Persistence of Ferroelectricity Close to Unit-Cell Thickness in Structurally Disordered Aurivillius Phases

2020 ◽  
Vol 32 (24) ◽  
pp. 10511-10523
Author(s):  
Lynette Keeney ◽  
Zineb Saghi ◽  
Marita O’Sullivan ◽  
Jonathan Alaria ◽  
Michael Schmidt ◽  
...  
1996 ◽  
Vol 35 (Part 2, No. 3B) ◽  
pp. L387-L390 ◽  
Author(s):  
Jonghun You ◽  
Masatsugu Kaise ◽  
Kazuo Saito

2001 ◽  
Vol 688 ◽  
Author(s):  
Yasuo Cho ◽  
Koya Ohara

AbstractA higher order nonlinear dielectric microscopy technique with higher lateral and depth resolution than conventional nonlinear dielectric imaging is investigated. The proposed technique involves the measurement of higher order nonlinear dielectric constants, with a depth resolution of down to 1.5 nm. The technique is demonstrated to be very useful for observing surface layers of the order of unit cell thickness on ferroelectric materials.


2014 ◽  
Vol 5 (1) ◽  
Author(s):  
Da Jiang ◽  
Tao Hu ◽  
Lixing You ◽  
Qiao Li ◽  
Ang Li ◽  
...  

2016 ◽  
Vol 108 (5) ◽  
pp. 053107 ◽  
Author(s):  
Di Wang ◽  
Jing-Ning Li ◽  
Yu Zhou ◽  
Di-Hu Xu ◽  
Xiang Xiong ◽  
...  

2020 ◽  
Vol 3 (5) ◽  
pp. 4826-4836 ◽  
Author(s):  
Hang Gao ◽  
Wenjie Feng ◽  
Huiwen Liu ◽  
Shuwei Liu ◽  
Zidong Wang ◽  
...  

ACS Catalysis ◽  
2011 ◽  
Vol 1 (8) ◽  
pp. 901-907 ◽  
Author(s):  
Kyungsu Na ◽  
Changbum Jo ◽  
Jaeheon Kim ◽  
Wha-Seung Ahn ◽  
Ryong Ryoo

2011 ◽  
Vol 695 ◽  
pp. 598-601
Author(s):  
Gasidit Panomsuwan ◽  
Nagahiro Saito ◽  
Osamu Takai

Superlattice structure of SrTiO3and Nb-doped SrTiO3have been epitaxially grown on atomically flat surface of LaAlO3substrates by ion beam deposition method. Epitaxial superlattices were grown at 800 °C in the presence of partial oxygen pressure under optimizing growth conditions. The Nb-doped SrTiO3layers were varied from 2 to 15 unit cell thickness approximately, while SrTiO3layers are maintained at 15 unit cell thickness with 10 periods. The superlattices with various Nb-doped SrTiO3layer thicknesses were investigated using X-ray diffractometer (XRD) and atomic force microscope (AFM), in order to clearly understand structural properties and surface structure, which are significant for fabrication of the high quality superlattice structure.


Nano Letters ◽  
2021 ◽  
Vol 21 (17) ◽  
pp. 7198-7205
Author(s):  
Hongbo Xie ◽  
Junyuan Bai ◽  
Haiyan Ren ◽  
Shanshan Li ◽  
Hucheng Pan ◽  
...  

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