Influence of the V/III ratio in the gas phase on thin epitaxial AlN layers grown on (0001) sapphire by high temperature hydride vapor phase epitaxy

2014 ◽  
Vol 573 ◽  
pp. 140-147 ◽  
Author(s):  
A. Claudel ◽  
V. Fellmann ◽  
I. Gélard ◽  
N. Coudurier ◽  
D. Sauvage ◽  
...  
2012 ◽  
Vol 526 ◽  
pp. 103-109 ◽  
Author(s):  
M. Balaji ◽  
A. Claudel ◽  
V. Fellmann ◽  
I. Gélard ◽  
E. Blanquet ◽  
...  

2014 ◽  
Vol 403 ◽  
pp. 29-31 ◽  
Author(s):  
Troy Baker ◽  
Ashley Mayo ◽  
Zeinab Veisi ◽  
Peng Lu ◽  
Jason Schmitt

1996 ◽  
Vol 449 ◽  
Author(s):  
S. A. Safvi ◽  
N. R. Perkins ◽  
M. N. Horton ◽  
T. F. Kuech

ABSTRACTThe effects of flowrate variation and geometry on the growth rate, growth uniformity and crystal quality were investigated in a horizontal Gallium Nitride vapor phase epitaxy reactor. To better understand the effects of these parameters, numerical model predictions are compared to experimentally observed values. Parasitic gas phase reactions between group III and group V sources and deposition of material on the wall are shown to lead to reduced overall growth rates and may be responsible for inferior crystal quality. A low ammonia concentration is correlated with the deposition of polycrystalline films. A low V/III ratio and an ammonia concentration lead to poor crystalline quality and increased yellow luminescence. An optimum HVPE growth process requires selection of reactor geometry and operating conditions to minimize these parasitic reactions and wall deposition while providing a uniform reactant distribution across the substrate.


2013 ◽  
Vol 10 (3) ◽  
pp. 362-365 ◽  
Author(s):  
N. Coudurier ◽  
R. Boichot ◽  
V. Fellmann ◽  
A. Claudel ◽  
E. Blanquet ◽  
...  

2013 ◽  
Vol 46 ◽  
pp. 102-106 ◽  
Author(s):  
Nicolas Coudurier ◽  
Raphaël Boichot ◽  
Fréderic Mercier ◽  
Roman Reboud ◽  
Sabine Lay ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document