A statistical parameter study of indium tin oxide thin films deposited by radio-frequency sputtering

2005 ◽  
Vol 476 (1) ◽  
pp. 59-64 ◽  
Author(s):  
Seung-Ik Jun ◽  
Timothy E. McKnight ◽  
Michael L. Simpson ◽  
Philip D. Rack
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Olaf Zywitzki ◽  
Thomas Preußner ◽  
Torsten Kopte

2017 ◽  
Vol 728 ◽  
pp. 1338-1345 ◽  
Author(s):  
Lihua Zhang ◽  
Jianbo Lan ◽  
Jianyu Yang ◽  
Shenghui Guo ◽  
Jinhui Peng ◽  
...  

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