Quantitative topography measurements of rolled aluminium surfaces by atomic force microscopy and optical methods

1999 ◽  
Vol 111 (2-3) ◽  
pp. 276-286 ◽  
Author(s):  
I Lindseth ◽  
A Bardal
2017 ◽  
Vol 8 ◽  
pp. 1671-1679 ◽  
Author(s):  
Markus Moosmann ◽  
Thomas Schimmel ◽  
Wilhelm Barthlott ◽  
Matthias Mail

Underwater air retention of superhydrophobic hierarchically structured surfaces is of increasing interest for technical applications. Persistent air layers (the Salvinia effect) are known from biological species, for example, the floating fern Salvinia or the backswimmer Notonecta. The use of this concept opens up new possibilities for biomimetic technical applications in the fields of drag reduction, antifouling, anticorrosion and under water sensing. Current knowledge regarding the shape of the air–water interface is insufficient, although it plays a crucial role with regards to stability in terms of diffusion and dynamic conditions. Optical methods for imaging the interface have been limited to the micrometer regime. In this work, we utilized a nondynamic and nondestructive atomic force microscopy (AFM) method to image the interface of submerged superhydrophobic structures with nanometer resolution. Up to now, only the interfaces of nanobubbles (acting almost like solids) have been characterized by AFM at these dimensions. In this study, we show for the first time that it is possible to image the air–water interface of submerged hierarchically structured (micro-pillars) surfaces by AFM in contact mode. By scanning with zero resulting force applied, we were able to determine the shape of the interface and thereby the depth of the water penetrating into the underlying structures. This approach is complemented by a second method: the interface was scanned with different applied force loads and the height for zero force was determined by linear regression. These methods open new possibilities for the investigation of air-retaining surfaces, specifically in terms of measuring contact area and in comparing different coatings, and thus will lead to the development of new applications.


2021 ◽  
Author(s):  
Megan Cowie ◽  
Rikke Plougmann ◽  
Yacine Benkirane ◽  
Léonard Schué ◽  
Zeno Schumacher ◽  
...  

Abstract Transition metal dichalcogenides (TMDCs) have attracted significant attention for optoelectronic, photovoltaic and photoelectrochemical applications. The properties of TMDCs are highly dependent on the number of stacked atomic layers, which is usually counted post-fabrication, using a combination of optical methods and atomic force microscopy height measurements. Here, we use photoluminescence spectroscopy, Raman spectroscopy, and three different AFM methods to demonstrate significant discrepancies in height measurements of exfoliated MoSe2 flakes on SiO2 depending on the method used. We also highlight the often overlooked effect that electrostatic forces can be misleading when measuring the height of a MoSe2 flake using AFM.


1993 ◽  
Vol 303 ◽  
Author(s):  
R. B. Sethi ◽  
R. P. Ciari ◽  
L. Anderson ◽  
U. S. Kim ◽  
A. Bergemont

ABSTRACTA robust 6" hotwall flatzone nitride system is developed for scaled ONO interpoly. dielectric application in a high density EPROM memory cell. This system is designed to operate at low temperature (660° C) and gas ratio (4:1 NH3: DCS) with integrated silicon carbide components. The obtained key features are low defects (0.25 #/cm2 particles), smooth topography (measured by atomic force microscopy) and superior electrical interface as measured by electrical and optical methods.


2014 ◽  
Vol 32 (3) ◽  
pp. 391-395 ◽  
Author(s):  
Ivan Karbovnyk ◽  
Ivan Bolesta ◽  
Ivan Rovetskii ◽  
Sergiy Velgosh ◽  
Halyna Klym

AbstractResults of the comprehensive morphological study of CdI2-BiI3 layered crystals are presented. Direct AFM observations of micro- and nanostructures formed in the volume of the crystals confirm the predictions made on the basis of positron annihilation spectroscopy studies. The model explaining the possible pores formation mechanism is proposed and validated by the results of luminescence measurements at 8 K.


Author(s):  
Jiapeng Yu ◽  
Hao Wang

Understanding the structure near the three-phase contact line is critical for a comprehensive understanding of the thin-film region when a liquid partially wets a planer substrate. Despite numerous theoretical and simulation efforts found literature, an accurate experiment is difficult to conduct because of how small its scale. In the present work the accurate geometry of the region near the three-phase contact line was obtained by directly scanning the thin-film region with atomic force microscopy (AFM). The contact angles were directly extracted from the results and compared with the ones measured from traditional optical methods.


2002 ◽  
Vol 34 (1) ◽  
pp. 759-762 ◽  
Author(s):  
D. Franta ◽  
I. Ohlídal ◽  
P. Klapetek ◽  
P. Pokorný

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