Characterisation of thin film silicon films deposited by plasma enhanced chemical vapour deposition at 162MHz, using a large area, scalable, multi-tile-electrode plasma source
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1998 ◽
Vol 6
(4)
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pp. 219-231
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Keyword(s):
2001 ◽
Vol 395
(1-2)
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pp. 125-129
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2003 ◽
Vol 93
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pp. 453-458
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1997 ◽
Vol 12
(2)
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pp. 224-227
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Keyword(s):
2011 ◽
Vol 11
(9)
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pp. 8202-8205
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1995 ◽
Vol 153
(1-2)
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pp. 25-30
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1996 ◽
Vol 31
(4)
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pp. 1013-1019
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