Adhesion mode atomic force microscopy study of dual component protein films

Ultramicroscopy ◽

10.1016/j.ultramic.2004.10.006 ◽

2005 ◽

Vol 102 (4) ◽

pp. 257-268 ◽

Author(s):

Aashiish Agnihotri ◽

Christopher A. Siedlecki

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Protein Films ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy ◽

Component Protein

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Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Applied Physics Letters ◽

10.1063/1.125581 ◽

1999 ◽

Vol 75 (26) ◽

pp. 4198-4200 ◽

Author(s):

G. Bar ◽

L. Delineau ◽

R. Brandsch ◽

M. Bruch ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Indentation Depth ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Examination of Butadiene/Styrene-co-butadiene Rubber Blends by Tapping Mode Atomic Force Microscopy. Importance of the Indentation Depth and Reduced Tip−Sample Energy Dissipation in Tapping Mode Atomic Force Microscopy Study of Elastomers

Langmuir ◽

10.1021/la9913699 ◽

2000 ◽

Vol 16 (13) ◽

pp. 5702-5711 ◽

Author(s):

G. Bar ◽

M. Ganter ◽

R. Brandsch ◽

L. Delineau ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Butadiene Rubber ◽

Atomic Force Microscopy Study ◽

Tapping Mode ◽

Rubber Blends ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy ◽

Butadiene Styrene

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Factors Affecting the Height and Phase Images in Tapping Mode Atomic Force Microscopy. Study of Phase-Separated Polymer Blends of Poly(ethene-co-styrene) and Poly(2,6-dimethyl-1,4-phenylene oxide)

Langmuir ◽

10.1021/la970091m ◽

1997 ◽

Vol 13 (14) ◽

pp. 3807-3812 ◽

Author(s):

G. Bar ◽

Y. Thomann ◽

R. Brandsch ◽

H.-J. Cantow ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Polymer Blends ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Factors Affecting ◽

Force Microscopy ◽

Atomic Force ◽

Phenylene Oxide ◽

Phase Images ◽

Mode Atomic Force Microscopy

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Discrimination of Dendrimer Aggregates on Mica Based on Adhesion Force: A Pulsed Force Mode Atomic Force Microscopy Study

Langmuir ◽

10.1021/la0008378 ◽

2000 ◽

Vol 16 (24) ◽

pp. 9294-9298 ◽

Author(s):

Hua Zhang ◽

P. C. M. Grim ◽

T. Vosch ◽

U.-M. Wiesler ◽

A. J. Berresheim ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Adhesion Force ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Conductive-Mode Atomic Force Microscopy Study of Amorphous Silicon Nitride Thin Films

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.l1321 ◽

2003 ◽

Vol 42 (Part 2, No. 11A) ◽

pp. L1321-L1323 ◽

Author(s):

Yoichiro Aya ◽

Atsushi Ando ◽

Satoshi Yamasaki ◽

Kenichiro Wakisaka

Keyword(s):

Atomic Force Microscopy ◽

Silicon Nitride ◽

Amorphous Silicon ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Amorphous Silicon Nitride ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

Bone Abstracts ◽

10.1530/boneabs.1.pp48 ◽

2013 ◽

Author(s):

Petar Milovanovic ◽

Zlatko Rakocevic ◽

Jelena Potocnik ◽

Danijela Djonic ◽

Vladimir Zivkovic ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Hip Fracture ◽

Femoral Neck ◽

Cortical Bone ◽

Microscopy Study ◽

Bone Fragility ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Atomic Force Microscopy study on the effect of different lecithins in cocoa-butter based suspensions

Colloids and Surfaces A Physicochemical and Engineering Aspects ◽

10.1016/j.colsurfa.2016.03.057 ◽

2016 ◽

Vol 499 ◽

pp. 60-68 ◽

Author(s):

D. Middendorf ◽

U. Bindrich ◽

P. Mischnick ◽

A. Juadjur ◽

K. Franke ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cocoa Butter ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Applied Physics Letters ◽

10.1063/5.0053848 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243301

Author(s):

Yusuke Morino ◽

Yasuyuki Yokota ◽

Ken-ichi Bando ◽

Hisaya Hara ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Double Layer ◽

Electric Double Layer ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Interfaces

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Adsorption of Polyethylenimine on Graphite: An Atomic Force Microscopy Study

Macromolecules ◽

10.1021/ma0345293 ◽

2003 ◽

Vol 36 (25) ◽

pp. 9510-9518 ◽

Author(s):

Marc Schneider ◽

Martin Brinkmann ◽

Helmuth Möhwald

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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An atomic force microscopy study of thin copper oxide films grown by molecular beam epitaxy on MgO(100)

Thin Solid Films ◽

10.1016/0040-6090(96)08574-4 ◽

1996 ◽

Vol 281-282 ◽

pp. 57-59 ◽

Author(s):

A. Brazdeikis ◽

U.O. Karlsson ◽

A.S. Flodström

Keyword(s):

Atomic Force Microscopy ◽

Molecular Beam Epitaxy ◽

Copper Oxide ◽

Molecular Beam ◽

Oxide Films ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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