Electron Microscopy Characterization of Ni-Cr-B-Si-C Laser Deposited Coatings

2013 ◽  
Vol 19 (1) ◽  
pp. 120-131 ◽  
Author(s):  
I. Hemmati ◽  
J.C. Rao ◽  
V. Ocelík ◽  
J.Th.M. De Hosson

AbstractDuring laser deposition of Ni-Cr-B-Si-C alloys with high amounts of Cr and B, various microstructures and phases can be generated from the same chemical composition that results in heterogeneous properties in the clad layer. In this study, the microstructure and phase constitution of a high-alloy Ni-Cr-B-Si-C coating deposited by laser cladding were analyzed by a combination of several microscopy characterization techniques including scanning electron microscopy in secondary and backscatter imaging modes, energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and transmission electron microscopy (TEM). The combination of EDS and EBSD allowed unequivocal identification of micron-sized precipitates as polycrystalline orthorhombic CrB, single crystal tetragonal Cr5B3, and single crystal hexagonal Cr7C3. In addition, TEM characterization showed various equilibrium and metastable Ni-B, Ni-Si, and Ni-Si-B eutectic products in the alloy matrix. The findings of this study can be used to explain the phase formation reactions and to tune the microstructure of Ni-Cr-B-Si-C coatings to obtain the desired properties.

2009 ◽  
Vol 24 (3) ◽  
pp. 647-651 ◽  
Author(s):  
M. Rester ◽  
C. Motz ◽  
R. Pippan

Electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM) analyses of small indentations in copper single crystals exhibit only slight changes of the crystal orientation in the surroundings of the imprints. Far-reaching dislocations might be the reason for these small misorientation changes. Using EBSD and TEM technique, this work makes an attempt to visualize the far-propagating dislocations by introducing a twin boundary in the vicinity of small indentations. Because dislocations piled up at the twin boundary produce a misorientation gradient, the otherwise far-propagating dislocations can be detected.


2008 ◽  
Vol 47 (7) ◽  
pp. 5330-5332 ◽  
Author(s):  
Satoshi Harui ◽  
Hidetoshi Tamiya ◽  
Takanobu Akagi ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  

2013 ◽  
Vol 19 (S4) ◽  
pp. 103-104
Author(s):  
C.B. Garcia ◽  
E. Ariza ◽  
C.J. Tavares

Zinc Oxide is a wide band-gap compound semiconductor that has been used in optoelectronic and photovoltaic applications due to its good electrical and optical properties. Aluminium has been an efficient n-type dopant for ZnO to produce low resistivity films and high transparency to visible light. In addition, the improvement of these properties also depends on the morphology, crystalline structure and deposition parameters. In this work, ZnO:Al films were produced by d.c. pulsed magnetron sputtering deposition from a ZnO ceramic target (2.0 wt% Al2O3) on glass substrates, at a temperature of 250 ºC.The crystallographic orientation of aluminum doped zinc oxide (ZnO:Al) thin films has been studied by Electron Backscatter Diffraction (EBSD) technique. EBSD coupled with Scanning Electron Microscopy (SEM) is a powerful tool for the microstructural and crystallographic characterization of a wide range of materials.The investigation by EBSD technique of such films presents some challenges since this analysis requires a flat and smooth surface. This is a necessary condition to avoid any shadow effects during the experiments performed with high tilting conditions (70º). This is also essential to ensure a good control of the three dimensional projection of the crystalline axes on the geometrical references related to the sample.Crystalline texture is described by the inverse pole figure (IPF) maps (Figure 1). Through EBSD analysis it was observed that the external surface of the film presents a strong texture on the basal plane orientation (grains highlighted in red colour). Furthermore it was possible to verify that the grain size strongly depends on the deposition time (Figure 1 (a) and (b)). The electrical and optical film properties improve with increasing of the grain size, which can be mainly, attributed to the decrease in scattering grain boundaries which leads to an increasing in carrier mobility (Figure 2).The authors kindly acknowledge the financial support from the Portuguese Foundation for Science and Technology (FCT) scientific program for the National Network of Electron Microscopy (RNME) EDE/1511/RME/2005.


2021 ◽  
Author(s):  
Olga Ageeva ◽  
Ge Bian ◽  
Gerlinde Habler ◽  
Rainer Abart

<p>Magnetite micro-inclusions in silicate minerals are important carriers of the remanent magnetization of rocks. Their shape orientation relationships (SOR) and crystallographic orientation relationships (COR) to the host crystal are of interest in the context of the bulk magnetic properties of the inclusion-host assemblage. We investigated the SOR and COR of magnetite (MT) micro-inclusions in plagioclase (PL) from oceanic gabbro using correlated optical microscopy, scanning electron microscopy, Electron backscatter diffraction analysis and Transmission electron microscopy.</p><p>In the mm-sized PL crystals of the investigated gabbros MT is present as equant, needle- and lath-shaped (sub)micrometer sized inclusions. More than 95% of the needle-shaped inclusions show SOR and specific COR to the plagioclase host. Most of the needles are elongated perpendicular to one of the MT{111} planes, which is aligned parallel to one of the (112), (1-12), (-312), (-3-12), (150), (1-50) or (100) planes of plagioclase. These inclusions are classified as “plane-normal type”. The needle elongation parallel to MT<111>, which is the easy direction of magnetization, ensures high magnetic susceptibility of these inclusions. The underlying formation mechanism is related to the parallel alignment of oxygen layers with similar lattice spacing across the MT-PL interfaces that are parallel to the elongation direction [1].</p><p>Apart from the SOR and the alignment of a MT{111} with one of the PL low index planes, the MT crystals rotate about the needle elongation direction. The rotation angles are statistically distributed with several maxima representing specific orientation relationships. In some cases one of the MT<001> axes is aligned with PL[14 10 7] or PL[-14 10 -7], which ensures that FeO<sub>6 </sub>octahedra of MT well fit into channels // [001] of PL, which are formed by six membered rings of SiO<sub>4</sub> and AlO<sub>4</sub> tetrahedra [2]. This COR is referred to as the “nucleation orientation” of magnetite with respect to PL. There are several other possibilities to fit FeO<sub>6</sub> octahedra into the [001] channels of PL, but the alignment stated above allows for the additional parallel alignment of one of the MT{111} with one of the above mentioned low index lattice planes of PL. MT crystals with one of these nucleation orientations can undergo directional growth to develop laths and needles. MT crystals with other nucleation orientations that do not allow for the parallel alignment of MT{111} with the above mentioned PL lattice planes, do not significantly grow and form the equant inclusions.</p><p>For some needles one or more of the MT{011} planes that are parallel to the needle elongation direction, are aligned with low-index planes of plagioclase such as PL (112), PL(150), PL(1-50) etc., and form MT facets. This situation corresponds to achievement of the best possible match between the two crystal lattices. This can either be generated during primary growth or during re-equilibration of the micro-inclusions and the plagioclase host.</p><p>Funding by RFBR project 18-55-14003 and Austrian Science fund (FWF): I 3998-N29 is acknowledged.</p><p>Reference</p><p>[1] Ageeva et al (2020) Contrib. Mineral. Petrol. 175(10), 1-16.</p><p>[2] Wenk et al (2011) Am. Min. 96, 1316-1324</p>


Sign in / Sign up

Export Citation Format

Share Document