Sensitivity analysis of scanning near-field optical microscope probe

2003 ◽  
Vol 35 (4) ◽  
pp. 267-271 ◽  
Author(s):  
Te-Hua Fang ◽  
Win-Jin Chang
Keyword(s):  
Sensitivity Analysis ◽  
Near Field ◽  
Optical Microscope ◽  
Microscope Probe

Near-field scanning optical microscope probe analysis

2008 ◽  
Vol 108 (7) ◽  
pp. 671-676 ◽  
Author(s):  
Petr Klapetek ◽  
Jiří Buršík ◽  
Miroslav Valtr ◽  
Jan Martinek
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Probe Analysis ◽  
Near Field Scanning ◽  
Microscope Probe

Photoinduced Nanodots in Bi2Sr2CaCu2O8+d

2006 ◽  
Vol 320 ◽  
pp. 167-170
Author(s):  
Minoru Osada ◽  
Masato Kakihana ◽  
H. Yasuoka ◽  
M. Käll ◽  
L. Börjesson
Keyword(s):  
Thin Film ◽  
Ion Irradiation ◽  
Near Field ◽  
Optical Microscope ◽  
High Density ◽  
Pinning Centers ◽  
Optical Reflectivity ◽  
Strong Pinning ◽  
Microscope Probe

We report a fabrication of high-density nanodots by photodoping in overdoped Bi2Sr2CaCu2O8+d thin film (Tc = 80 K). A scanning near-field optical microscope probe is used to locally excite carrier, and photodoped region is associated with lower Tc phase (Tc = 75 K) via overdoping. Nanoscale characterizations with optical reflectivity reveal that nanodots (30-nm diameter) are regularly distributed in 50-nm step. The resultant films with photoinduced nanodots enhance Jc, a situation being similar to strong pinning effects observed in films modified by either ion irradiation or sputtered nanoparticles. These results suggest that photoinduced nanodots with lower Tc act as effective pinning centers.

The height regulation of a near-field scanning optical microscope probe tip

1999 ◽  
Vol 194 (2-3) ◽  
pp. 317-320
Author(s):  
Wang ◽  
Wang ◽  
Jin ◽  
Huang ◽  
Xu
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Near Field Scanning ◽  
Microscope Probe
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