Microscale Characterization of Deformation Defects in Bulk Intermetallics Alloys Using Electron Channeling Contrast Imaging

2003 ◽  
Vol 426-432 ◽  
pp. 1885-1890
Author(s):  
M.A. Crimp ◽  
B.A. Simkin ◽  
B.-C. Ng ◽  
D.E. Mason ◽  
Thomas R. Bieler
Keyword(s):  
Contrast Imaging ◽  
Electron Channeling ◽  
Deformation Defects

Electron Channeling Contrast Imaging for Beyond Silicon Materials Characterization

2018 ◽  
Author(s):  
Libor Strakos ◽  
Ondrej Machek ◽  
Tomas Vystavel ◽  
Andreas Schulze ◽  
Han Han ◽  
...  
Keyword(s):  
Lattice Mismatch ◽  
Defect Density ◽  
Analytical Techniques ◽  
Device Performance ◽  
Contrast Imaging ◽  
Large Area ◽  
Electron Channeling ◽  
Silicon Materials ◽  
Non Destructive

Abstract As semiconductor devices continue to shrink, novel materials (e.g. (Si)Ge, III/V) are being tested and incorporated to boost device performance. Such materials are difficult to grow on Si wafers without forming crystalline defects due to lattice mismatch. Such defects can decrease or compromise device performance. For this reason, non-destructive, high throughput and reliable analytical techniques are required. In this paper Electron Channeling Contrast Imaging (ECCI), large area mapping and defect detection using deep learning are combined in an analytical workflow for the characterization of the defectivity of “beyond Silicon” materials. Such a workflow addresses the requirements for large areas 10-4 cm2 with defect density down to 104 cm-2.

Rapid characterization of extended defects in III–V/Si by electron channeling contrast imaging

2014 ◽  
Author(s):  
Santino D. Carnevale ◽  
Julia I. Deitz ◽  
John A. Carlin ◽  
Yoosuf N. Picard ◽  
Marc De Graef ◽  
...  
Keyword(s):  
Extended Defects ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Rapid Characterization

Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction

2016 ◽  
Vol 22 (5) ◽  
pp. 997-1006 ◽  
Author(s):  
Mahrokh Dorri ◽  
Stéphane Turgeon ◽  
Nicolas Brodusch ◽  
Maxime Cloutier ◽  
Pascale Chevallier ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Oxide Layer ◽  
316L Stainless Steel ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Amorphous Oxide ◽  
Electron Channeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractCharacterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.

scholarly journals A Dislocation-scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl Alloy

2018 ◽  
Author(s):  
Antoine Guitton ◽  
Hana Kriaa ◽  
Emmanuel Bouzy ◽  
Julien Guyon ◽  
Nabila Maloufi
Keyword(s):  
Plastic Deformation ◽  
Room Temperature ◽  
Tial Alloy ◽  
Mechanical Twinning ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
The Poor ◽  
Before And After ◽  
Scale Characterization

In this work, plastic deformation was locally introduced at room temperature by nanoindentation on a γ-TiAl based alloy. Comprehensive analyzes of microstructures were performed before and after deformation. In particular, the Burgers vectors, the line directions and the mechanical twinning systems were studied via accurate electron channeling contrast imaging. Accommodation of the deformation are reported and a scenario is proposed. All features help to explain the poor ductility of the TiAl based alloys at room temperature.

scholarly journals A Dislocation-Scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl alloy

2018 ◽  
Author(s):  
Antoine Guitton ◽  
Hana Kriaa ◽  
Emmanuel Bouzy ◽  
Julien Guyon ◽  
Nabila Maloufi
Keyword(s):  
Plastic Deformation ◽  
Room Temperature ◽  
Tial Alloy ◽  
Mechanical Twinning ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
The Poor ◽  
Before And After ◽  
Scale Characterization

In this work, plastic deformation was locally introduced at room temperature by nanoindentation on a γ-TiAl based alloy. Comprehensive analyzes of microstructures were performed before and after deformation. In particular, the Burgers vectors, the line directions and the mechanical twinning systems were studied via accurate electron channeling contrast imaging. Accommodation of the deformation are reported and a scenario is proposed. All features help to explain the poor ductility of the TiAl based alloys at room temperature.

scholarly journals Modeling Dislocation Contrasts Obtained by Accurate-Electron Channeling Contrast Imaging for Characterizing Deformation Mechanisms in Bulk Materials

2019 ◽  
Author(s):  
Hana Kriaa ◽  
Antoine Guitton ◽  
Nabila Maloufi
Keyword(s):  
Materials Science ◽  
Incident Beam ◽  
Sample Surface ◽  
Diffraction Theory ◽  
Contrast Imaging ◽  
Black Line ◽  
Electron Channeling ◽  
Theoretical Predictions ◽  
Deformation Defects ◽  
First Time

Electron Channeling Contrast Imaging (ECCI) is becoming a powerful tool in Materials Science for characterizing deformation defects. Dislocations observed by ECCI in Scanning Electron Microscope, exhibit several features depending on the crystal orientation relative to the incident beam (white/black line on a dark/bright background). In order to bring new insights concerning these contrasts, we report an original theoretical approach based on the dynamical diffraction theory. Our calculations led, for the first time, to an explicit formulation of the backscattered intensity as a function of various physical and practical parameters governing the experiment. Intensity profiles are modeled for dislocations parallel to the sample surface for different channeling conditions. All theoretical predictions are consistent with experimental results.

scholarly journals Applications of Electron Channeling Contrast Imaging for the Rapid Characterization of Extended Defects in III–V/Si Heterostructures

2015 ◽  
Vol 5 (2) ◽  
pp. 676-682 ◽  
Author(s):  
Santino D. Carnevale ◽  
Julia I. Deitz ◽  
John A. Carlin ◽  
Yoosuf N. Picard ◽  
David W. McComb ◽  
...  
Keyword(s):  
Extended Defects ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Rapid Characterization

scholarly journals Modeling Dislocation Contrasts Obtained by Accurate-Electron Channeling Contrast Imaging for Characterizing Deformation Mechanisms in Bulk Materials

Materials ◽  
2019 ◽  
Vol 12 (10) ◽  
pp. 1587 ◽  
Author(s):  
Hana KRIAA ◽  
Antoine GUITTON ◽  
Nabila MALOUFI
Keyword(s):  
Materials Science ◽  
Incident Beam ◽  
Sample Surface ◽  
Diffraction Theory ◽  
Contrast Imaging ◽  
Black Line ◽  
Electron Channeling ◽  
Theoretical Predictions ◽  
Deformation Defects ◽  
First Time

Electron Channeling Contrast Imaging (ECCI) is becoming a powerful tool in materials science for characterizing deformation defects. Dislocations observed by ECCI in scanning electron microscope exhibit several features depending on the crystal orientation relative to the incident beam (white/black line on a dark/bright background). In order to bring new insights concerning these contrasts, we report an original theoretical approach based on the dynamical diffraction theory. Our calculations led, for the first time, to an explicit formulation of the back-scattered intensity as a function of various physical and practical parameters governing the experiment. Intensity profiles are modeled for dislocations parallel to the sample surface for different channeling conditions. All theoretical predictions are consistent with experimental results.

Characterization of Dislocation Contrast in deformed steels with BCC structure by Electron Channeling Contrast Imaging Method

2012 ◽  
Vol 18 (S2) ◽  
pp. 688-689
Author(s):  
M. Sugiyama ◽  
G. Shigesato ◽  
Y. Shinohara
Keyword(s):  
Imaging Method ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Bcc Structure

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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