scholarly journals Исследование встроенных электрических полей на интерфейсе GaSe/GaAs методом спектроскопии фотоотражения

Author(s):  
О.С. Комков ◽  
С.А. Хахулин ◽  
Д.Д. Фирсов ◽  
П.С. Авдиенко ◽  
И.В. Седова ◽  
...  

The built-in electric fields are generated at the GaSe/GaAs heterointerface when GaSe layers are grown by molecular beam epitaxy on GaAs(001) substrates. The existence of these fields is indicated by the clearly observed Franz–Keldysh oscillations in the photoreflectance spectra. The different values of the intensities of these fields (within the 9.8−17.6 kV/cm range) can be associated both with the diffusion of Se atoms into the GaAs substrate (or into the GaAs buffer layer) and the formation of transition sub-monolayers at initial growth stages. No built-in fields were observed at the GaSe/GaAs heterointerface in case of GaSe layers grown on GaAs(111)B and GaAs(112) substrates, which can be explained by the lower efficiency of Se penetration into these substrates in contrast to GaAs(001).

2015 ◽  
Vol 49 (12) ◽  
pp. 1582-1586 ◽  
Author(s):  
A. R. Tuktamyshev ◽  
V. I. Mashanov ◽  
V. A. Timofeev ◽  
A. I. Nikiforov ◽  
S. A. Teys

1990 ◽  
Vol 19 (11) ◽  
pp. 1323-1330 ◽  
Author(s):  
R. S. Berg ◽  
Nergis Mavalvala ◽  
Tracie Steinberg ◽  
F. W. Smith

CrystEngComm ◽  
2014 ◽  
Vol 16 (47) ◽  
pp. 10774-10779 ◽  
Author(s):  
Fangliang Gao ◽  
Lei Wen ◽  
Jingling Li ◽  
Yunfang Guan ◽  
Shuguang Zhang ◽  
...  

The effects of the thickness of the large-mismatched amorphous In0.6Ga0.4As buffer layer on the In0.3Ga0.7As epi-films grown on the GaAs substrate have been systematically investigated.


1991 ◽  
Vol 240 ◽  
Author(s):  
Shigeru Niki ◽  
Yunosuke Maktta ◽  
Akimasa Yamada ◽  
Junichi Shimada

ABSTRACTThirty-period In0.28Ga0.72As(100Å)/GaAs (100Å) multiple quantum wells (MQWs) have been grown by molecular beam epitaxy on (lOO)-oriented GaAs substrate with a 0.5μm-thick InyGa1-yAs (0≤y≤0.28) buffer layer interposed between the QW layer and the GaAs substrate. The MQWs with y close to the average InAs mole fraction of the QW layer exhibited good crystalline quality. It indicates that the strain is well-balanced between the GaAs and In0.28Ga0.72As layer. A significant change in their photoluminescence spectra has been observed when annealed above 750δC by means of rapid thermal annealing, implying a structural disorder in the QW“region.


2002 ◽  
Vol 242 (3-4) ◽  
pp. 533-537 ◽  
Author(s):  
M.C Kuo ◽  
C.S Yang ◽  
P.Y Tseng ◽  
J Lee ◽  
J.L Shen ◽  
...  

2021 ◽  
Vol 549 ◽  
pp. 149245
Author(s):  
Chaomin Zhang ◽  
Kirstin Alberi ◽  
Christiana Honsberg ◽  
Kwangwook Park

1998 ◽  
Vol 535 ◽  
Author(s):  
M. Yoshimoto ◽  
J. Saraie ◽  
T. Yasui ◽  
S. HA ◽  
H. Matsunami

AbstractGaAs1–xPx (0.2 <; x < 0.7) was grown by metalorganic molecular beam epitaxy with a GaP buffer layer on Si for visible light-emitting devices. Insertion of the GaP buffer layer resulted in bright photoluminescence of the GaAsP epilayer. Pre-treatment of the Si substrate to avoid SiC formation was also critical to obtain good crystallinity of GaAsP. Dislocation formation, microstructure and photoluminescence in GaAsP grown layer are described. A GaAsP pn junction fabricated on GaP emitted visible light (˜1.86 eV). An initial GaAsP pn diode fabricated on Si emitted infrared light.


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