Microstereolithography of lead zirconate titanate thick film on silicon substrate

2000 ◽  
Vol 87 (1-2) ◽  
pp. 72-77 ◽  
Author(s):  
X.N Jiang ◽  
C Sun ◽  
X Zhang ◽  
B Xu ◽  
Y.H Ye
Author(s):  
Chuan Luo ◽  
Chen-Wei Yang ◽  
G. Z. Cao ◽  
I. Y. Shen

In this paper, we conduct experimental and theoretical studies of a lead-zirconate-titanate (PZT) thin-film microactuator probe submerged in water. The microactuator consists of a base silicon diaphragm, a layer of bottom electrode, a layer of lead-zirconate-titanate (PZT) thin film, and a layer of top electrode. The diaphragm is anchored on a silicon substrate by etching the silicon substrate from the back to form a cavity under the diaphragm. The diaphragm along with part of its anchor is then diced off from the silicon substrate to form a PZT probe and subsequently packaged with parylene. The probe tip has dimensions of 1 mm × 1 mm × 0.4 mm, while the diaphragm has dimensions of 800 μm × 800 μm × 2 μm. In the experimental study, frequency response functions of actuator displacement are measured via a laser Doppler vibrometer and a spectrum analyzer. The measurements show that the first natural frequency of the microactuator reduces from 80 kHz in air to 20 kHz when the microactuator is submerged in water. A literature search indicates that the surrounding water induces significant added mass to the microactuator. Estimation of the added mass based on theories in fluid mechanics successfully reconcile the predicted frequency to the vicinity of 20 kHz confirming the effects of added mass.


2002 ◽  
Vol 17 (5) ◽  
pp. 933-935 ◽  
Author(s):  
R. F. Zhang ◽  
J. Ma ◽  
L. B. Kong

Lead zirconate titanate (PbZr0.52Ti0.48O3; PZT) thick film with a thickness of 70 µm was prepared by the electrophoretic deposition method from a raw oxide mixture of PbO, ZrO2, and TiO2. X-ray diffraction and scanning electron microscopy were used to characterize the sintered PZT thick film. Single phase PZT was observed in the films sintered at 900 °C and above. The film sintered at 1000 °C for 30 min exhibited a dielectric constant of 1050 with a dielectric loss of about 0.05 measured at 1 kHz, a maximum polarization of 29 µC/cm2, a remnant polarization of 19 µC/cm2, and a coercive field of 21 kV/cm. This simple process to form PZT thick films may also be applied to the preparation of other multicomponent ceramics and ceramic films.


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