scholarly journals Improvements to Energy Resolution of an X-ray Energy Dispersive Spectrum by Deconvolution Using the Zero Strobe Peak

2003 ◽  
Vol 9 (S02) ◽  
pp. 124-125 ◽  
Author(s):  
M. Watanabe ◽  
D. B. Williams
Keyword(s):  
Energy Resolution ◽  
Energy Dispersive Spectrum ◽  
Energy Dispersive ◽  
X Ray

High energy resolution PIXE spectroscopy at the J. Stefan Institute, Ljubljana

2014 ◽  
Vol 24 (03n04) ◽  
pp. 205-215
Author(s):  
M. Kavčič
Keyword(s):  
Trace Element ◽  
Energy Resolution ◽  
Trace Element Analysis ◽  
High Energy ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Pixe Analysis ◽  
X Ray ◽  
Analytical Technique ◽  
Stefan Institute

While traditional proton induced X-ray emission (PIXE) analytical technique is based on the energy dispersive solid state detectors used to collect the X-ray fluorescence from the sample, wavelength dispersive X-ray (WDX) spectrometers are applied in high energy resolution PIXE (HR-PIXE) analysis. The main drawback of the WDX spectroscopy is the relatively low efficiency making it less applicable for trace element PIXE analysis. However, the efficiency was enhanced significantly in modern spectrometers employing cylindrically or even spherically curved crystals combined with position sensitive X-ray detectors. The energy resolution of such a spectrometer may exceed the resolution of the energy dispersive detector by two orders of magnitude while keeping the efficiency at a high enough level to perform trace element analysis. In this paper, the recent history and the development of HR-PIXE spectroscopy at the J. Stefan Institute in Ljubljana is presented. Our current setup based on in-vacuum Johansson-type crystal spectrometer is presented in more details followed by some most recent applications.

scholarly journals Superconducting Tunnel Junction Array Development for High-Resolution Energy-Dispersive X-ray Spectroscopy

1998 ◽  
Vol 4 (6) ◽  
pp. 616-621 ◽  
Author(s):  
S. Friedrich ◽  
C.A. Mears ◽  
B. Nideröst ◽  
L.J. Hiller ◽  
M. Frank ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Tunnel Junction ◽  
Count Rate ◽  
Energy Dispersive ◽  
Superconducting Tunnel Junction ◽  
X Rays ◽  
Detector Arrays ◽  
X Ray ◽  
Junction Array ◽  
Stj Detector

Cryogenic energy-dispersive X-ray detectors are being developed because of their superior energy resolution (10 eV FWHM for keV X-rays) compared to that achieved in semiconductor energy-dispersive spectrometry (EDS) systems. So far, their range of application is limited because of their comparably small size and low count rate. We present data on the development of superconducting tunnel junction (STJ) detector arrays to address both of these issues. A single STJ detector has a resolution of around 10 eV below 1 keV and can be operated at count rates of the order 10,000 counts/sec. We show that the simultaneous operation of several STJ detectors does not dimish their energy resolution significantly, and it increases the detector area and the maximum count rate by a factor given by the total number of independent channels.

Determination of Orientation Relationship between TiC and Ti2CS in a Ti-Containing Steel by TEM

2013 ◽  
Vol 331 ◽  
pp. 531-535
Author(s):  
Qing Hong Luo ◽  
De Lu Liu ◽  
Chun Zhi Li
Keyword(s):  
Titanium Carbide ◽  
Epitaxial Growth ◽  
Orientation Relationship ◽  
Energy Dispersive Spectrum ◽  
Energy Dispersive ◽  
X Ray ◽  
Higher Temperature ◽  
Weathering Resistance

The orientation relationship between TiC and Ti2CS in a Ti-containing weathering-resistance steel were observed by TEM technology and X-ray energy dispersive spectrum (EDS). The results showed that many tiny TiC (titanium carbide) were forming on Ti2CS (titanium carbide sulfide), which precipitates on relatively higher temperature than TiC, The orientation relationship between TiC and Ti2CS is ; . The epitaxial growth is important mechanisms for titanium carbide forming in steels.

Is Energy Resolution Still an Important Specification in EDS?

2013 ◽  
Vol 21 (4) ◽  
pp. 30-34 ◽  
Author(s):  
Keith Thompson
Keyword(s):  
Energy Resolution ◽  
Energy Dispersive Spectroscopy ◽  
Energy Dispersive ◽  
Active Area ◽  
Collection Rate ◽  
X Ray

Energy Dispersive Spectroscopy (EDS) X-ray detectors have undergone a wave of technology enhancements since the first silicon drift-based EDS detector (SDD) was commercially introduced roughly 15 years ago. The first such EDS systems featured an active area of 5 mm2, an energy resolution between 160 eV–200 eV, and a maximum collection rate approaching only 100,000 input counts/second.

scholarly journals Structure and Optical Properties of B'- Phase of Ag8SnSe6

2016 ◽  
Vol 17 (3) ◽  
pp. 346-349
Author(s):  
І.V. Semkiv
Keyword(s):  
Crystal Structure ◽  
Optical Properties ◽  
Absorption Spectrum ◽  
Optical Absorption ◽  
Experimental Studies ◽  
Energy Dispersive Spectrum ◽  
Energy Dispersive ◽  
Interatomic Distances ◽  
X Ray ◽  
Good Agreement

Energy dispersive x-ray spectroscopy of lowtemperature b¢-Ag8SnSe6 crystalcarried out. Energy dispersive spectrum shows only peaks related to Ag8SnSe6. Experimental optical absorption spectrum and band gap value 0.82 eV are determined. Theoretical calculation of absorption spectrum shows good agreement with experimental studies. Modeling of crystal structure of Ag8SnSe6 argyrodite and interatomic distances calculation are carried out.

B13-O-04Fabrication of High Energy Resolution Silicon Drift Detector for Energy Dispersive X-ray Spectrometer

Microscopy ◽  
2015 ◽  
Vol 64 (suppl 1) ◽  
pp. i33.1-i33
Author(s):  
Yu-Chao Ma ◽  
Chiao-Chun Hsu ◽  
Fan-Gang Tseng ◽  
Chih-Hao Lee ◽  
Yun-Ju Chuang ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Silicon Drift Detector ◽  
X Ray

SEM-TES Application to Chemical State Analysis on Cation of Electrode Materials for Electrochemical Capacitors Based on the Sensitivity Correction of X-Ray Intensity Data

2014 ◽  
Vol 617 ◽  
pp. 94-97
Author(s):  
Masataka Ohgaki ◽  
Keiichi Tanaka ◽  
Hidekazu Suzuki ◽  
Masakatsu Hasuda ◽  
Syo Matsumura ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Chemical Bonding ◽  
Lower Energy ◽  
Electrochemical Capacitors ◽  
Chemical State ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Intensity Data ◽  
X Ray ◽  
Tes Microcalorimeter

The microcalorimeter detects the energy of incidentX-ray photon by the slight temperature rise of a device at a very low temperature, and the detector of a superconducting transition-edge sensor (TES) microcalorimeter has been developed for the measurement of energy dispersive X-ray photons of the energy of 10 to 20 keV with the energy resolution better than 100 eV of FWHM value by having the counting rate over 100 counts per second. A FE-SEM with a detector of TES microcalorimeter (SEM-TES) has already been developed for the extra-high resolution energy-dispersive X-ray spectrometry system to apply in electron-microprobe chemical analyses. Recently, we developed the sensitive correct function on the observed X-ray intensity data measured in the system. Then, the high energy resolution of revised SEM-TES system is precisely able to determine the element contents on the sample. In addition, the chemical bonding states can be clarified by the fluorescent X-ray intensities in the lower energy region derived with a low accelerating voltage of SEM-TES system. We applied the revised SEM-TES system to analyze chemical state on the electrode of nanosheets-derived Hx(Ni1/3Co1/3Mn1/3)O2 for newly developing electrochemical capacitors. We investigated the chemicalstate of cations by not the M-lines but the L-beta and L-alpha lines as the lower energy lines having relative large contribution on chemical bonding. As a result, we revealed a specific chemical state of the Mn different from that of Li(Ni1/3Co1/3Mn1/3)O2 electrode in LiB, that was supported by the result of TEM-EELS analysis. These results show that the SEM-TES system can be a useful analytical tool for the chemical bonding state and electronic structure determinations in a wide range of materials.

scholarly journals Assessing the Grindability Behaviour of Anka (Zamfara State, Nigeria) Manganese Ore towards Effective Manganese Mineral Liberation

2021 ◽  
pp. 68-73
Author(s):  
Y. E. Gbadamosi ◽  
O. O. Alabi ◽  
J. O. Borode
Keyword(s):  
Electron Microscope ◽  
Energy Dispersive Spectrum ◽  
Energy Dispersive ◽  
Manganese Ore ◽  
Manganese Mineral ◽  
X Ray ◽  
Mineral Liberation ◽  
Work Index ◽  
Fluorescence Spectrometer ◽  
Scanning Electron

The Bond standard grindability test provides a Work Index that is widely used to estimate the energy required for ore grinding. The research investigates the work index of Anka Manganese ore at Anka deposit in Zamfara state, Nigeria. The reference ore (Quartz) was sourced from the studied ore overburden in the mine. The test ore and the reference ore were characterized using Energy Dispersive X-ray fluorescence spectrometer, X - ray Diffractometer and the Scanning Electron Microscope equipped with Energy Dispersive Spectrum. 500 g each of the manganese ore and quartz were sampled and prepared by crushing and grinding to 100% passing 1200 μm sieve. 100 g of prepared ores were charged into array of sieve arranged in √2 series from 1000 μm to 63 μm. Set of sieves were mounted on the Automated Pascal Denver sieve shaker (16153) and was in operation for 20 minutes. The work index of reference ore was used to calculate the work index of the test ore using Gaudin Schuman expression to obtain a work index of 14.16 Kwh/ton for test ore and it lies within the work index of 10-15.14 Kwh/ton for manganese ore stated in the literature and the energy expended to achieve communition at mineral liberation size was calculated to be 3.3984 Kw/ton.

scholarly journals A high-throughput energy-dispersive tender X-ray spectrometer for shot-to-shot sulfur measurements

2019 ◽  
Vol 26 (3) ◽  
pp. 629-634 ◽  
Author(s):  
Baxter Abraham ◽  
Stanislaw Nowak ◽  
Clemens Weninger ◽  
Rebecca Armenta ◽  
Jim Defever ◽  
...  
Keyword(s):  
High Throughput ◽  
Energy Resolution ◽  
Free Electron ◽  
Free Electron Laser ◽  
High Energy ◽  
Emission Lines ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
X Ray ◽  
Sulfur Containing

An X-ray emission spectrometer that can detect the sulfur Kα emission lines with large throughput and a high energy resolution is presented. The instrument is based on a large d-spacing perfect Bragg analyzer that diffracts the sulfur Kα emission at close to backscattering angles. This facilitates the application of efficient concepts routinely employed in hard X-ray spectrometers towards the tender X-ray regime. The instrument described in this work is based on an energy-dispersive von Hamos geometry that is well suited for photon-in photon-out spectroscopy at X-ray free-electron laser and synchrotron sources. Comparison of its performance with previously used instrumentation is presented through measurements using sulfur-containing species performed at the LCLS. It is shown that the overall signal intensity is increased by a factor of ∼15. Implementation of this approach in the design of a tender X-ray spectroscopy endstation for LCLS-II is also discussed.

Microanalysis of precipitates in a ferritic steel

1978 ◽  
Vol 36 (1) ◽  
pp. 618-619
Author(s):  
J.M. Titchmarsh
Keyword(s):  
Ferritic Steel ◽  
Particle Identification ◽  
Energy Dispersive ◽  
Objective Lens ◽  
Ferritic Steels ◽  
Replica Technique ◽  
X Ray ◽  
Large Numbers ◽  
Scanning Transmission ◽  
Made In

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.

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