Measurement of small structure factors by the critical-voltage effect in HEED: The superlattice reflections in β'nial, β'CoAl and γtial
The systematic critical voltage effect, Vc, in high energy electron diffraction has been used for some time to accurately measure low-angle x-ray structure factor structure factor amplitudes (see e.g. 1). It has a significant advantage over other methods for accurate structure factor measurement, such as systematic convergent beam rocking curve or x-ray Pendellösung techniques, in that it is capable of measuring very small structure factors such as the 222 ‘forbidden’ reflections in Si and Ge (see e.g. 2). In the present work the potential of the systematic Vc method for measuring small structure factor amplitudes and average Debye-Waller factors in the intermetallic alloys NiAl, CoAl and TiAl will be demonstrated.The structure factors, F, for ordered stoichiometric B2 alloys comprising A and B atoms such as Ni (Co)Al are given by