Polarization Screening and Image Formation in SSPM, EFM and Piezoresponse Imaging of Ferroelectric BaTiO3 (100) Surface

2000 ◽  
Vol 6 (S2) ◽  
pp. 706-707
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Electrostatic Force ◽  
Ferroelectric Materials ◽  
Scanning Probe ◽  
Microwave Ceramics ◽  
Force Microscopy ◽  
Resonant Frequency Shift ◽  
Significant Interest ◽  
Ferroelectric Surfaces ◽  
Scanning Surface Potential Microscopy

Possible applications of ferroelectric materials in non-volatile memories, MEMS, microwave ceramics, PTCR devices and sensors draw significant interest to these materials. Operation of most of these devices relies heavily on the surface (FRAM and other thin-film devices) and interface (PTCR, varistors) properties of ferroeiectrics, particularly on the polarization and charge distribution in the surface or interface region. Electrostatic scanning probe techniques such as electrostatic force microscopy (EFM), scanning surface potential microscopy (SSPM) and piezoresponse imaging (PRI) can be successfully employed for the characterization of ferroelectric surfaces on the micron and submicron level. The former technique is based on the detection of the resonant frequency shift of mechanically driven cantilever, which is proportional to gradient of electrostatic force acting on the tip. The latter two techniques are based on the voltage modulation approach, i.e. during imaging the piezoelectric actuator driving the cantilever is disengaged and the AC bias is applied directly to conductive tip.

Electrostatic Force Microscopy of Nanofibers and Carbon Nanotubes: Quantitative Analysis Using Theory and Experiment

2007 ◽  
Vol 1025 ◽  
Author(s):  
Sujit Sankar Datta ◽  
Cristian Staii ◽  
Nicholas J. Pinto ◽  
Douglas R. Strachan ◽  
AT Charlie Johnson
Keyword(s):  
Carbon Nanotubes ◽  
Electrostatic Force ◽  
Electrical Contacts ◽  
Scanning Probe ◽  
Electrostatic Force Microscopy ◽  
Electronic Density ◽  
Basic Principles ◽  
Force Microscopy ◽  
Theory And Experiment

AbstractElectrostatic force microscopy (EFM) is a widely used scanning-probe technique for the characterization of electronic properties of nanoscale samples without the use of electrical contacts. Here we review the basic principles of EFM, developing a quantitative framework by which EFM measurements of extended nanostructures can be understood. We support our calculations with experimental data of EFM of carbon nanotubes and conducting or insulating electrospun polyaniline-based nanofibers. Furthermore, we explore routes towards extending EFM as a means of non-invasively probing the local electronic density of states of carbon nanotubes.

Local Potential at Atomically Abrupt Oxide Interfaces by Scanning Probe Microscopy

1999 ◽  
Vol 586 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Scanning Probe Microscopy ◽  
Electrostatic Force ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrostatic Model ◽  
Oxide Interfaces ◽  
Force Microscopy ◽  
Interface Potential ◽  
Scanning Surface Potential Microscopy ◽  
Imaging Mechanisms

ABSTRACTElectrostatic force microscopy and scanning surface potential microscopy are combined to quantify nanometer scale field variations in the vicinity of grain boundaries in donor doped σ15 SrTiO3 bicrystals. An analytical electrostatic model is used to develop a procedure for determining interface potential from measurements made above the surface. Grain boundary potentials and depletion widths determined by both techniques are in excellent agreement despite the fundamental difference in imaging mechanisms. The comparison confirms the analytical approach and illustrates use of scanning probes to image interface properties.

Determining Grain Boundary Potential from Electrostatic Force Based Scanning Probe Imaging

2000 ◽  
Vol 6 (S2) ◽  
pp. 720-721
Author(s):  
Dawn A. Bonnell ◽  
Sergei V. Kalinin
Keyword(s):  
Grain Boundary ◽  
Surface Potential ◽  
Electrostatic Force ◽  
Scanning Probe ◽  
Repulsive Interaction ◽  
Nanometer Scale ◽  
Applied Bias ◽  
Force Microscopy ◽  
Scale Field ◽  
Scanning Surface Potential Microscopy

A combination of electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM) is used to quantify nanometer scale field variations for the general case of electronically inhomogeneous surfaces. The specific example illustrated here is the intersection of a Σ5 grain boundary in donor doped SrTiO3 intersecting the (100) surface. ‘The topographic structure is compared to the surface potential, the positive and the negative electrostatic force images in figure 1. The EFM contrast changes sign with the polarity of the applied bias, as expected for an electrostatic attractive/repulsive interaction. There is a significant localization of surface potential at the grain boundary that is manifest as a protrusion in the SPPM image.To quantify the properties at the surface, rather than above the surface where the measurements are acquired, a relationship connecting the sample-tip interaction is required. It has been shown that models based on simple geometric assumptions do not represent the behavior well.

Measurement of Plasticity Gradients with Scanning Probe Microscopy

1993 ◽  
Vol 318 ◽  
Author(s):  
James D. Kiely ◽  
Dawn A. Bonnell
Keyword(s):  
Fracture Surface ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Ceramic System ◽  
Force Microscopy ◽  
Metal Fracture ◽  
Atomic Force ◽  
Metal Ceramic

ABSTRACTScanning Tunneling and Atomic Force Microscopy were used to characterize the topography of fractured Au /sapphire interfaces. Variance analysis which quantifies surface morphology was developed and applied to the characterization of the metal fracture surface of the metal/ceramic system. Fracture surface features related to plasticity were quantified and correlated to the fracture energy and energy release rate.

scholarly journals The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

2012 ◽  
Vol 3 ◽  
pp. 722-730 ◽  
Author(s):  
César Moreno ◽  
Carmen Munuera ◽  
Xavier Obradors ◽  
Carmen Ocal
Keyword(s):  
Memory Effect ◽  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Versatile Tool ◽  
Scanning Force ◽  
Memristor Device

We report on the use of scanning force microscopy as a versatile tool for the electrical characterization of nanoscale memristors fabricated on ultrathin La0.7Sr0.3MnO3 (LSMO) films. Combining conventional conductive imaging and nanoscale lithography, reversible switching between low-resistive (ON) and high-resistive (OFF) states was locally achieved by applying voltages within the range of a few volts. Retention times of several months were tested for both ON and OFF states. Spectroscopy modes were used to investigate the I–V characteristics of the different resistive states. This permitted the correlation of device rectification (reset) with the voltage employed to induce each particular state. Analytical simulations by using a nonlinear dopant drift within a memristor device explain the experimental I–V bipolar cycles.

Characterization of Ferroelectric BaTiO3 (100) Surfaces by Variable Temperature Scanning Surface Potential Microscopy and Piezoresponse Imaging

1999 ◽  
Vol 596 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Surface Potential ◽  
Variable Temperature ◽  
Piezoelectric Response ◽  
Ferroelectric State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Temperature Scanning ◽  
Scanning Surface Potential Microscopy ◽  
Kinetics Of

AbstractVariable temperature atomic force microscopy (AFM), scanning surface potential microscopy (SSPM) and piezoresponse imaging were applied to the characterization of a model BaTiO3(100) surface. The influence of the domain structure on surface topography, surface potential and piezoresponse image is discussed. The domain induced surface corrugations and piezoelectric response were found to disappear above the Curie temperature in full agreement with theoretical expectations. Relaxation of apparent surface potential after the transition to paraelectric state on heating and during the transition to ferroelectric state on cooling was observed. The kinetics of potential relaxation was orders of magnitude slower than that of the transition.

scholarly journals Charge Characterization of an Electrically Charged Fiber via Electrostatic Force Microscopy

2006 ◽  
Vol 1 (2) ◽  
pp. 155892500600100 ◽  
Author(s):  
Joyoun Kim ◽  
Warren J. Jasper ◽  
Juan P. Hinestroza
Keyword(s):  
Electrostatic Force ◽  
Mathematical Expression ◽  
Quantitative Agreement ◽  
Electrostatic Force Microscopy ◽  
Quantitative Interpretation ◽  
Polarization Effects ◽  
Force Microscopy ◽  
Sample Separation ◽  
Electrically Charged

The charge of a corona charged electret fiber as well as an uncharged glass fiber was characterized via Electrostatic Force Microscopy (EFM). Electrostatic force gradient images were obtained by monitoring the shifts in phase between the oscillations of the biased EFM cantilever and those of a piezoelectric driver. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the cantilever. A mathematical expression, based on the Coulombic and induced polarization effects, were used to model the EFM phase shifts as a function of the applied tip bias voltages. There was quantitative agreement between the experimental data and the mathematical expression, and the quantitative interpretation for charges on the fiber was made.

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