Approximant-based orientation determination of quasicrystals using electron backscatter diffraction

AbstractUnderstanding the growth of whiskers or high aspect ratio features on substrates can be aided when the crystallography of the feature is known. This study has evaluated three methods that utilize electron backscatter diffraction (EBSD) for the determination of the crystallographic growth direction of an individual whisker. EBSD has traditionally been a technique applied to planar, polished samples, and thus the use of EBSD for out-of-surface features is somewhat more difficult and requires additional steps. One of the methods requires the whiskers to be removed from the substrate resulting in the loss of valuable physical growth relationships between the whisker and the substrate. The other two techniques do not suffer this disadvantage and provide the physical growth information as well as the crystallographic growth directions. The final choice of method depends on the information required. The accuracy and the advantages and disadvantages of each method are discussed.

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Twin and topotactic growth of β-eucryptite dendrites and their lattice coincidence analysed by the reticular theory

Journal of Applied Crystallography ◽

10.1107/s0021889812047553 ◽

2013 ◽

Vol 46 (1) ◽

pp. 216-223

Author(s):

Shan-Rong Zhao ◽

Hai-Jun Xu ◽

Rong Liu ◽

Qin-Yan Wang ◽

Xian-Yu Liu

Keyword(s):

Solid Solution ◽

Crystallographic Orientation ◽

Electron Backscatter Diffraction ◽

Electron Backscatter ◽

Ebsd Technique ◽

Backscatter Diffraction ◽

Orientation Determination

Snowflake-shaped dendrites of β-eucryptite–β-quartz solid solution were artificially crystallized in a matt glaze, and the crystallographic orientation of the dendrites was analysed by the electron backscatter diffraction (EBSD) technique. The six branches of a snowflake-shaped dendrite in the plane (0001) are along 〈110〉. From the orientation determination, a twin relationship and a topotactic relationship between dendrites were found. The twin axes are [011], [0{\overline 1}1] and [210], and the twin planes perpendicular to the twin axes are ({\overline 1}2{\overline 1}2) and (1{\overline 2}12). From the reticular theory of twinning, it was calculated that the twin indexn= 2 and the obliquity ω = 3.2877°. The studied dendrite is a twin by reticular pseudomerohedry with low twin index and obliquity. In the topotactic growth, no twin elements have been found, but the three main crystallographic directions 〈001〉, 〈210〉 and 〈110〉 of the two dendritic crystals overlap each other. The degree of lattice coincidence between the two crystals in this topotactic growth is also discussed.

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Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation

Crystal Research and Technology ◽

10.1002/crat.201300217 ◽

2014 ◽

Vol 49 (4) ◽

pp. 195-203 ◽

Cited By ~ 2

Author(s):

T. Riedl ◽

H. Wendrock

Keyword(s):

High Resolution ◽

Cross Correlation ◽

Electron Backscatter Diffraction ◽

Diffraction Determination ◽

Resolution Electron ◽

Electron Backscatter ◽

Backscatter Diffraction

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All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg

Microscopy and Microanalysis ◽

10.1017/s1431927600008825 ◽

1997 ◽

Vol 3 (S2) ◽

pp. 387-388 ◽

Cited By ~ 1

Author(s):

J. R. Michael

Keyword(s):

Electron Backscatter Diffraction ◽

Photographic Film ◽

Phase Identification ◽

Electron Backscattered Diffraction ◽

Bulk Specimen ◽

Electron Backscatter ◽

Backscatter Diffraction ◽

Over 40 Years ◽

Orientation Determination ◽

Scanning Electron

This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.

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Crystallographic correlation between 5M and 7M martensite in an Ni–Mn–Ga alloy

Journal of Applied Crystallography ◽

10.1107/s1600576716002223 ◽

2016 ◽

Vol 49 (2) ◽

pp. 507-512

Author(s):

Zongbin Li ◽

Zhenzhuang Li ◽

Bo Yang ◽

Yudong Zhang ◽

Claude Esling ◽

...

Keyword(s):

Lattice Distortion ◽

Electron Backscatter Diffraction ◽

Deep Insight ◽

Ferromagnetic Shape Memory Alloys ◽

Electron Backscatter ◽

Ferromagnetic Shape Memory ◽

Backscatter Diffraction ◽

Orientation Determination ◽

Specific Orientation ◽

Insight Into

In Ni–Mn–Ga ferromagnetic shape memory alloys, a structural transformation from one type of martensite to another is frequently observed upon cooling or heating. In this work, the microstructural features associated with the transformation from 5M to 7M martensite in an Ni50Mn26Ga22Cu2 alloy were studied. On the basis of the crystallographic orientation determination and an examination of the microstructure by means of the electron backscatter diffraction technique, the 5M to 7M transformation was found to be accompanied by the thickening of martensite plates. The two kinds of martensite (5M and 7M) possess a specific orientation relationship with (001)5M//(001)7M and [100]5M//[100]7M. Through further lattice distortion, four types of 5M variant can evolve into four 7M martensite variants in one variant colony. The present study is expected to provide a deep insight into the crystallographic correlation between 5M and 7M martensite in Ni–Mn–Ga alloys.

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Determination of dislocation density by electron backscatter diffraction and X-ray line profile analysis in ferrous lath martensite

Materials Characterization ◽

10.1016/j.matchar.2015.11.014 ◽

2016 ◽

Vol 113 ◽

pp. 117-124 ◽

Cited By ~ 15

Author(s):

Tibor Berecz ◽

Péter Jenei ◽

András Csóré ◽

János Lábár ◽

Jenő Gubicza ◽

...

Keyword(s):

Dislocation Density ◽

Line Profile ◽

Electron Backscatter Diffraction ◽

Profile Analysis ◽

Lath Martensite ◽

Line Profile Analysis ◽

X Ray ◽

Electron Backscatter ◽

Backscatter Diffraction

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Epitaxial Orientation Determination of Nanosized Particles by EBSD

Microscopy and Microanalysis ◽

10.1017/s1431927600014598 ◽

1999 ◽

Vol 5 (S2) ◽

pp. 254-255

Author(s):

F. Cosandey ◽

L. Zhang ◽

T. E. Madey

Keyword(s):

Electron Backscatter Diffraction ◽

Low Temperature Oxidation ◽

Oxide Systems ◽

Temperature Oxidation ◽

Au Film ◽

System A ◽

Backscatter Diffraction ◽

Relationship Of ◽

Orientation Determination

Metals on oxide systems are important in applications such as catalysts and gas sensors. The Au/ TiO2 system is of particular interest because of its high activity for low temperature oxidation of CO and its good sensitivity as CO gas sensor. In this study, we are reporting results on the effect of substrate temperature on epitaxial orientation relationship of Au particles formed on TiO2 (110).Two Au films were grown on TiO2 (110) substrates by vapor deposition in a UHV chamber. The first one was produced by evaporation of a 12nm thick Au film at 300K, followed by annealing at 775K for 1 hour. The second one was produced by direct deposition of a 12nm film on TiO2 substrate maintained at 775K. The samples were transferred in air to the Field Emission Scanning Electron microscope (LEO 982 Gemini) for imaging and diffraction. .Electron Backscatter Diffraction (EBSD) patterns were taken from individual Au particles using the Opal system (Oxford Instruments). With this system, a spatial resolution of the order of 80 nm has been achieve for Au.A typical HRSEM image of the Au film deposited a 300K and annealed at 775K is shown in Fig. 1 revealing a discontinuous Au film consisting of discrete Au particles in the range from 20 to 150 nm.

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Denoising of crystal orientation maps

Journal of Applied Crystallography ◽

10.1107/s1600576719009075 ◽

2019 ◽

Vol 52 (5) ◽

pp. 984-996 ◽

Cited By ~ 17

Author(s):

R. Hielscher ◽

C. B. Silbermann ◽

E. Schmidl ◽

Joern Ihlemann

Keyword(s):

Variational Methods ◽

Crystal Orientation ◽

Electron Backscatter Diffraction ◽

Sliding Window ◽

Orientation Data ◽

Kernel Average Misorientation ◽

Orientation Maps ◽

Electron Backscatter ◽

Backscatter Diffraction

This paper compares several well known sliding-window methods for denoising crystal orientation data with variational methods adapted from mathematical image analysis. The variational methods turn out to be much more powerful in terms of preserving low-angle grain boundaries and filling holes of non-indexed orientations. The effect of denoising on the determination of the kernel average misorientation and the geometrically necessary dislocation density is also discussed. Synthetic as well as experimental data are considered for this comparison. The examples demonstrate that variational denoising techniques are capable of significantly improving the accuracy of properties derived from electron backscatter diffraction maps.

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