Edge effect at the microsphere colloidal array in near-field particle lithography on polymer surfaces

2022 ◽  
pp. 101735
Author(s):  
Andrey Afanasiev ◽  
Alexander Pikulin ◽  
Igor Ilyakov ◽  
Boris Shishkin ◽  
Nikita Bityurin
Keyword(s):  
Edge Effect ◽  
Near Field ◽  
Polymer Surfaces ◽  
Particle Lithography

Extraordinary optical transmission from a thin microcavity by macroscopic quantum effect

2021 ◽  
Author(s):  
Lin Zhang ◽  
Jiu Hui Wu
Keyword(s):  
Edge Effect ◽  
Optical Transmission ◽  
Critical Radius ◽  
Quantum Effect ◽  
Near Field ◽  
Extraordinary Optical Transmission ◽  
Wave Regime ◽  
Incident Wavelength ◽  
Macroscopic Quantum ◽  
Wave Particle Duality

Abstract The macroscopic quantum effect is revealed to elaborate the extraordinary optical transmission (EOT) from a subwavelength thin microcavity based on the uncertainty property of the transmitted electromagnetic fields after the aperture. A critical radius is found in the thin microcavity under a certain incident electromagnetic wavelength. With the aperture radius varying, the transmitted field can be divided into three regimes: I. the macroscopic quantum regime when the aperture radius is less than the critical radius, in which the field edge effect occurs and EOT phenomenon is perfectly manifested; II. The wave-particle duality regime in the vicinity of the critical radius, in which the edge effect and diffraction phenomenon exist simultaneously; III. The wave regime when the aperture radius is greater than the critical radius, in which the near-field diffraction emerges. In addition, the influences of incident wavelength and microcavity thickness on EOT are also investigated. Our research have potential applications in advanced optical devices, such as light switch and optical manipulations.

Application of Scanning Force and Near Field Microscopies to the Characterization of Minimally Adhesive Polymer Surfaces

Biofouling ◽  
2003 ◽  
Vol 19 (sup1) ◽  
pp. 99-104 ◽  
Author(s):  
Boris B Akhremitchev ◽  
Jason E Bemis ◽  
Sabah Al-Maawali ◽  
Yujie Sun ◽  
Larissa Stebounova ◽  
...  
Keyword(s):  
Near Field ◽  
Polymer Surfaces ◽  
Scanning Force

Influence of gas inertia and edge effect on squeeze film in near field acoustic levitation

2010 ◽  
Vol 96 (24) ◽  
pp. 243507 ◽  
Author(s):  
Jin Li ◽  
Wenwu Cao ◽  
Pinkuan Liu ◽  
Han Ding
Keyword(s):  
Edge Effect ◽  
Near Field ◽  
Squeeze Film ◽  
Acoustic Levitation

Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

2010 ◽  
Vol 132 (3) ◽  
Author(s):  
Zone-Ching Lin ◽  
Ming-Ho Chou
Keyword(s):  
Edge Effect ◽  
Experimental Measurement ◽  
Morse Potential ◽  
Standard Sample ◽  
Near Field ◽  
Surface Profile ◽  
Interaction Force ◽  
Optical Microscope ◽  
Atomic Interaction ◽  
Effect Of Surface

This study constructs a novel scanning near-field optical microscope (SNOM) fixed-amplitude simulative measuring model. It uses Al, Si, and O atoms to compose the probe tip and sample to construct the atomic model of SNOM simulative measuring model. It also applies Morse potential to calculate the atomic interaction force between tip and sample on the vibration theory of SNOM. This study compares the edge effect of surface profile between the simulated measurement with experimental measurement; it verifies that the nanoscale simulative measuring model for SNOM is reasonable and accurate. After analyzing the edge effect and error about the surface profile of standard sample by the SNOM simulated measurement, it is found that the factor influencing this surface profile appearance is mainly from the tip shapes. The investigation of the error analysis is referential in compensating the error of SNOM measurement and it can be used to further enhance the accuracy of SNOM measurement.

Effects of Electrical Discharges in Low Pressure Gases on the Morphology of Polyethylene Crystals

1974 ◽  
Vol 32 ◽  
pp. 544-545
Author(s):  
L.H. Bolz ◽  
D.H. Reneker
Keyword(s):  
Power Distribution ◽  
Electrical Discharge ◽  
Dielectric Breakdown ◽  
Ionic Species ◽  
Low Pressure ◽  
Polymer Surfaces ◽  
Electrical Discharges ◽  
Adhesive Bonds ◽  
Power Distribution Lines ◽  
Modification Of The Surface

The attack, on the surface of a polymer, by the atomic, molecular and ionic species that are created in a low pressure electrical discharge in a gas is interesting because: 1) significant interior morphological features may be revealed, 2) dielectric breakdown of polymeric insulation on high voltage power distribution lines involves the attack on the polymer of such species created in a corona discharge, 3) adhesive bonds formed between polymer surfaces subjected to such SDecies are much stronger than bonds between untreated surfaces, 4) the chemical modification of the surface creates a reactive surface to which a thin layer of another polymer may be bonded by glow discharge polymerization.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Thrombus formation on artificial surfaces: Correlative microscopy

1990 ◽  
Vol 48 (3) ◽  
pp. 840-841
Author(s):  
Quintin J. Lai ◽  
Stuart L. Cooper ◽  
Ralph M. Albrecht
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Low Voltage ◽  
Thrombus Formation ◽  
Blood Platelets ◽  
Polymer Surfaces ◽  
Flow Conditions ◽  
Transmission Electron ◽  
Adhesion Of Platelets ◽  
Microscopic Techniques

Thrombus formation and embolization are significant problems for blood-contacting biomedical devices. Two major components of thrombi are blood platelets and the plasma protein, fibrinogen. Previous studies have examined interactions of platelets with polymer surfaces, fibrinogen with platelets, and platelets in suspension with spreading platelets attached to surfaces. Correlative microscopic techniques permit light microscopic observations of labeled living platelets, under static or flow conditions, followed by the observation of identical platelets by electron microscopy. Videoenhanced, differential interference contrast (DIC) light microscopy permits high-resolution, real-time imaging of live platelets and their interactions with surfaces. Interference reflection microscopy (IRM) provides information on the focal adhesion of platelets on surfaces. High voltage, transmission electron microscopy (HVEM) allows observation of platelet cytoskeletal structure of whole mount preparations. Low-voltage, high resolution, scanning electron microscopy allows observation of fine surface detail of platelets. Colloidal gold-labeled fibrinogen, used to identify the Gp Ilb/IIIa membrane receptor for fibrinogen, can be detected in all the above microscopies.

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