Effects of nanoparticles on phase morphology in thin films of phase-separated diblock copolymers

2017 ◽  
Vol 32 (S1) ◽  
pp. S141-S150
Author(s):  
Dieter Jehnichen ◽  
Doris Pospiech ◽  
Peter Friedel ◽  
Andriy Horechyy ◽  
Andreas Korwitz ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Diblock Copolymers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gold Silver ◽  
Lateral Distance ◽  
Morphology Changes ◽  
Periodic Nanostructure

This study investigates the morphology changes in thin diblock copolymer (DiBCP) films occurring in the interaction with modified nanoparticles (NPs). Magnetite (Fe3O4) and silica (SiOx) were prepared and used. Poly(pentyl methacrylate-b-methyl methacrylate) (PPMA-b-PMMA) (70/30 mol mol−1, hcp cylinders of the PMMA phase) DiBCP were employed to prepare thin films having thicknesses to realize standing cylinders in pure DiBCP films. The investigations aimed at two topics: (1) morphology after controlled incorporation of organo-modified NP (gold, silver, Fe3O4, SiOx) and (2) additional solvent vapour annealing (SVA) with tetrahydrofuran (and chloroform for comparison). The laterally ordered morphology in thin films was examined by GISAXS and atomic force microscopy. Keeping the same type of morphology in nanocomposites, the dimensions of the periodic nanostructure altered depending on type and amount of incorporated NP. It was found that SiOx clusters enlarge the lateral distance of the PMMA cylinders, whereas metallic NPs reduce this parameter. Applying SVA improves the phase separation slightly, whereas lateral distances were kept constant or were reduced a little. Switching of domain orientation upon SVA could not be detected in the presence of NPs located at the polymer/substrate interface.

Thin Films of Poly(isoprene-b-ethylene Oxide) Diblock Copolymers on Mica: An Atomic Force Microscopy Study

Langmuir ◽  
2013 ◽  
Vol 29 (7) ◽  
pp. 2339-2349 ◽  
Author(s):  
Michail Kalloudis ◽  
Emmanouil Glynos ◽  
Stergios Pispas ◽  
John Walker ◽  
Vasileios Koutsos
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Ethylene Oxide ◽  
Diblock Copolymers ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Phase separation in SiO2–TiO2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy

2001 ◽  
Vol 16 (6) ◽  
pp. 1626-1631 ◽  
Author(s):  
A. Karthikeyan ◽  
Rui M. Almeida
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Sol Gel ◽  
Force Microscopy ◽  
Pure Silica ◽  
Atomic Force ◽  
Transmission Electron

An investigation of phase separation phenomena in gel and glassy thin films of silica–titania, with TiO2 contents of 20 and 40 mol%, has been carried out by atomic force microscopy (AFM) and transmission electron microscopy (TEM). The thin films were prepared by spin coating of a precursor sol on silicon wafers. Both the TEM measurements (carried out on scrapped thin film flakes) and the AFM measurements (carried out on films coated on the silicon substrates) for samples with different heat treatments suggest that spinodal-like structural inhomogeneities occur in these samples, unlike the corresponding observations in pure silica films, which are known to be homogeneous. Changes in the microstructure of the films have been noticed with the thermal treatment, in agreement with earlier x-ray photoemission studies. The finer characteristic dimensions of the phase separated regions reveal that silica–titania samples prepared by sol-gel processing exhibit a more intimate mixing of the phases.

Kinetics of Surface Phase Separation for PMMA/SAN Thin Films Studied by in Situ Atomic Force Microscopy

2005 ◽  
Vol 38 (2) ◽  
pp. 211-215 ◽  
Author(s):  
Yonggui Liao ◽  
Zhaohui Su ◽  
Xianggui Ye ◽  
Yunqi Li ◽  
Jichun You ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Surface Phase ◽  
Force Microscopy ◽  
Atomic Force ◽  
Kinetics Of

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

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