A statistical parameter study of indium tin oxide thin films deposited by radio-frequency sputtering
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2013 ◽
Vol 24
(10)
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pp. 3646-3651
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2019 ◽
Vol 19
(3)
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pp. 1455-1462
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1983 ◽
Vol 1
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pp. 1563-1564
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1999 ◽
Vol 351
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pp. 137-140
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2017 ◽
Vol 728
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pp. 1338-1345
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