scholarly journals Microanalysis of individual silver halide microcrystals

1992 ◽  
Vol 50 (2) ◽  
pp. 1612-1613
Author(s):  
S. Wu ◽  
A. Van Daele ◽  
W. Jacob ◽  
R. Gijbels ◽  
A. Verbeeck ◽  
...  
Keyword(s):  
Image Processing ◽  
Electron Microscope ◽  
Silver Halide ◽  
Processing System ◽  
Energy Dispersive ◽  
Elemental Distribution ◽  
X Ray ◽  
Scanning Transmission ◽  
Carbon Coated ◽  
Electron Imaging

There is a considerable interest for the study of the elemental distribution and composition in silver halide photographic emulsions, particularly for the microanalysis of individual microcrystals. In this work, elemental distributions and contents of tabular and cubic silver halide microcrystals were obtained by backscattered electron imaging (BSEI), scanning transmission electron imaging (STEI), x-ray mapping and x-ray microanalysis in a scanning electron microscope (STEM) combined with energy-dispersive x-ray analysis (EDX).Several kinds of silver halide microcrystals were prepared, After removing the gelatin, repeated centrifugation and washing in distilled water, the grains were resuspended and dispersed onto carbon coated 50 mesh copper grids. All analyses were carried out on a JEOL 1200 EX electron microscope equipped with detectors for backscattered, secondary and transmitted electrons and an energy dispersive x-ray analysis system. An image processing system was used for acquiring and processing BSE images, STE images and x-ray maps. The role of the image processing computer system (IBAS Kontron) is twofold: it allows to optimize the acquisition conditions and to process the images afterwards.

X-ray Energy-Dispersive Spectrometry During In Situ Liquid Cell Studies Using an Analytical Electron Microscope

2014 ◽  
Vol 20 (2) ◽  
pp. 323-329 ◽  
Author(s):  
Nestor J. Zaluzec ◽  
M. Grace Burke ◽  
Sarah J. Haigh ◽  
Matthew A. Kulzick
Keyword(s):  
Electron Microscope ◽  
Analytical Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Energy Dispersive ◽  
X Ray ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Scanning Transmission ◽  
Liquid Cell

AbstractThe use of analytical spectroscopies during scanning/transmission electron microscope (S/TEM) investigations of micro- and nano-scale structures has become a routine technique in the arsenal of tools available to today’s materials researchers. Essential to implementation and successful application of spectroscopy to characterization is the integration of numerous technologies, which include electron optics, specimen holders, and associated detectors. While this combination has been achieved in many instrument configurations, the integration of X-ray energy-dispersive spectroscopy and in situ liquid environmental cells in the S/TEM has to date been elusive. In this work we present the successful incorporation/modifications to a system that achieves this functionality for analytical electron microscopy.

PC/MAC* Image Processing Freeware for Examining Spectral Images

2000 ◽  
Vol 6 (S2) ◽  
pp. 1056-1057
Author(s):  
D. S. Bright
Keyword(s):  
Image Processing ◽  
Principal Component Analysis ◽  
Low Voltage ◽  
Processing System ◽  
Principal Component ◽  
Public Domain ◽  
Data Cube ◽  
Energy Dispersive ◽  
X Ray ◽  
Adjacent Channels

MacLispix, a public domain image processing system for the Macintosh*, has been applied to a variety of image processing problems, such as using Principal Component Analysis to explore correlated images. The tools provided by MacLispix are now available in Lispix, the updated version that runs on both the PC and the Macintosh.I will illustrate the utility of Lispix by way of an example ‘data cube', a low voltage energy dispersive x-ray spectrum image provided by Ian Anderson. The ‘cube'is 200x150 pixels, each pixel having a spectrum of 512 two-byte channels The spectra were smoothed and reduced by adding adjacent channels to reduce them to 256 channels each. Since Lispix is image oriented rather than spectrum oriented, the reduced cube is stored, and represented internally as 256 images (one image for each channel in the spectrum), rather than as 200x150 spectra (one spectrum for each pixel in the image).

Microanalysis of precipitates in a ferritic steel

1978 ◽  
Vol 36 (1) ◽  
pp. 618-619
Author(s):  
J.M. Titchmarsh
Keyword(s):  
Ferritic Steel ◽  
Particle Identification ◽  
Energy Dispersive ◽  
Objective Lens ◽  
Ferritic Steels ◽  
Replica Technique ◽  
X Ray ◽  
Large Numbers ◽  
Scanning Transmission ◽  
Made In

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.

Energy Dispersive X-Ray Measurements of thin Metal Foils

1976 ◽  
Vol 34 ◽  
pp. 426-427
Author(s):  
J. Bentley ◽  
E. A. Kenik
Keyword(s):  
Materials Science ◽  
Energy Dispersive Spectrometer ◽  
Thin Foil ◽  
Thin Metal ◽  
Energy Dispersive ◽  
Thin Specimen ◽  
X Ray ◽  
Metal Foils ◽  
Small Probe ◽  
Scanning Transmission

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.

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