A new sample preparation protocol for SEM and TEM particulate matter analysis

2021 ◽  
pp. 113365
Author(s):  
Ankur Sinha ◽  
Gloria Ischia ◽  
Giovanni Straffelini ◽  
Stefano Gialanella
2017 ◽  
Vol 9 (3) ◽  
pp. 490-499 ◽  
Author(s):  
A. M. S. Mimura ◽  
C. C. M. Ferreira ◽  
J. C. J. Silva

In this study, two alternative sample preparation procedures are proposed, using ultrasound and microwave, for rapid, reliable and easy extraction of trace elements from particulate matter samples.


1999 ◽  
Vol 7 (7) ◽  
pp. 34-35
Author(s):  
Janet Teshima

A large part of the preparation of semiconductor samples for SEM and TEM observations involves the creation of cross sections to expose subsurface defects and three-dimensional structure. A powerful new combination of FIB (FEI Company, Hillsboro, Oregon, http://www.feic.com ) with automated microcleaving technology (SELA, Santa Clara, California, http://www. sela.com ) now offers a comprehensive solution for fast, easy and accurate sample preparation.


2014 ◽  
Vol 29 (4) ◽  
pp. 753-761 ◽  
Author(s):  
D. Salcedo ◽  
J. P. Bernal ◽  
O. Pérez-Arvizu ◽  
E. Lounejeva

A method was tested for the digestion of SRM 1648a and airborne particulate samples using acid reflux before ICP-MS analysis of trace elements. The suitability of SRM 1648(a) as a reference material for airborne PM is discussed.


2017 ◽  
Vol 280 ◽  
pp. S180
Author(s):  
Soňa Marvanová ◽  
Pavel Kulich ◽  
Radim Skoupý ◽  
František Hubatka ◽  
Miroslav Ciganek ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document