Interpretation of the two-components observed in high resolution X-ray diffraction ω scan peaks for mosaic ZnO thin films grown on c-sapphire substrates using pulsed laser deposition
Keyword(s):
X Ray
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2010 ◽
Vol 123-125
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pp. 375-378
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Keyword(s):
2013 ◽
Vol 710
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pp. 25-28
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Keyword(s):
2011 ◽
Vol 47
(4)
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pp. 415-422
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Keyword(s):
2011 ◽
Vol 383-390
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pp. 6289-6292