Enhanced Quantitative Characterization Of Textured Al-doped ZnO Thin Films Using Plan-view Electron Diffraction

2012 ◽  
Vol 18 (S2) ◽  
pp. 1248-1249
Author(s):  
J. Wang

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Author(s):  
Fouaz Lekoui ◽  
Salim Hassani ◽  
Mohammed Ouchabane ◽  
Hocine Akkari ◽  
Driss Dergham ◽  
...  

2020 ◽  
Author(s):  
Irine Linson ◽  
Sreedev Padmanabhan ◽  
Rakhesh Vamadevan ◽  
Roshima Narayanankutty Sujatha ◽  
Balakrishnan Shankar

2007 ◽  
Vol 51 (12) ◽  
pp. 79 ◽  
Author(s):  
Sang Hern LEE ◽  
Young Moon YU ◽  
Tae Hoon KIM ◽  
Se-Young JEONG

2013 ◽  
Vol 39 (5) ◽  
pp. 5535-5543 ◽  
Author(s):  
R.A. Mereu ◽  
A. Mesaros ◽  
M. Vasilescu ◽  
M. Popa ◽  
M.S. Gabor ◽  
...  

RSC Advances ◽  
2020 ◽  
Vol 10 (66) ◽  
pp. 40467-40479
Author(s):  
R. Kara ◽  
L. Mentar ◽  
A. Azizi

Mg-doped ZnO (MZO) thin films were successfully fabricated on fluorine-doped tin-oxide (FTO)-coated glass substrates by an electrochemical deposition method using aqueous electrolytes of 80 mM Zn(NO3)2 with different concentrations of Mg(NO3)2.


2019 ◽  
Vol 6 (10) ◽  
pp. 106421
Author(s):  
Guankong Mo ◽  
Jiahui Liu ◽  
Guotao Lin ◽  
Zhuoliang Zou ◽  
Zeqi Wei ◽  
...  

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