Electrical and carrier transport properties of Au/Pr6O11/n-GaN MIS structure with a high-k rare-earth oxide interlayer at high temperature range
2015 ◽
Vol 86
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pp. 157-165
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2002 ◽
Vol 37
(10)
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pp. 1104-1112
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Keyword(s):
2016 ◽
Vol 307
◽
pp. 534-541
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