Radio frequency substrate bias effect on properties of Co thin film and multilayer structures

2002 ◽  
Vol 247 (3) ◽  
pp. 339-344 ◽  
Author(s):  
V Ng ◽  
J.F Hu ◽  
A.O Adeyeye ◽  
J.P Wang ◽  
T.C Chong
Keyword(s):  
Thin Film ◽  
Radio Frequency ◽  
Multilayer Structures ◽  
Substrate Bias ◽  
Bias Effect

Substrate bias effect on Al–Si and Al–Ge thin film structure

2008 ◽  
Vol 516 (23) ◽  
pp. 8315-8318 ◽  
Author(s):  
Ryoko Horie ◽  
Nobuhiro Yasui ◽  
Yoshihiro Ohashi ◽  
Tohru Den
Keyword(s):  
Thin Film ◽  
Film Structure ◽  
Substrate Bias ◽  
Bias Effect ◽  
Thin Film Structure

A Substrate Bias Effect on Recovery of the Threshold Voltage Shift of Amorphous Silicon Thin-Film Transistors

2007 ◽  
Vol 46 (7A) ◽  
pp. 4042-4045 ◽  
Author(s):  
Chang-Wook Han ◽  
Min-Koo Han ◽  
Nack-Bong Choi ◽  
Chang-Dong Kim ◽  
Ki-Yong Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Substrate Bias ◽  
Silicon Thin Film ◽  
Bias Effect ◽  
Threshold Voltage Shift ◽  
Voltage Shift

Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization

2017 ◽  
Vol 178 ◽  
pp. 17-20 ◽  
Author(s):  
Rodrigo Trevisoli Doria ◽  
Renan Trevisoli ◽  
Michelly de Souza ◽  
Sylvain Barraud ◽  
Maud Vinet ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Substrate Bias ◽  
Low Frequency Noise ◽  
Bias Effect ◽  
Nanowire Transistors ◽  
Noise Characterization
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