Characterisation of thin film silicon films deposited by plasma enhanced chemical vapour deposition at 162MHz, using a large area, scalable, multi-tile-electrode plasma source

2011 ◽  
Vol 519 (20) ◽  
pp. 6884-6886 ◽  
Author(s):  
E. Monaghan ◽  
T. Michna ◽  
C. Gaman ◽  
D. O'Farrel ◽  
K. Ryan ◽  
...  
2003 ◽  
Vol 93 ◽  
pp. 453-458 ◽  
Author(s):  
H. Mahfoz-Kotb ◽  
A.C. Salaün ◽  
T. Mohammed-Brahim ◽  
F. Bendriaa ◽  
F. Le Bihan ◽  
...  

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