scholarly journals A Dislocation-Scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl alloy

2018 ◽  
Author(s):  
Antoine Guitton ◽  
Hana Kriaa ◽  
Emmanuel Bouzy ◽  
Julien Guyon ◽  
Nabila Maloufi
Keyword(s):  
Plastic Deformation ◽  
Room Temperature ◽  
Tial Alloy ◽  
Mechanical Twinning ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
The Poor ◽  
Before And After ◽  
Scale Characterization

In this work, plastic deformation was locally introduced at room temperature by nanoindentation on a γ-TiAl based alloy. Comprehensive analyzes of microstructures were performed before and after deformation. In particular, the Burgers vectors, the line directions and the mechanical twinning systems were studied via accurate electron channeling contrast imaging. Accommodation of the deformation are reported and a scenario is proposed. All features help to explain the poor ductility of the TiAl based alloys at room temperature.

scholarly journals A Dislocation-scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl Alloy

2018 ◽  
Author(s):  
Antoine Guitton ◽  
Hana Kriaa ◽  
Emmanuel Bouzy ◽  
Julien Guyon ◽  
Nabila Maloufi
Keyword(s):  
Plastic Deformation ◽  
Room Temperature ◽  
Tial Alloy ◽  
Mechanical Twinning ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
The Poor ◽  
Before And After ◽  
Scale Characterization

In this work, plastic deformation was locally introduced at room temperature by nanoindentation on a γ-TiAl based alloy. Comprehensive analyzes of microstructures were performed before and after deformation. In particular, the Burgers vectors, the line directions and the mechanical twinning systems were studied via accurate electron channeling contrast imaging. Accommodation of the deformation are reported and a scenario is proposed. All features help to explain the poor ductility of the TiAl based alloys at room temperature.

scholarly journals STUDI KARAKTERISTIK MATERIAL STEM SEPEDA UNTUK PENGEMBANGAN PROTOTIPE STEM SEPEDA BERBASIS LIMBAH PISTON DENGAN VARIASI TEMPERATUR CETAKAN

2018 ◽  
Vol 4 (2) ◽  
Author(s):  
Cecep Suganda ◽  
Edi Sutoyo ◽  
Dwi Yuliaji
Keyword(s):  
Room Temperature ◽  
Hardness Test ◽  
Mold Temperature ◽  
Material Characteristic ◽  
Micro Structure ◽  
Average Hardness ◽  
Before And After ◽  
Characteristic Values ◽  
Hardness Values

<p>Bicycle stem is the link between handlebar (handlebar) with steerer tube (fork). Stem one of the bike parts to<br />note and Each type of bike is different for the size and specifications stemnya. This research aims to. Obtained<br />characterization of alumunium casting material as a material for making stem bikes with casting temperature of<br />700 ° C, and temperature variations of room temperature (30 ° C), 100 ° C, 150 ° C, 200 ° C, and characteristic<br />hardness values stem between piston waste material and stem. The piston waste is melted at the melting<br />furnace at a temperature of 700 ° C. then cast into the mold. After obtaining the specimen and then testing the<br />material characteristics include chemical composition, microstructure, and hardness. The result of the research<br />after casting with variation of the molded temperture has different material characteristic values, ie: chemical<br />composition which has no change before and after casting, the microt structure has little porous defect, and the<br />hardness value where the higher the mold temperature the lower the hardness . Conclusions of data processing<br />The highest value of piston recycled hardness is 93 HV when compared to the hardness of 61.2 HV stem bike<br />material, the hardness is more than enough and from the composition test there is a difference of Si 12%<br />composition. Result of micro structure at foundry with 4 variation still have defect of cast (porous and<br />shrinkage). the stam bike hardness test has an average hardness value of 64.2 HV whereas for the hardness<br />value of piston waste casting results show the hardness value of 91 HV with mold temperature 30 ° C, 93 HV<br />with mold temperture 100 ° C, 89 HV with mold temperature 150 ° C, 87 HV with mold temperature 200 ° C. The<br />higher the mold temperature, the lower the hardness of the material.</p>

Electron Channeling Contrast Imaging for Beyond Silicon Materials Characterization

2018 ◽  
Author(s):  
Libor Strakos ◽  
Ondrej Machek ◽  
Tomas Vystavel ◽  
Andreas Schulze ◽  
Han Han ◽  
...  
Keyword(s):  
Lattice Mismatch ◽  
Defect Density ◽  
Analytical Techniques ◽  
Device Performance ◽  
Contrast Imaging ◽  
Large Area ◽  
Electron Channeling ◽  
Silicon Materials ◽  
Non Destructive

Abstract As semiconductor devices continue to shrink, novel materials (e.g. (Si)Ge, III/V) are being tested and incorporated to boost device performance. Such materials are difficult to grow on Si wafers without forming crystalline defects due to lattice mismatch. Such defects can decrease or compromise device performance. For this reason, non-destructive, high throughput and reliable analytical techniques are required. In this paper Electron Channeling Contrast Imaging (ECCI), large area mapping and defect detection using deep learning are combined in an analytical workflow for the characterization of the defectivity of “beyond Silicon” materials. Such a workflow addresses the requirements for large areas 10-4 cm2 with defect density down to 104 cm-2.

Preparation and Properties of UV-Curable Adhesives Based on Epoxy Acrylate Prepolymers

2011 ◽  
Vol 418-420 ◽  
pp. 1444-1447
Author(s):  
Yi Chi Chen ◽  
Tao He ◽  
Wei Yang ◽  
Li Qun Zhu ◽  
Wei Ping Li ◽  
...  
Keyword(s):  
Room Temperature ◽  
Uv Curing ◽  
Gel Permeation Chromatography ◽  
Epoxy Acrylate ◽  
Uv Curable ◽  
Gel Permeation ◽  
Before And After ◽  
Thermal Stability Of ◽  
Different Molecular Weight

Three kinds of commercially available epoxy acrylate reactive prepolymers with different molecular weight (MW) were used to formulate the UV-curable adhesives by addition of photo-initiator, reactive diluent, crosslinker and other additives as necessary. The MW of the said prepolymers were measured by gel permeation chromatography (GPC), while the structural characterization of the prepolymers before and after UV-curing was made by FTIR. Thermal stability of two kinds of UV-cured prepolymers with distinct MW and MW distribution was detected by thermogravimetric (TG) analysis.Lap shear strength of the adherents at different temperature were tested and compared with a known superior UV-curable adhesive (Loctite 3493). Adhesion strength of the adhesives at room temperature were all higher than 15 MPa which were more than the reported riveting intensity (10.3 MPa).

Microscale Characterization of Deformation Defects in Bulk Intermetallics Alloys Using Electron Channeling Contrast Imaging

2003 ◽  
Vol 426-432 ◽  
pp. 1885-1890
Author(s):  
M.A. Crimp ◽  
B.A. Simkin ◽  
B.-C. Ng ◽  
D.E. Mason ◽  
Thomas R. Bieler
Keyword(s):  
Contrast Imaging ◽  
Electron Channeling ◽  
Deformation Defects

Direct Atomic Scale Characterization of Interfaces and Doping Layers in Field-Effect Transistors.

2000 ◽  
Vol 6 (S2) ◽  
pp. 140-141
Author(s):  
Teya Topuria ◽  
Edward M. James ◽  
Nigel D. Browning ◽  
Zhiyong Ma
Keyword(s):  
Field Effect Transistors ◽  
Semiconductor Devices ◽  
Atomic Scale ◽  
Contrast Imaging ◽  
Critical Dimensions ◽  
Device Structures ◽  
Small Device ◽  
Scale Characterization ◽  
Dopant Redistribution

The demand for the higher performance of semiconductor devices, for instance IC functionality, has stimulated industry to further scale the critical dimensions of the semiconductor devices [6]. Also, as parasitic capacitances are reduced in small device structures, the energy loss in these devices is consequently reduced. [1] Achieving the desired performance from such reduced device structures requires optimization of both the interface properties and dopant redistribution processes, such as diffusion and segregation, under various processing conditions. Only through a careful and accurate characterization of these properties on the atomic scale in the electron microscope we can achieve the understanding of the materials interactions during processing necessary to optimize these properties [2].Conventional imaging and microanalysis techniques in transmission electron microscopy (TEM), such as phase contrast imaging and energy dispersive X-ray spectroscopy (EDS), lack either the spatial resolution or require extensive simulations and through focal series reconstructions to reveal the structure and composition of such interfaces/doping layers (and in the case of simulations may still not give a unique solution).

Deformation Twinning, Slip, Martensite Formation and Crack Inhibition in the B2-Type Zr50Pd35Ru15 Alloy

1991 ◽  
Vol 246 ◽  
Author(s):  
R.M. Waterstrat ◽  
L.A. Bendersky ◽  
R. Kuentzler
Keyword(s):  
Crystal Structure ◽  
Plastic Deformation ◽  
Room Temperature ◽  
Deformation Mode ◽  
Deformation Twinning ◽  
Mechanical Twinning ◽  
Dislocation Slip ◽  
Slip Mode ◽  
Martensite Formation ◽  
Additional Mode

AbstractEnhanced room temperature toughness of the Zr50Pd35Ru15B2 phase alloy was found to be a result of the activation of an additional deformation mode besides the b=[001] dislocation slip mode - {114}-type mechanical twinning. The twinning is a true one, i.e. there is no change in the ordered crystal structure. Another additional mode of plastic deformation, expected for more Pd rich alloys, is the formation of stress-induced martensite. The martensite was found to have a CrBtype structure.

Rapid characterization of extended defects in III–V/Si by electron channeling contrast imaging

2014 ◽  
Author(s):  
Santino D. Carnevale ◽  
Julia I. Deitz ◽  
John A. Carlin ◽  
Yoosuf N. Picard ◽  
Marc De Graef ◽  
...  
Keyword(s):  
Extended Defects ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Rapid Characterization

Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction

2016 ◽  
Vol 22 (5) ◽  
pp. 997-1006 ◽  
Author(s):  
Mahrokh Dorri ◽  
Stéphane Turgeon ◽  
Nicolas Brodusch ◽  
Maxime Cloutier ◽  
Pascale Chevallier ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Oxide Layer ◽  
316L Stainless Steel ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Amorphous Oxide ◽  
Electron Channeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractCharacterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.

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