Microstructural and compositional characterization of a new silicon carbide nanocables using scanning transmission electron microscopy

2002 ◽  
Vol 15 (1) ◽  
pp. 1-5 ◽  
Author(s):  
D.P Yu ◽  
Y.J Xing ◽  
M Tence ◽  
H.Y Pan ◽  
Y Leprince-Wang
2004 ◽  
Vol 10 (S02) ◽  
pp. 290-291
Author(s):  
Susanne Stemmer ◽  
Melody D Agustin ◽  
Yan Yang ◽  
Steffen Schmidt ◽  
Brendan Foran ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


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