Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis—importance of epoxy impregnation

2003 ◽  
Vol 33 (4) ◽  
pp. 611-616 ◽  
Author(s):  
K.O Kjellsen ◽  
A Monsøy ◽  
K Isachsen ◽  
R.J Detwiler
2017 ◽  
Vol 53 (1) ◽  
pp. 9-12 ◽  
Author(s):  
X. Bao ◽  
L. Liu ◽  
S. Huang ◽  
Y. Jiang ◽  
X. Wang ◽  
...  

The phase relations in the Al-Y-Zr ternary system at 873 K have been investigated by X-ray powder diffraction (XRD) and scanning electron microscopy (SEM) with energy dispersive X-ray spectroscopy (EDS) in backscattered electron imaging (BSE) modes. Six three-phase equilibria are determined and no ternary compound is observed. In the meantime, first principle calculations are used to provide theoretical guidance to understand the experimental results.


2012 ◽  
Vol 26 (2) ◽  
pp. 275-280 ◽  
Author(s):  
Maria Emília Maranhão Estelita ◽  
Ana Claudia Rodrigues

The Cyperaceae show the ability to incorporate silicon by depositing colloidal silica, which is recorded by the occurrence of projections in the form of cones, in inner tangential walls of some epidermal cells or "silica cells". Leaves of C. ligularis and R. aberrans were analyzed through the technique of electron backscatter. Cyperus ligularis accumulates silica, in addition to "silica cells", in some stomata, trichomes and the cell walls that surround the cavities of the aerenchyma. The silica in the latter occurs in various forms; however, the cells located near the vascular bundles have conical projections, similar to those of the epidermis. Rhynchospora aberrans presents "silica cells" whose projections have tapered "satellites". In this species, silica also occurs in stomata and certain epidermal cells adjacent to them. It appears that the silicon deposition occurs in combination with the wall (with no apparent structural changes), and structures of secretion, or projections of the wall. These structural changes in the species, and location, are probably related to functional and environmental factors, especially the soil, in addition to relation with taxonomic groups.


1989 ◽  
Vol 67 (2) ◽  
pp. 281-287 ◽  
Author(s):  
M. J. Hodson ◽  
A. G. Sangster

X-ray microanalysis and backscattered electron imaging were used to investigate silica deposition in the lower glume, lemma, and palea of wheat (Triticum aestivum L. cv. Highbury). In the lemma and glume awns, all of the outer epidermal walls were silicified, with the greatest concentration in prickles and papillae. The glume and lemma had similar structures, exhibiting silicified short cells, prickles, and papillae on both inner and outer surfaces and having macrohairs confined to areas on the inner surfaces beneath the awns. Silicified macrohairs were abundant at the apex and margins of the palea. The results are discussed with respect to previous investigations of grass inflorescence bracts. The applicability of X-ray microanalysis and backscattered electron imaging to the analysis of silica deposits in inflorescence bracts is assessed.


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