Characterization of a Sub-Grain Boundary Using Accurate Electron Channeling Contrast Imaging

High temperature mechanical properties of structural ceramics Si3N4 are controlled by ∼1 nm thick silicate amorphous films covering all grain boundaries. The composition of the film dictates the equilibrium film thickness resulted from a force balance at grain boundary. Many efforts arc brought to alter film chemistry and thickness, and this system offers ideal model materials to understand grain boundary and property relationship. Using a dedicated STEM (VG HB601) with high spatial resolution EELS analysis and high resolution Z-contrast imaging, various novel quantification data of the grain boundary in Si3N4 can be obtained. The methods described here can also be applied to other types of grain boundaries.EELS profiling was performed to acquire a full spectrum from each position at a lateral increment of 1Å across a boundary in a pure Si3N4 sample with only SiO2 impurities from surface oxidation. It gives directly elemental distributions near the boundary such as Si, N and O profiles shown in Fig. 1.

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Electron Channeling Contrast Imaging for Beyond Silicon Materials Characterization

10.31399/asm.cp.istfa2018p0363 ◽

2018 ◽

Author(s):

Libor Strakos ◽

Ondrej Machek ◽

Tomas Vystavel ◽

Andreas Schulze ◽

Han Han ◽

...

Keyword(s):

Lattice Mismatch ◽

Defect Density ◽

Analytical Techniques ◽

Device Performance ◽

Contrast Imaging ◽

Large Area ◽

Electron Channeling ◽

Silicon Materials ◽

Non Destructive

Abstract As semiconductor devices continue to shrink, novel materials (e.g. (Si)Ge, III/V) are being tested and incorporated to boost device performance. Such materials are difficult to grow on Si wafers without forming crystalline defects due to lattice mismatch. Such defects can decrease or compromise device performance. For this reason, non-destructive, high throughput and reliable analytical techniques are required. In this paper Electron Channeling Contrast Imaging (ECCI), large area mapping and defect detection using deep learning are combined in an analytical workflow for the characterization of the defectivity of “beyond Silicon” materials. Such a workflow addresses the requirements for large areas 10-4 cm2 with defect density down to 104 cm-2.

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Microscale Characterization of Deformation Defects in Bulk Intermetallics Alloys Using Electron Channeling Contrast Imaging

Materials Science Forum ◽

10.4028/www.scientific.net/msf.426-432.1885 ◽

2003 ◽

Vol 426-432 ◽

pp. 1885-1890

Author(s):

M.A. Crimp ◽

B.A. Simkin ◽

B.-C. Ng ◽

D.E. Mason ◽

Thomas R. Bieler

Keyword(s):

Contrast Imaging ◽

Electron Channeling ◽

Deformation Defects

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Rapid characterization of extended defects in III–V/Si by electron channeling contrast imaging

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) ◽

10.1109/pvsc.2014.6925512 ◽

2014 ◽

Cited By ~ 2

Author(s):

Santino D. Carnevale ◽

Julia I. Deitz ◽

John A. Carlin ◽

Yoosuf N. Picard ◽

Marc De Graef ◽

...

Keyword(s):

Extended Defects ◽

Contrast Imaging ◽

Electron Channeling ◽

Rapid Characterization

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Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction

Microscopy and Microanalysis ◽

10.1017/s1431927616011612 ◽

2016 ◽

Vol 22 (5) ◽

pp. 997-1006 ◽

Cited By ~ 8

Author(s):

Mahrokh Dorri ◽

Stéphane Turgeon ◽

Nicolas Brodusch ◽

Maxime Cloutier ◽

Pascale Chevallier ◽

...

Keyword(s):

Stainless Steel ◽

Oxide Layer ◽

316L Stainless Steel ◽

Electron Backscatter Diffraction ◽

Contrast Imaging ◽

Amorphous Oxide ◽

Electron Channeling ◽

Electron Backscatter ◽

Backscatter Diffraction

AbstractCharacterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.

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A Dislocation-scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl Alloy

10.20944/preprints201801.0183.v6 ◽

2018 ◽

Author(s):

Antoine Guitton ◽

Hana Kriaa ◽

Emmanuel Bouzy ◽

Julien Guyon ◽

Nabila Maloufi

Keyword(s):

Plastic Deformation ◽

Room Temperature ◽

Tial Alloy ◽

Mechanical Twinning ◽

Contrast Imaging ◽

Electron Channeling ◽

The Poor ◽

Before And After ◽

Scale Characterization

In this work, plastic deformation was locally introduced at room temperature by nanoindentation on a γ-TiAl based alloy. Comprehensive analyzes of microstructures were performed before and after deformation. In particular, the Burgers vectors, the line directions and the mechanical twinning systems were studied via accurate electron channeling contrast imaging. Accommodation of the deformation are reported and a scenario is proposed. All features help to explain the poor ductility of the TiAl based alloys at room temperature.

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A Dislocation-Scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl alloy

10.20944/preprints201801.0183.v1 ◽

2018 ◽

Author(s):

Antoine Guitton ◽

Hana Kriaa ◽

Emmanuel Bouzy ◽

Julien Guyon ◽

Nabila Maloufi

Keyword(s):

Plastic Deformation ◽

Room Temperature ◽

Tial Alloy ◽

Mechanical Twinning ◽

Contrast Imaging ◽

Electron Channeling ◽

The Poor ◽

Before And After ◽

Scale Characterization

In this work, plastic deformation was locally introduced at room temperature by nanoindentation on a γ-TiAl based alloy. Comprehensive analyzes of microstructures were performed before and after deformation. In particular, the Burgers vectors, the line directions and the mechanical twinning systems were studied via accurate electron channeling contrast imaging. Accommodation of the deformation are reported and a scenario is proposed. All features help to explain the poor ductility of the TiAl based alloys at room temperature.

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