Long wavelength vertically stacked InAs/GaAs(001) quantum dots with a bimodal size distribution: Optical properties and electronic coupling

2004 ◽  
Vol 36 (1-3) ◽  
pp. 55-61 ◽  
Author(s):  
B. Ilahi ◽  
L. Sfaxi ◽  
H. Maaref ◽  
G. Bremond ◽  
G. Guillot
2000 ◽  
Vol 380 (1-2) ◽  
pp. 78-81 ◽  
Author(s):  
V Yam ◽  
Vinh Le Thanh ◽  
U Compagnon ◽  
U Gennser ◽  
P Boucaud ◽  
...  

2005 ◽  
Vol 87 (14) ◽  
pp. 143108 ◽  
Author(s):  
Young-Jun Yu ◽  
In-Taek Jeong ◽  
Jong-Chun Woo ◽  
Wonho Jhe

1999 ◽  
Vol 16 (4) ◽  
pp. 298-300 ◽  
Author(s):  
Wei Zhou ◽  
Bo Xu ◽  
Huai-zhe Xu ◽  
Feng-qi Liu ◽  
Qian Gong ◽  
...  

2007 ◽  
Vol 31 ◽  
pp. 132-134
Author(s):  
P. Boonpeng ◽  
S. Panyakeow ◽  
S. Ratanathammaphan

InAs quantum dots (QDs) have been grown by solid-source molecular beam epitaxy on different InxGa1-xAs (0 ≤ x ≤ 0.3) to investigate the effect of In-mole-fraction and thickness of InGaAs insertion layer (IL) on the structural and optical properties of the QDs. The density of QDs directly grown on GaAs is 1×1010 cm-2, and increase to 1.4-1.8×1010 cm-2 on InGaAs layers which depend on the In-mole-fraction and thickness of InGaAs layers. The effects of In-mole-fraction and thickness of InGaAs insertion layer on optical properties of the QDs are studied by photoluminescence (PL). The FWHM of PL spectrum corresponds to the size distribution of the QDs.


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