Ultra-high resolution cinematic digital 3-D imaging of the cell surface by field-emission scanning electron microscopy

1990 ◽  
Vol 48 (3) ◽  
pp. 12-13
Author(s):  
Klaus-Ruediger Peters ◽  
Martin D. Fox
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Three Dimensional ◽  
Stereo Imaging ◽  
Information Display ◽  
Dynamic Perspective ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Image Details ◽  
Scanning Electron

Field emission scanning electron microscopes (FSEM) establish high resolution on rugged bulk surfaces. However, often visualization and recognition of image details are hindered by low contrasts. Retrieval of such obscured image information is possible with three-dimensional (3-D) imaging.3-D information can be accessed in several ways. At low magnifications direct TV-rate imaging is possible allowing continuous relocation of the specimen and deduction of 3-D information from dynamic changes of perspectives and parallax. Additionally, two images from different stereo perspectives can be simultaniously produced and 3-D information can directly be displayed through optical or electronic devices (stereo imaging). The combination of dynamic perspective changes and stereo-presentation matches the 3-D information input of the human visual system and provides an optimal tool for visual 3-D pattern recognition.At higher magnifications (>~10,000-20,000x) real time stereo imaging is not possible. 3-D information display becomes limited to stationary perspective displays generated with long frame times.

Direct Defect Imaging in the High Resolution Sem

1990 ◽  
Vol 183 ◽  
Author(s):  
David C Joy
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
High Performance ◽  
Necessary Conditions ◽  
Electron Channeling ◽  
Electron Microscopes ◽  
Crystallographic Defects ◽  
Scanning Electron Microscopes ◽  
Defect Imaging ◽  
Scanning Electron

AbstractThe theory of imaging crystallographic defects in solid specimens through the use of electron channeling contrast is reviewed and the necessary conditions for observation are deduced. It is shown that current high performance field emission scanning electron microscopes can meet these requirements and produce dislocation images from suitable materials.

The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope

1997 ◽  
Vol 3 (S2) ◽  
pp. 1243-1244 ◽  
Author(s):  
Raynald Gauvin ◽  
Steve Yue
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Incident Electron Energy ◽  
Beam Diameter ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV with probe diameter smaller than 5 nm. At 1 keV, the electron range is 60 nm in aluminum and 10 nm in iron (computed using the CASINO program). Since the electron beam diameter is smaller than 5 nm at 1 keV, the resolution of these microscopes becomes closer to that of TEM.

Whither Scanning Electron Microscopy

1969 ◽  
Vol 27 ◽  
pp. 4-5
Author(s):  
T. E. Everhart
Keyword(s):  
Three Dimensional ◽  
Great Depth ◽  
Depth Of Field ◽  
Minimal Sample ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Dimensional Object ◽  
Scanning Electron Microscopes ◽  
Short Time ◽  
Scanning Electron

Although scanning electron microscopes have been available commercially for a relatively short time, their use is increasing rapidly. Countless persons have marvelled at their great depth of field, which produces an easily interpreted image of a three-dimensional object. Trained electron-microscopists have been impressed by the minimal sample preparation required for scanning microscope observation of inorganic objects, and of some organic objects. Non-specialists find the instrument easy to use, because many of the controls are related to familiar controls on television sets, on cathode-ray oscilloscopes, etc., and because the image on the cathode-ray tube screen is easy to interpret. Now seems the opportune moment to re-emphasize how the scanning electron microscope (SEM) differs fundamentally from the transmission electron (TEM), in order to insure that constraints imposed by the physics of image formation in the TEM will not be taken subconsciously as constraints in the SEM too.

Digital imaging with field emission scanning electron microscopes (FSEM)

1992 ◽  
Vol 50 (2) ◽  
pp. 1276-1277
Author(s):  
Klaus-Ruediger Peters ◽  
William H. Martin ◽  
Eisaku Oho
Keyword(s):  
Field Emission ◽  
Image Acquisition ◽  
Scanning Electron Micrographs ◽  
Output Quality ◽  
Plain Paper ◽  
Electron Microscopes ◽  
Information Image ◽  
Scanning Electron Microscopes ◽  
And Storage ◽  
Scanning Electron

Digital image acquisition and display of field emission scanning electron micrographs face limitations in terms of detail recognition, sampling of high resolution information, image output and storage space for high pixel density images. The image acquisition and image output of a JEOL JSEM-890 “in lens” field emission SEM were digitized and several approaches for adequate access to the scanned electron probe data have been developed. Images are acquired digitally in 3×4 VGA format (in multiples of 640×490 pixels) and stored in a RECOGNITION CONCEPTS INC. image processor (Trapix Plus). The images are displayed on workstation monitors with 1280×1024 format (HITACHI CM2085MU), and image documentation is done by several techniques of varying output quality. Low quality image documentation on plain paper can be obtained using a laser jet printer (HEWLETT PACKARD: Laser Jet III). High quality output is provided by a video printer utilizing special but inexpensive paper (SEIKOSHA VP350H). In addition, conventional analog CRT output and CRT photography on 4×5 inch POLAROID (Type 55 Positive/Negative) film is used.

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