scholarly journals Electron Tomography for Nanoscale Materials Science

2005 ◽  
Vol 11 (S02) ◽  
Author(s):  
P A Midgley ◽  
T Yates ◽  
I Arslan ◽  
J Tong ◽  
J M Thomas
2004 ◽  
Vol 10 (S02) ◽  
pp. 148-149 ◽  
Author(s):  
Paul Anthony Midgley ◽  
Matthew Weyland ◽  
Tim Yates ◽  
Jenna Tong ◽  
Rafal E Dunin-Borkowski ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


2002 ◽  
Vol 738 ◽  
Author(s):  
Günter Möbus ◽  
Ron C. Doole ◽  
Beverley J. Inkson

ABSTRACTElectron Tomography is shown to be applicable to problems of materials science if a contrast mechanism is used which provides a projection relationship for crystals not depending on lattice plane orientation. Energy filtered TEM (EFTEM) in its mode of electron spectroscopic imaging (ESI) and STEM-EDX-Mapping are, subject to limitations, suitable image formation techniques. The spectroscopic operation not only allows to overcome Bragg scattering artefacts, but offers the possibility of recording 4-dimensional data (volume and energy) of a region of interest, otherwise only known from NMR and XAS/XANES tomography at larger length-scales and from field-ion microscopy (atom probe) under restrictive conditions.


Materials ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 1304 ◽  
Author(s):  
Giulio Guzzinati ◽  
Thomas Altantzis ◽  
Maria Batuk ◽  
Annick De Backer ◽  
Gunnar Lumbeeck ◽  
...  

The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.


2001 ◽  
Vol 7 (S2) ◽  
pp. 88-89
Author(s):  
Ingo Daberkow ◽  
Bernhard Feja ◽  
Peter Sparlinek ◽  
Hans R. Tietz

During the last decade, computation of a three-dimensional image from a tilt series (3D reconstruction) has become a well established method, of which a variety of implementations are available. The term “electron tomography” is now generally used for this type of data acquisition and 3D reconstruction. An overview over the techniques involved is given in.With the introduction of micro-processor-controlled TEMs and cooled slow-scan CCD cameras and with the progress in performance of high-speed computers, automation of complex imaging procedures became mainly a task of developing appropriate software, using the control facilities of the microscope. in this way, automated electron tomography was realized in 1990 at the Max- Planck-Institute for Biochemistry in Martinsried, and at about the same time at the University of California in San Francisco (UCSF). New techniques for automatic focusing and alignment, developed somewhat earlier , have been integrated in these automated tomography procedures. in the following we discuss the requirements of automatic data acquisition and the present implementation for several TEMs.


2016 ◽  
Vol 160 ◽  
pp. 23-34 ◽  
Author(s):  
Tony Printemps ◽  
Guido Mula ◽  
Daniele Sette ◽  
Pierre Bleuet ◽  
Vincent Delaye ◽  
...  

2016 ◽  
Vol 263 (3) ◽  
pp. 312-319 ◽  
Author(s):  
TONY PRINTEMPS ◽  
NICOLAS BERNIER ◽  
PIERRE BLEUET ◽  
GUIDO MULA ◽  
LIONEL HERVÉ

2011 ◽  
Vol 17 (S2) ◽  
pp. 934-935 ◽  
Author(s):  
K Batenburg ◽  
S Bals ◽  
S Van Aert ◽  
T Roelandts ◽  
J Sijbers

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2001 ◽  
Vol 73 (10) ◽  
pp. 1613-1623 ◽  
Author(s):  
Tsuguo Sawada

Among the recent topics of photothermal (PT) applications of lasers, we focus on ultrafast (<=1.0 ns) photothermal/photoacoustic (PT/PA) phenomena occurring at interfaces, which play important roles in nanoscale materials science and technology. Here, we describe our recently developed novel PT techniques called transient reflecting grating (TRG) spectrometries. These techniques have been applied to the studies of solid surfaces, film substrates, and solid/liquid interfaces.


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