The acquisition of noun inflection in Northern Pame (Xi'iuy): Comparing whole word and minimal word accounts

2020 ◽  
pp. 1-34
Author(s):  
Clifton PYE ◽  
Scott BERTHIAUME ◽  
Barbara PFEILER
Keyword(s):  
Class Number ◽  
Low Frequency ◽  
Adult Type ◽  
Minimal Word ◽  
Singular Noun ◽  
Noun Class ◽  
Whole Word

Abstract The study used naturalistic data on the production of nominal prefixes in the Otopamean language Northern Pame (autonym: Xi'iuy) to test Whole Word (constructivist) and Minimal Word (prosodic) theories for the acquisition of inflection. Whole Word theories assume that children store words in their entirety; Minimal Word theories assume that children produce words as binary feet. Northern Pame uses obligatory portmanteaux prefixes to inflect nouns for class, number, animacy and possessor. Singular nouns constitute 90 percent of the nouns that the children hear and yet all five two-year-old children frequently omitted the singular noun prefixes, but produced the low frequency noun suffixes for dual and animate plural. Neither the children's production of the noun-class prefixes nor their prefix overextensions correlated with the adult type and token frequencies of production. Northern Pame children constructed Minimal Words that contain binary feet and disfavor the production of initial, extrametrical prefixes.

Obligatory decomposition in reading prefixed words

2006 ◽  
Vol 1 (2) ◽  
pp. 183-199 ◽  
Author(s):  
Marcus Taft ◽  
Sam Ardasinski
Keyword(s):  
Lexical Decision ◽  
High Frequency ◽  
Low Frequency ◽  
Real Word ◽  
Word Representation ◽  
Pathways Model ◽  
Whole Word ◽  
Prefixed Words ◽  
The Impact

The reported experiment examines the impact of stem frequency on lexical decision responses to prefixed words. Both when the nonword distractors had nonsense stems (e.g., recodge) and real-word stems (e.g., relaugh), words with high frequency stems (e.g., unreal) were recognized more quickly than words with low frequency stems (e.g., refuel) when matched on surface frequency. This was taken as evidence that a whole-word representation exists for prefixed words, but that activation of this representation is always mediated by a representation of the stem, unlike the claims of a Dual Pathways model.

Base word Frequency and Pseudohomophone Naming

1996 ◽  
Vol 49 (4) ◽  
pp. 1044-1061 ◽  
Author(s):  
Chris M. Herdman ◽  
Jo-Anne LeFevre ◽  
Stephanie L. Greenham
Keyword(s):  
Word Frequency ◽  
High Frequency ◽  
Low Frequency ◽  
Frequency Effect ◽  
Base Word ◽  
Phonological Coding ◽  
Frequency Effects ◽  
Lexical Representations ◽  
Frequency Group ◽  
Whole Word

The advantage of naming pseudohomophones over non-pseudohomophones has been interpreted as reflecting the contribution of whole-word lexical representations in phonological coding. A whole-word interpretation was further supported by Taft and Russell (1992), who reported a pseudohomophone frequency effect such that pseudohomophones were named faster if they corresponded to high- than to low-frequency base-words (e.g. poast vs. hoast). Experiment 1 replicated this pseudohomophone frequency effect using the Taft and Russell items. Further analyses showed, however, that the pseudohomophones in Taft and Russell's high-frequency group were more orthographically similar to words than the pseudohomophones in the low-frequency group. These differences in orthography may have been the cause of the “frequency” effects. In Experiment 2, a new set of high- and low-frequency pseudohomophones was constructed that were matched on orthographic factors (i.e. SPBF and N). With these items, a standard pseudohomophone advantage was found such that pseudohomophones were named faster and more accurately than non-pseudohomophones. However, in contrast to Taft and Russell's results, pseudohomophone naming was not related to base-word frequency. We conclude that the pseudohomophone advantage occurs at a postlexical stage in non-word naming.

Stem and derivational-suffix processing during reading by French second and third graders

2011 ◽  
Vol 33 (1) ◽  
pp. 97-120 ◽  
Author(s):  
PASCALE COLÉ ◽  
SOPHIE BOUTON ◽  
CHRISTEL LEUWERS ◽  
SEVERINE CASALIS ◽  
LILIANE SPRENGER-CHAROLLES
Keyword(s):  
Word Reading ◽  
Low Frequency ◽  
Third Graders ◽  
Morphological Processing ◽  
Similar Extent ◽  
New Words ◽  
Word Forms ◽  
Whole Word ◽  
Derivational Suffix ◽  
The Impact

ABSTRACTMorphological processing by French children was investigated in two experiments. The first showed that second and third graders read pseudowords such as chat-ure (cat-ish) composed of an illegally combined real stem and real derivational suffix faster and more accurately than they read matched pseudowords composed of a pseudostem and a real derivational suffix (e.g., chot-ure) or a pseudostem and a pseudosuffix (e.g., chot-ore). More, the chot-ure items were read faster and more accurately than the chot-ore items. These results suggest that beginning French readers are able to use morphological units (both stems and derivational suffixes) to decode new words. The second experiment compared the impact of display format on reading time. Suffixed words were presented in four segmentation formats: syllabic (ma lade), morphological (mal ade), morphological + 1 grapheme (mala de), or unsegmented (malade). For both groups of readers, the morphological + 1 condition generated the longest reading times but there was no difference between the other three conditions. It was concluded that syllables, morphemes, and whole word forms contribute to a similar extent to word reading for low-frequency words. Morphological processing may therefore be used early by French children to identify both new words and low-frequency words.

A Study on the Fine Structure of the Lateral Line Organ of the Sea Eel

1973 ◽  
Vol 31 ◽  
pp. 648-649
Author(s):  
K. Hama
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Lateral Line ◽  
Low Frequency ◽  
Sensory Cells ◽  
Apical Surface ◽  
Voltage Electron ◽  
Sensory Epithelia ◽  
Low Frequency Vibration ◽  
Transmission Electron

The lateral line organs of the sea eel consist of canal and pit organs which are different in function. The former is a low frequency vibration detector whereas the latter functions as an ion receptor as well as a mechano receptor.The fine structure of the sensory epithelia of both organs were studied by means of ordinary transmission electron microscope, high voltage electron microscope and of surface scanning electron microscope.The sensory cells of the canal organ are polarized in front-caudal direction and those of the pit organ are polarized in dorso-ventral direction. The sensory epithelia of both organs have thinner surface coats compared to the surrounding ordinary epithelial cells, which have very thick fuzzy coatings on the apical surface.

Lectin Binding to Human Breast Tumor Cells

1976 ◽  
Vol 34 ◽  
pp. 34-35
Author(s):  
Robert E. Nordquist ◽  
J. Hill Anglin ◽  
Michael P. Lerner
Keyword(s):  
Carcinoma Cell ◽  
Ricinus Communis ◽  
Lectin Binding ◽  
Low Frequency ◽  
Breast Carcinoma Cell Line ◽  
Human Breast ◽  
Human Breast Tumor ◽  
Duct Carcinoma ◽  
Specific Antigens ◽  
Ricin Agglutinin

A human breast carcinoma cell line (BOT-2) was derived from an infiltrating duct carcinoma (1). These cells were shown to have antigens that selectively bound antibodies from breast cancer patient sera (2). Furthermore, these tumor specific antigens could be removed from the living cells by low frequency sonication and have been partially characterized (3). These proteins have been shown to be around 100,000 MW and contain approximately 6% hexose and hexosamines. However, only the hexosamines appear to be available for lectin binding. This study was designed to use Concanavalin A (Con A) and Ricinus Communis (Ricin) agglutinin for the topagraphical localization of D-mannopyranosyl or glucopyranosyl and D-galactopyranosyl or DN- acetyl glactopyranosyl configurations on BOT-2 cell surfaces.

Practical High Resolution Microscopy

1968 ◽  
Vol 26 ◽  
pp. 302-303
Author(s):  
P. A. Marsh ◽  
T. Mullens ◽  
D. Price
Keyword(s):  
High Resolution ◽  
Magnetic Fields ◽  
Low Frequency ◽  
Resolving Power ◽  
Careful Attention ◽  
Electron Microscopes ◽  
The Relationship ◽  
High Resolution Microscopy ◽  
New Facilities

It is possible to exceed the guaranteed resolution on most electron microscopes by careful attention to microscope parameters essential for high resolution work. While our experience is related to a Philips EM-200, we hope that some of these comments will apply to all electron microscopes.The first considerations are vibration and magnetic fields. These are usually measured at the pre-installation survey and must be within specifications. It has been our experience, however, that these factors can be greatly influenced by the new facilities and therefore must be rechecked after the installation is completed. The relationship between the resolving power of an EM-200 and the maximum tolerable low frequency interference fields in milli-Oerstedt is 10 Å - 1.9, 8 Å - 1.4, 6 Å - 0.8.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

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