ALCHEMI as holography

2001 ◽  
Vol 7 (S2) ◽  
pp. 350-351
Author(s):  
J.C.H. Spence ◽  
C. Koch
Keyword(s):  
Electron Beam ◽  
Spherical Wave ◽  
Point Sources ◽  
Two Dimensional ◽  
Small Thickness ◽  
Kikuchi Pattern ◽  
Diffraction Patterns

Two-dimensional Atom Location by Chanelling Enhanced Microanalysis ( Alchemi ) maps of characteristic Xray emission as function of the diffraction conditions of a 200kV electron beam hav been obtained from thin crystals by several workers . Reciprocity shows that these are equivalent to the diffraction patterns produced at infinity by 200kV point sources of electrons on atom sites, sue! as D in figure 1, for CsCl. Here ray SCD at left has been time-reversed at right. Using multislici superlattice simulations which launch a spherical wave from an atom site, we find that the resultinj Kikuchi pattern breaks up into separated blobs along the K-lines at small thickness, with one blol generated at infinity along each atomic string direction . Each blob (e.g. ID) is a Gabor in-lim hologram (e.g of atom C, formed by source S at right). Each source atom on equivalent sites (E, D produces identical holograms, whose intensities add.

Effects of High-Energy Ions on Synthetic Quartz

1972 ◽  
Vol 30 ◽  
pp. 544-545
Author(s):  
Joseph J. Comer ◽  
Charles Bergeron ◽  
Lester F. Lowe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
High Energy ◽  
Transmission Electron ◽  
Kikuchi Lines ◽  
High Energy Ions ◽  
Diffraction Patterns ◽  
Dauphiné Twinning ◽  
Beam Damage

Using a Van De Graaff Accelerator thinned specimens were subjected to bombardment by 3 MeV N+ ions to fluences ranging from 4x1013 to 2x1016 ions/cm2. They were then examined by transmission electron microscopy and reflection electron diffraction using a 100 KV electron beam.At the lowest fluence of 4x1013 ions/cm2 diffraction patterns of the specimens contained Kikuchi lines which appeared somewhat broader and more diffuse than those obtained on unirradiated material. No damage could be detected by transmission electron microscopy in unannealed specimens. However, Dauphiné twinning was particularly pronounced after heating to 665°C for one hour and cooling to room temperature. The twins, seen in Fig. 1, were often less than .25 μm in size, smaller than those formed in unirradiated material and present in greater number. The results are in agreement with earlier observations on the effect of electron beam damage on Dauphiné twinning.

A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

Automatic analysis of Kikuchi diffraction patterns

1994 ◽  
Vol 52 ◽  
pp. 900-901
Author(s):  
H. Weiland ◽  
D. P. Field
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Relevant Information ◽  
Crystalline Materials ◽  
Large Size ◽  
Transmission Electron ◽  
New Type ◽  
Diffraction Patterns ◽  
Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

Membrane theory

2017 ◽  
Author(s):  
David J. Steigmann
Keyword(s):  
Three Dimensional ◽  
Thin Sheets ◽  
Two Dimensional ◽  
Leading Order ◽  
Membrane Theory ◽  
Dimensional Theory ◽  
Small Thickness

This chapter develops two-dimensional membrane theory as a leading order small-thickness approximation to the three-dimensional theory for thin sheets. Applications to axisymmetric equilibria are developed in detail, and applied to describe the phenomenon of bulge propagation in cylinders.

scholarly journals Symmetry of diffraction patterns of two-dimensional crystal structures

2021 ◽  
pp. 113336
Author(s):  
Tatiana Latychevskaia ◽  
Recep Zan ◽  
Sergey Morozov ◽  
Kostya S. Novoselov
Keyword(s):  
Crystal Structures ◽  
Two Dimensional ◽  
Diffraction Patterns ◽  
Dimensional Crystal

SLADS: a parallel code for direct simulations of scattering of large anisotropic dense nanoparticle systems

2017 ◽  
Vol 50 (3) ◽  
pp. 951-958 ◽  
Author(s):  
Sen Chen ◽  
Juncheng E ◽  
Sheng-Nian Luo
Keyword(s):  
Analytical Solutions ◽  
Small Angle ◽  
Real Space ◽  
Small Angle Scattering ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Parallel Code ◽  
Diffraction Patterns

SLADS(http://www.pims.ac.cn/Resources.html), a parallel code for direct simulations of X-ray scattering of large anisotropic dense nanoparticle systems of arbitrary species and atomic configurations, is presented. Particles can be of arbitrary shapes and dispersities, and interactions between particles are considered. Parallelization is achieved in real space for the sake of memory limitation. The system sizes attempted are up to one billion atoms, and particle concentrations in dense systems up to 0.36. Anisotropy is explored in terms of superlattices. One- and two-dimensional small-angle scattering or diffraction patterns are obtained.SLADSis validated self-consistently or against cases with analytical solutions.

Two-Dimensional X-ray Waveguides and Point Sources

Science ◽  
2002 ◽  
Vol 297 (5579) ◽  
pp. 230-234 ◽  
Author(s):  
F. Pfeiffer
Keyword(s):  
Point Sources ◽  
Two Dimensional ◽  
X Ray

scholarly journals Methods For Calculating Radio Holograms Of Volumetric Objects

2020 ◽  
Vol 12 (4) ◽  
pp. 429-436
Author(s):  
Valery A. Golunov ◽  
◽  
Vadim A. Korotkov ◽  
Keyword(s):  
Point Sources ◽  
Real Point ◽  
Two Dimensional ◽  
Frequency Range ◽  
Satisfactory Accuracy ◽  
Phase Errors ◽  
Sphere Radius ◽  
Virtual Point ◽  
Volumetric Objects

A method for calculating holograms for volumetric objects based on the representation of objects in the form of ensembles of virtual point sources distributed on a set of parallel planes has been proposed. The proposed method is the development of the well-known method in which objects are represented as ensemble of real point scatterers. The possibilities of the proposed method are demonstrated by calculating a hologram of a fragment of a sphere, on which 1000 points are randomly selected, at which radiation emanating from the center of the sphere is scattered. The choice of a fragment of a sphere as an object under study is due to the fact that when calculating its hologram, phase errors inherent in approximate calculations are most pronounced. The calculations were performed for the frequency range of 2...100 GHz, the sphere radius of 0.5 m, a two-dimensional hologram size of 0.65×0.65 m, and a pixel count of 512×512. It is shown that, in comparison with the known method, the proposed method makes it possible to calculate the amplitude of a hologram with satisfactory accuracy if virtual sources are placed on parallel planes in an amount of more than 64 pieces. In the case of objects that require representation in the form of an ensemble of point scatterers in the amount of more than 1000 pieces, the calculation of their holograms by the proposed method turns out to be much more efficient than the known method.

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