Residual stress measurement on the I12 JEEP beamline at Diamond Light Source

2010 ◽  
Vol 1 (SRMS-7) ◽  
Author(s):  
A. M. Korsunsky ◽  
X. Song ◽  
F. Hofmann ◽  
B. Abbey ◽  
M. Xie ◽  
...  
Keyword(s):  
Light Source ◽  
Stress Measurement ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hexagonal Close Packed ◽  
Loading Direction ◽  
Diffraction Patterns ◽  
Set Up ◽  
Energy Dispersive Diffraction

One of the multiple capabilities of the new Joint Engineering, Environmental and Processing (JEEP) beamline I12 at Diamond Light Source is the set-up for polychromatic high-energy X-ray diffraction for the study of polycrystalline deformation and residual stresses. The results and interpretation of the first experiments carried out on JEEP are reported. Energy dispersive diffraction patterns from titanium alloy Ti-6Al-4V were collected using the new 23-cell ‘horseshoe’ detector and interpreted using Pawley refinement to determine the residual elastic strains at the macro- and meso-scale. It provides a clear demonstration of the tensile-compressive hardening asymmetry of the hexagonal close-packed grains oriented with the basal plane perpendicular to the loading direction.

In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction

2009 ◽  
Vol 615-617 ◽  
pp. 23-26 ◽  
Author(s):  
Peter J. Wellmann ◽  
Katja Konias ◽  
Philip Hens ◽  
Rainer Hock ◽  
Andreas Magerl
Keyword(s):  
Signal To Noise Ratio ◽  
High Energy ◽  
In Situ Observation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bulk Growth ◽  
Diffraction Patterns ◽  
Set Up ◽  
Good Signal

This work reports on the in-situ observation of a polytype switch during physical vapor transport (PVT) growth of bulk SiC crystals by x-ray diffraction. A standard PVT reactor for 2” and 3” bulk growth was set up in a high-energy x-ray diffraction lab. Due to the high penetration depth of the high-energy x-ray beam no modification of the PVT reactor was necessary in order to measure Laue diffraction patterns of the growing crystal with good signal to noise ratio. We report for the first time upon the in-situ observation of polytype switching during SiC bulk PVT growth.

Evaluation of Freezing Methods by Low Temperature X-Ray Diffraction

1977 ◽  
Vol 35 ◽  
pp. 330-333
Author(s):  
T. Gulik-Krzywicki ◽  
M.J. Costello
Keyword(s):  
Biological Materials ◽  
Molecular Organization ◽  
X Ray Diffraction ◽  
Glass Capillary ◽  
X Ray ◽  
Rate Dependent ◽  
Before And After ◽  
Freeze Etching ◽  
Diffraction Patterns ◽  
Set Up

Freeze-etching electron microscopy is currently one of the best methods for studying molecular organization of biological materials. Its application, however, is still limited by our imprecise knowledge about the perturbations of the original organization which may occur during quenching and fracturing of the samples and during the replication of fractured surfaces. Although it is well known that the preservation of the molecular organization of biological materials is critically dependent on the rate of freezing of the samples, little information is presently available concerning the nature and the extent of freezing-rate dependent perturbations of the original organizations. In order to obtain this information, we have developed a method based on the comparison of x-ray diffraction patterns of samples before and after freezing, prior to fracturing and replication.Our experimental set-up is shown in Fig. 1. The sample to be quenched is placed on its holder which is then mounted on a small metal holder (O) fixed on a glass capillary (p), whose position is controlled by a micromanipulator.

Shock Wave Compression of NaCl Single Crystals observed by Flash-X-Ray Diffraction

1978 ◽  
Vol 33 (8) ◽  
pp. 918-923 ◽  
Author(s):  
F. Müller ◽  
E. Schulte
Keyword(s):  
Shock Wave ◽  
Single Crystals ◽  
Observation Time ◽  
Plane Shock ◽  
X Ray Diffraction ◽  
X Ray ◽  
Wave Compression ◽  
Shock Wave Compression ◽  
Diffraction Patterns ◽  
Set Up

Flash-x-ray-diffraction patterns (FXD) with an exposure time of 4 ns of NaCl single crystals compressed by plane shock waves are obtained at pressures of about 30 kbar. From the diffraction patterns the compression is determined and compared with Hugoniot data. During shock load the lattice shows an uniaxial compression. While in case of measurements at the free surface an observation time of only a few nanoseconds is available, this experimental set-up allows an observation time of two microseconds.

Molecular Beam Epitaxial Growth of Nonpolar a-plane InN/ GaN Heterostructures

2012 ◽  
Vol 1396 ◽  
Author(s):  
Mohana K. Rajpalke ◽  
Thirumaleshwara N. Bhat ◽  
Basanta Roul ◽  
Mahesh Kumar ◽  
S. B. Krupanidhi
Keyword(s):  
Schottky Barrier ◽  
Molecular Beam ◽  
Schottky Barrier Height ◽  
High Energy ◽  
Scanning Electron Micrographs ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Beam Epitaxial ◽  
Diffraction Patterns ◽  
Molecular Beam Epitaxial Growth

ABSTRACTNonpolar a-plane InN/GaN heterostructures were grown by plasma assisted molecular beam epitaxy. The growth of nonpolar a- plane InN / GaN heterostructures were confirmed by high resolution x-ray diffraction study. Reflection high energy electron diffraction patterns show the reasonably smooth surface of a-plane GaN and island-like growth for nonpolar a-plane InN film, which is further confirmed by scanning electron micrographs. An absorption edge in the optical spectra has the energy of 0.74 eV, showing blueshifts from the fundamental band gap of 0.7 eV. The rectifying behavior of the I-V curve indicates the existence of Schottky barrier at the InN and GaN interface. The Schottky barrier height (φb) and the ideality factor (η) for the InN/GaN heterostructures found to be 0.58 eV and 2.05 respectively.

High Density Bulk Shape Rapid Consolidation of the Yba2Cu307-X Superconductor

1989 ◽  
Vol 169 ◽  
Author(s):  
S. V. Rele ◽  
R. V. Raman ◽  
H. S. Meeks ◽  
R. L. Anderson ◽  
R. N. Shelton ◽  
...  
Keyword(s):  
Volume Fraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Superconducting Volume Fraction ◽  
One Step ◽  
Hollow Cylinders ◽  
Diffraction Patterns ◽  
Set Up ◽  
Cylinders And Spheres ◽  
High Processing

AbstractA novel rapid densification technique for fabrication of bulk shape YBa2Cu307–xsuperconductor is presented. The Ceracon process is a one‐step, quasi‐isostatic consolidation route utilizing conventional P/M equipment and set‐up. The Ceracon technology has enabled successful fabrication of bulk, shapes such as discs, cylinders, hollow cylinders and spheres along with significant increases in the density up to 95‐98% of the theorertical. The superconducting volume fraction is preserved due to short hold times at the operating temperatures and avoidance of high processing temperatures. Results based on densities, microstructure, susceptibility measurements, X‐ray diffraction patterns and TGA measurements are discussed.

scholarly journals Three-dimensional α colony characterization and prior-β grain reconstruction of a lamellar Ti–6Al–4V specimen using near-field high-energy X-ray diffraction microscopy

2015 ◽  
Vol 48 (4) ◽  
pp. 1165-1171 ◽  
Author(s):  
E. Wielewski ◽  
D. B. Menasche ◽  
P. G. Callahan ◽  
R. M. Suter
Keyword(s):  
Near Field ◽  
Three Dimensional ◽  
High Energy ◽  
Grain Structure ◽  
X Ray Diffraction ◽  
Orientation Field ◽  
X Ray ◽  
Hexagonal Close Packed ◽  
Flood Fill ◽  
Diffraction Microscopy

Near-field high-energy X-ray diffraction microscopy has been used to characterize the three-dimensional (3-D) crystallographic orientation field of the hexagonal close-packed α phase in a bulk Ti–6Al–4V specimen with a lamellar (β-annealed) microstructure. These data have been segmented using a 3-D misorientation-based grain finding algorithm, providing unprecedented information about the complex 3-D morphologies and spatial misorientation distributions of the transformed α lamella colonies. A 3-D Burgers orientation relationship-based flood-fill algorithm has been implemented to reconstruct the morphologies and crystallographic orientations of the high-temperature body-centered cubic prior-β grains. The combination of these data has been used to gain an understanding of the role of the prior-β grain structure in the formation of specific morphologies and spatial misorientation distributions observed in the transformed α colony structures. It is hoped that this understanding can be used to develop transformation structures optimized for specific applications and to produce more physically realistic synthetic microstructures for use in simulations.

X-Ray Diffraction Patterns in High-Energy Proton Implanted Silicon

1998 ◽  
Vol 168 (1) ◽  
pp. 11-25 ◽  
Author(s):  
K. Wieteska ◽  
W. Wierzchowski ◽  
W. Graeff ◽  
K. D. Dłużewska
Keyword(s):  
High Energy ◽  
X Ray Diffraction ◽  
High Energy Proton ◽  
X Ray ◽  
Energy Proton ◽  
Diffraction Patterns
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