Constants ◽  
Hardening Theory ◽  
Stepwise Loading

In the framework of the hardening hypothesis, the creep behavior of a titanium alloy at room temperature is modeled at stepwise stress change both increasing and decreasing load. Methods for the identification of material constants and functions included in constitutive equations of the hardening theories are considered in detail. The prospects for the computational-experimental method proposed by Rybakina for determination of material constants in some versions of the hardening theory are noted. The results of the creep modeling of titanium alloy confirm the existing theoretical possibilities and limitations of the hardening hypothesis fully.

Creep Behavior of Fusion Zone and Base Metal of the Electron Beam Weldments of a Near-alpha Titanium Alloy

2010 ◽  
Vol 26 (6) ◽  
pp. 564-571 ◽  
Author(s):  
Zhiyong Chen ◽  
Jinwei Li ◽  
Jie Liu ◽  
Qingjiang Wang ◽  
Jianrong Liu ◽  
...  
Keyword(s):  
Titanium Alloy ◽  
Electron Beam ◽  
Fusion Zone ◽  
Base Metal ◽  
Creep Behavior ◽  
Alpha Titanium

scholarly journals Characterization and Modeling of Room-Temperature Compressive Creep Behavior of a Near α TA31 Titanium Alloy

Metals ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 1190
Author(s):  
Weixin Yu ◽  
Shusen Hou ◽  
Zhijun Yang ◽  
Jinyong Zhang ◽  
Shaoting Lang
Keyword(s):  
Titanium Alloy ◽  
Steady State ◽  
Strain Rate ◽  
Compressive Stress ◽  
Creep Behavior ◽  
Room Temperature ◽  
Steady State Creep ◽  
Creep Model ◽  
Compression Tests ◽  
Creep Stage

The creep behavior of a near α TA31 titanium alloy under different compressive pressures has been studied by long-time (up to 500 h) compression tests at room temperature. The experimental results show that several thresholds of the compressive pressure were found to exist in the compression process of the TA31 alloy. When the compressive stress is lower than 0.80Rp0.2, there is no creep. There is a steady-state creep stage at the compressive stresses between 0.85Rp0.2 and 0.93Rp0.2, in which the strain rate is approximately a constant value. When the compressive stress reaches a threshold stress between 0.93Rp0.2 and 0.95Rp0.2, the sample enters the accelerating creep stage directly. The creep model of TA31 alloy has been built by using the regression method, from which the creep strain rate of TA31 titanium alloy in the steady-state creep stage under different compressive stress levels can be calculated. The mean difference between the calculated and the experimental value is 2.54%, indicating the creep model can efficiently predict the creep behavior of TA31 alloy.

Tensile creep behavior of heat-treated TC11 titanium alloy at 450–550°C

2013 ◽  
Vol 575 ◽  
pp. 74-85 ◽  
Author(s):  
Yi Gu ◽  
Fanhao Zeng ◽  
Yanling Qi ◽  
Changqing Xia ◽  
Xiang Xiong
Keyword(s):  
Titanium Alloy ◽  
Creep Behavior ◽  
Tensile Creep ◽  
Heat Treated ◽  
Tc11 Titanium Alloy

Atomic force microscopy (AFM) of the topography of silicon surfaces exposed to ion beams

1992 ◽  
Vol 50 (2) ◽  
pp. 1132-1133
Author(s):  
Mark Denker ◽  
Jennifer Wall ◽  
Mark Ray ◽  
Richard Linton
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Incidence Angle ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beams ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Trace Impurities ◽  
Energy Dose

Reactive ion beams such as O2+ and Cs+ are used in Secondary Ion Mass Spectrometry (SIMS) to analyze solids for trace impurities. Primary beam properties such as energy, dose, and incidence angle can be systematically varied to optimize depth resolution versus sensitivity tradeoffs for a given SIMS depth profiling application. However, it is generally observed that the sputtering process causes surface roughening, typically represented by nanometer-sized features such as cones, pits, pyramids, and ripples. A roughened surface will degrade the depth resolution of the SIMS data. The purpose of this study is to examine the relationship of the roughness of the surface to the primary ion beam energy, dose, and incidence angle. AFM offers the ability to quantitatively probe this surface roughness. For the initial investigations, the sample chosen was <100> silicon, and the ion beam was O2+.Work to date by other researchers typically employed Scanning Tunneling Microscopy (STM) to probe the surface topography.

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