scholarly journals Specimen Preparation for Condoms

2007 ◽  
Vol 15 (5) ◽  
pp. 40-41 ◽  
Author(s):  
Gan Phay Fang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Polymer Material ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Sem Imaging ◽  
Preparation Techniques ◽  
Scanning Electron

Specimen preparation techniques for Scanning Electron Microscope (SEM) imaging of condoms as reported by Rosenzweig et al revealed a variety of artifacts. The artifacts were classified as ridging, cracking and melting. The purpose of this article is to introduce a simple specimen preparation technique for condoms to be evaluated via SEM without any surface artifacts. This technique involves the use of two chrome washers to sandwich the condom. The sandwiched condom specimen is then subjected to coating before mounting on an aluminium stub. The execution of this technique requires patience and practice so as not to damage the condom. The method may be applied to any similar polymer material.

Comparison of freeze-fractured yeast replicas using conventional TEM and low-voltage field-emission SEM

1989 ◽  
Vol 47 ◽  
pp. 74-75
Author(s):  
William P. Wergin ◽  
Eric F. Erbe ◽  
Terrence W. Reilly
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Voltage ◽  
Objective Lens ◽  
Specimen Preparation ◽  
Lens System ◽  
Air Drying ◽  
Preparation Techniques ◽  
Scanning Electron

Although the first commercial scanning electron microscope (SEM) was introduced in 1965, the limited resolution and the lack of preparation techniques initially confined biological observations to relatively low magnification images showing anatomical surface features of samples that withstood the artifacts associated with air drying. As the design of instrumentation improved and the techniques for specimen preparation developed, the SEM allowed biologists to gain additional insights not only on the external features of samples but on the internal structure of tissues as well. By 1985, the resolution of the conventional SEM had reached 3 - 5 nm; however most biological samples still required a conductive coating of 20 - 30 nm that prevented investigators from approaching the level of information that was available with various TEM techniques. Recently, a new SEM design combined a condenser-objective lens system with a field emission electron source.

The ionic strength dependence of chromatin folding

1978 ◽  
Vol 36 (2) ◽  
pp. 220-221
Author(s):  
F. Thoma ◽  
TH. Koller
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Ionic Strength ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Carbon Supports ◽  
Ionic Strength Dependence ◽  
Chromatin Folding ◽  
Strength Dependence ◽  
Preparation Techniques

Under a variety of electron microscope specimen preparation techniques different forms of chromatin appearance can be distinguished: beads-on-a-string, a 100 Å nucleofilament, a 250 Å fiber and a compact 300 to 500 Å fiber.Using a standardized specimen preparation technique we wanted to find out whether there is any relation between these different forms of chromatin or not. We show that with increasing ionic strength a chromatin fiber consisting of a row of nucleo- somes progressively folds up into a solenoid-like structure with a diameter of about 300 Å.For the preparation of chromatin for electron microscopy the avoidance of stretching artifacts during adsorption to the carbon supports is of utmost importance. The samples are fixed with 0.1% glutaraldehyde at 4°C for at least 12 hrs. The material was usually examined between 24 and 48 hrs after the onset of fixation.

A Biological Cryosystem for the Scanning Electron Microscope

1990 ◽  
Vol 48 (1) ◽  
pp. 414-415
Author(s):  
Zhang zhaohua ◽  
Luo Dong ◽  
Guo Yisong
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Natural State ◽  
Specimen Preparation ◽  
Cold Stage ◽  
Specimen Temperature ◽  
Successful Design ◽  
Scanning Electron

Since early 1970's the use of cold stage on SEM for observation of hydrated samples in their natural state has become more and more popular despite its high cost. Experiences gained from earlier experiments indicate that a successful design should incorporate thefollowing features:1. The specimen temperature should be below −135°C (the recrystallization point of water), lower the temperature, better the results.2. The frozen specimen, the cold block in the specimen preparation chamber, as well as the cold stage should be kept under vacuum at all times to keep them frost free.3. Different specimen preparation processes such as fracturing, coating and sublimation should be possible in one compact preparation chamber .

A preparation technique for examination of wet-spun polymer fibers in a scanning electron microscope

1975 ◽  
Vol 253 (7) ◽  
pp. 521-526 ◽  
Author(s):  
D. M. Koenhen ◽  
M. A. de Jongh ◽  
C. A. Smolders ◽  
N. Yücesoy
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Polymer Fibers ◽  
Preparation Technique ◽  
Scanning Electron

X-Ray Mapping with Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry in the Scanning Electron Microscope: a Tutorial

1999 ◽  
Vol 5 (S2) ◽  
pp. 518-519
Author(s):  
Dale E. Newbury ◽  
David S. Bright
Keyword(s):  
Image Processing ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Recording System ◽  
X Ray ◽  
On Line ◽  
Current Electron ◽  
Sem Imaging ◽  
Display Systems ◽  
Scanning Electron

X-ray mapping is one of the most popular modes for displaying information obtained with x-ray spectrometry performed in the scanning electron microscope. This popularity arises from the ready accessibility and apparent simplicity of information presented in a pictorial fashion, especially when used in conjunction with other SEM imaging modes, such as backscattered, secondary, and specimen current electron images. Further, the rise of powerful, inexpensive computer systems capable of image processing and display has given the analyst a dedicated, on-line tool with the capacity and flexibility needed for problem solving. Figure 1 shows a typical example of mapping. Although the interpretation of x-ray images obtained with a modern digital control and recording system would seem to be straightforward and relatively trivial, there are significant pitfalls and limitations that can easily fool the unwary. In Figure 1, within an individual x-ray map, the observer can reasonably judge where the concentration is lower or higher, at least for a group of contiguous pixels. Can such judgments be made among a set of maps of the same region for different elements, or even for the same element from different regions of the same specimen? With current x-ray processing and display systems, the answers are generally no. In fact, problems that can influence interpretation can arise at each stage of x-ray generation/emission, x-ray spectral collection, processing, and display.

scholarly journals Scanning electron microscope (SEM) imaging and analysis of magnetic minerals of lake Diatas peatland section DD REP B 693

2020 ◽  
Vol 1481 ◽  
pp. 012025
Author(s):  
Nur Aisyah ◽  
Hamdi Rifai ◽  
Caroline Bouvet De La Maisonneuve ◽  
Jeffrey Oalmann ◽  
Francesca Forni ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Magnetic Minerals ◽  
Sem Imaging ◽  
Scanning Electron

Microdiffraction phase identification in the scanning electron microscope (SEM)

2004 ◽  
Vol 19 (2) ◽  
pp. 100-103 ◽  
Author(s):  
R. P. Goehner ◽  
J. R. Michael
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Beam Current ◽  
Electron Diffraction Data ◽  
Specimen Preparation ◽  
Phase Identification ◽  
Electron Backscattered Diffraction ◽  
Backscattered Electron ◽  
Ccd Detectors ◽  
Scanning Electron

The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.

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