Investigation of the initial growth of cubic-GaN using an AlGaAs buffer layer grown on GaAs (100) by molecular beam epitaxy

2001 ◽  
Vol 227-228 ◽  
pp. 395-398 ◽  
Author(s):  
Ryuhei Kimura ◽  
Kiyoshi Takahashi
2000 ◽  
Vol 639 ◽  
Author(s):  
Ryuhei Kimura ◽  
Kiyoshi Takahashi ◽  
H. T. Grahn

ABSTRACTAn investigation of the growth mechanism for RF-plasma assisted molecular beam epitaxy of cubic GaN films using a nitrided AlGaAs buffer layer was carried out by in-situ reflection high energy electron diffraction (RHEED) and high resolution X-ray diffraction (HRXRD). It was found that hexagonal GaN nuclei grow on (1, 1, 1) facets during nitridation of the AlGaAs buffer layer, but a highly pure, cubic-phase GaN epilayer was grown on the nitrided AlGaAs buffer layer.


2000 ◽  
Vol 209 (2-3) ◽  
pp. 382-386 ◽  
Author(s):  
Ryuhei Kimura ◽  
Yutaka Gotoh ◽  
Takeo Matsuzawa ◽  
Kiyoshi Takahashi

Author(s):  
О.С. Комков ◽  
С.А. Хахулин ◽  
Д.Д. Фирсов ◽  
П.С. Авдиенко ◽  
И.В. Седова ◽  
...  

The built-in electric fields are generated at the GaSe/GaAs heterointerface when GaSe layers are grown by molecular beam epitaxy on GaAs(001) substrates. The existence of these fields is indicated by the clearly observed Franz–Keldysh oscillations in the photoreflectance spectra. The different values of the intensities of these fields (within the 9.8−17.6 kV/cm range) can be associated both with the diffusion of Se atoms into the GaAs substrate (or into the GaAs buffer layer) and the formation of transition sub-monolayers at initial growth stages. No built-in fields were observed at the GaSe/GaAs heterointerface in case of GaSe layers grown on GaAs(111)B and GaAs(112) substrates, which can be explained by the lower efficiency of Se penetration into these substrates in contrast to GaAs(001).


2021 ◽  
Vol 549 ◽  
pp. 149245
Author(s):  
Chaomin Zhang ◽  
Kirstin Alberi ◽  
Christiana Honsberg ◽  
Kwangwook Park

1998 ◽  
Vol 535 ◽  
Author(s):  
M. Yoshimoto ◽  
J. Saraie ◽  
T. Yasui ◽  
S. HA ◽  
H. Matsunami

AbstractGaAs1–xPx (0.2 <; x < 0.7) was grown by metalorganic molecular beam epitaxy with a GaP buffer layer on Si for visible light-emitting devices. Insertion of the GaP buffer layer resulted in bright photoluminescence of the GaAsP epilayer. Pre-treatment of the Si substrate to avoid SiC formation was also critical to obtain good crystallinity of GaAsP. Dislocation formation, microstructure and photoluminescence in GaAsP grown layer are described. A GaAsP pn junction fabricated on GaP emitted visible light (˜1.86 eV). An initial GaAsP pn diode fabricated on Si emitted infrared light.


1989 ◽  
Vol 55 (10) ◽  
pp. 990-992 ◽  
Author(s):  
J. E. Palmer ◽  
G. Burns ◽  
C. G. Fonstad ◽  
C. V. Thompson

2002 ◽  
Vol 299 (1) ◽  
pp. 79-84 ◽  
Author(s):  
M Xu ◽  
C.X Liu ◽  
H.F Liu ◽  
G.M Luo ◽  
X.M Chen ◽  
...  

2011 ◽  
Vol 8 (5) ◽  
pp. 1495-1498 ◽  
Author(s):  
T. Schupp ◽  
T. Meisch ◽  
B. Neuschl ◽  
M. Feneberg ◽  
K. Thonke ◽  
...  

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