scholarly journals Determination of PMMA Residues on a Chemical-Vapor-Deposited Monolayer of Graphene by Neutron Reflection and Atomic Force Microscopy

Langmuir ◽  
2018 ◽  
Vol 34 (5) ◽  
pp. 1827-1833 ◽  
Author(s):  
Ruiheng Li ◽  
Zongyi Li ◽  
Elias Pambou ◽  
Philipp Gutfreund ◽  
Thomas A. Waigh ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Vapor ◽  
Neutron Reflection ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chemical Vapor Deposited

scholarly journals Direct observation of chemical vapor deposited diamond films by atomic force microscopy

1992 ◽  
Vol 60 (13) ◽  
pp. 1567-1569 ◽  
Author(s):  
V. Baranauskas ◽  
M. Fukui ◽  
C. R. Rodrigues ◽  
N. Parizotto ◽  
V. J. Trava‐Airoldi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Diamond Films ◽  
Chemical Vapor ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chemical Vapor Deposited
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