High-resolution SEM of clostridial attachment structures

Author(s):  
B. Panessa-Warren ◽  
G.T. Tortora ◽  
J.B. Warren

Clostridium sporogenes forms small (1 μm), dehydrated endospores that are resistant to the effects of solvents, acids, alkali, pressure, UV radiation and most sporocides. In the past it was felt that the exosporial membrane served no function in the infection and colonization process, however our recent work on intact spores has demonstrated that the exosporial membrane seems to play a significant role in the initial attachment of the spore to a nutritive substrate. With the improved resolution of the SEM, it has been possible to examine intact spores attached to various substrates and characterize each stage of attachment. This paper examines the exosporial membranes of activated C.sporogenes spores using conventional specimen preparation with imaging using a lanthanum hexaboride gun, and specimens imaged with a field emission SEM. Spores were grown on Trypticase Soy agar with 0.5% glucose (TSA) added and blood CDC (BCDC) agar and attachments and viability monitored by plate counts and light microscopy of unfixed spores (both phase and malachite green/safranin staining).

Author(s):  
D. Johnson ◽  
P. Moriearty

Since several species of Schistosoma, or blood fluke, parasitize man, these trematodes have been subjected to extensive study. Light microscopy and conventional electron microscopy have yielded much information about the morphology of the various stages; however, scanning electron microscopy has been little utilized for this purpose. As the figures demonstrate, scanning microscopy is particularly helpful in studying at high resolution characteristics of surface structure, which are important in determining host-parasite relationships.


Author(s):  
William Krakow ◽  
David A. Smith

Recent developments in specimen preparation, imaging and image analysis together permit the experimental determination of the atomic structure of certain, simple grain boundaries in metals such as gold. Single crystal, ∼125Å thick, (110) oriented gold films are vapor deposited onto ∼3000Å of epitaxial silver on (110) oriented cut and polished rock salt substrates. Bicrystal gold films are then made by first removing the silver coated substrate and placing in contact two suitably misoriented pieces of the gold film on a gold grid. Controlled heating in a hot stage first produces twist boundaries which then migrate, so reducing the grain boundary area, to give mixed boundaries and finally tilt boundaries perpendicular to the foil. These specimens are well suited to investigation by high resolution transmission electron microscopy.


Author(s):  
K. Ogura ◽  
T. Suzuki ◽  
C. Nielsen

In spite of the complicated specimen preparation, Transmission Electron Microscopes (TEM) have traditionally been used for the investigation of the fine grain structures of sintered ceramics. Scanning Electron Microscopes (SEM) have not been used much for the same purpose as TEM because of poor results caused by the specimen charging effect, and also the lack of sufficient resolution. Here, we are presenting a successful result of high resolution imaging of sintered alumina (pure Al2O3) using the Specimen Heated and Electron Beam Induced Conductivity (SHEBIC) method, which we recently reported, in an ultrahigh resolution SEM (UHR-SEM). The JSM-6000F, equipped with a Field Emission Gun (FEG) and an in-lens specimen position, was used for this application.After sintered Al2O3 was sliced into a piece approximately 0.5 mm in thickness, one side was mechanically polished to get a shiny plane for the observation. When the observation was started at 20 kV, an enormous charging effect occured, and it was impossible to obtain a clear Secondary Electron (SE) image (Fig.1).


Author(s):  
Ralph M. Albrecht ◽  
Scott R. Simmons ◽  
Marek Malecki

The development of video-enhanced light microscopy (LM) as well as associated image processing and analysis have significantly broadened the scope of investigations which can be undertaken using (LM). Interference/polarization based microscopies can provide high resolution and higher levels of “detectability” especially in unstained living systems. Confocal light microscopy also holds the promise of further improvements in resolution, fluorescence studies, and 3 dimensional reconstruction. Video technology now provides, among other things, a means to detect differences in contrast difficult to detect with the human eye; furthermore, computerized image capture, processing, and analysis can be used to enhance features of interest, average images, subtract background, and provide a quantitative basis to studies of cells, cell features, cell labelling, and so forth. Improvements in video technology, image capture, and cost-effective computer image analysis/processing have contributed to the utility and potential of the various interference and confocal microscopic instrumentation.Electron microscopic technology has made advances as well. Microprocessor control and improved design have contributed to high resolution SEMs which have imaging capability at the molecular level and can operate at a range of accelerating voltages starting at 1KV. Improvements have also been seen in the HVEM and IVEM transmission instruments. As a whole, these advances in LM and EM microscopic technology provide the biologist with an array of information on structure, composition, and function which can be obtained from a single specimen. Corrrelative light microscopic analysis permits examination of living specimens and is critical where the “history” of a cell, cellular components, or labels needs to be known up to the time of chemical or physical fixation. Features such as cytoskeletal elements or gold label as small as 0.01 μm, well below the 0.2 μm limits of LM resolution, can be “detected” and their movement followed by VDIC-LM. Appropriate identification and preparation can then lead to the examination of surface detail and surface label with stereo LV-HR-SEM. Increasing the KV in the HR-SEM while viewing uncoated or thinly coated specimens can provide information from beneath the surface as well as increasing Z contrast so that positive identification of surface and subsurface colloidal gold or other heavy metal labelled/stained material is possible. Further examination of the same cells using stereo HVEM or IVEM provides information on internal ultrastructure and on the relationship of labelled material to cytoskeletal or organellar distribution, A wide variety of investigations can benefit from this correlative approach and a number of instrumentational configurations and preparative pathways can be tailored for the particular study. For a surprisingly small investment in time and technique, it is often possible to clear ambiguities or questions that arise when a finding is presented in the context of only one modality.


Author(s):  
John L. Hutchison

Over the past five years or so the development of a new generation of high resolution electron microscopes operating routinely in the 300-400 kilovolt range has produced a dramatic increase in resolution, to around 1.6 Å for “structure resolution” and approaching 1.2 Å for information limits. With a large number of such instruments now in operation it is timely to assess their impact in the various areas of materials science where they are now being used. Are they falling short of the early expectations? Generally, the manufacturers’ claims regarding resolution are being met, but one unexpected factor which has emerged is the extreme sensitivity of these instruments to both floor-borne and acoustic vibrations. Successful measures to counteract these disturbances may require the use of special anti-vibration blocks, or even simple oil-filled dampers together with springs, with heavy curtaining around the microscope room to reduce noise levels. In assessing performance levels, optical diffraction analysis is becoming the accepted method, with rotational averaging useful for obtaining a good measure of information limits. It is worth noting here that microscope alignment becomes very critical for the highest resolution.In attempting an appraisal of the contributions of intermediate voltage HREMs to materials science we will outline a few of the areas where they are most widely used. These include semiconductors, oxides, and small metal particles, in addition to metals and minerals.


Author(s):  
H. Kohl

High-Resolution Electron Microscopy is able to determine structures of crystals and interfaces with a spatial resolution of somewhat less than 2 Å. As the image is strongly dependent on instrumental parameters, notably the defocus and the spherical aberration, the interpretation of micrographs necessitates a comparison with calculated images. Whereas one has often been content with a qualitative comparison of theory with experiment in the past, one is currently striving for quantitative procedures to extract information from the images [1,2]. For the calculations one starts by assuming a static potential, thus neglecting inelastic scattering processes.We shall confine the discussion to periodic specimens. All electrons, which have only been elastically scattered, are confined to very few directions, the Bragg spots. In-elastically scattered electrons, however, can be found in any direction. Therefore the influence of inelastic processes on the elastically (= Bragg) scattered electrons can be described as an attenuation [3]. For the calculation of high-resolution images this procedure would be correct only if we had an imaging energy filter capable of removing all phonon-scattered electrons. This is not realizable in practice. We are therefore forced to include the contribution of the phonon-scattered electrons.


2020 ◽  
Vol 7 (1) ◽  
Author(s):  
Masayoshi Ishii ◽  
Nobuhito Mori

Abstract A large-ensemble climate simulation database, which is known as the database for policy decision-making for future climate changes (d4PDF), was designed for climate change risk assessments. Since the completion of the first set of climate simulations in 2015, the database has been growing continuously. It contains the results of ensemble simulations conducted over a total of thousands years respectively for past and future climates using high-resolution global (60 km horizontal mesh) and regional (20 km mesh) atmospheric models. Several sets of future climate simulations are available, in which global mean surface air temperatures are forced to be higher by 4 K, 2 K, and 1.5 K relative to preindustrial levels. Nonwarming past climate simulations are incorporated in d4PDF along with the past climate simulations. The total data volume is approximately 2 petabytes. The atmospheric models satisfactorily simulate the past climate in terms of climatology, natural variations, and extreme events such as heavy precipitation and tropical cyclones. In addition, data users can obtain statistically significant changes in mean states or weather and climate extremes of interest between the past and future climates via a simple arithmetic computation without any statistical assumptions. The database is helpful in understanding future changes in climate states and in attributing past climate events to global warming. Impact assessment studies for climate changes have concurrently been performed in various research areas such as natural hazard, hydrology, civil engineering, agriculture, health, and insurance. The database has now become essential for promoting climate and risk assessment studies and for devising climate adaptation policies. Moreover, it has helped in establishing an interdisciplinary research community on global warming across Japan.


Author(s):  
Karl Zilles ◽  
Nicola Palomero-Gallagher ◽  
David Gräßel ◽  
Philipp Schlömer ◽  
Markus Cremer ◽  
...  

2017 ◽  
Vol 449 ◽  
pp. 1-11 ◽  
Author(s):  
Li Gao ◽  
Yongsong Huang ◽  
Bryan Shuman ◽  
W. Wyatt Oswald ◽  
David Foster

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