Diminished Trap-Induced Leakage Current at the Organic/Electrode Interface for High-Performance Organic Photodetectors

Author(s):  
Huan Cao ◽  
Yichuan Si ◽  
Yuan Xie ◽  
Jingwen Li ◽  
Guanghong Liu ◽  
...  
Author(s):  
Kathryn Holguin ◽  
Motahareh Mohammadiroudbari ◽  
Kaiqiang Qin ◽  
Chao Luo

Na-ion batteries (NIBs) are promising alternatives to Li-ion batteries (LIBs) due to the low cost, abundance, and high sustainability of sodium resources. However, the high performance of inorganic electrode materials...


2013 ◽  
Vol 1538 ◽  
pp. 291-302
Author(s):  
Edward Yi Chang ◽  
Hai-Dang Trinh ◽  
Yueh-Chin Lin ◽  
Hiroshi Iwai ◽  
Yen-Ku Lin

ABSTRACTIII-V compounds such as InGaAs, InAs, InSb have great potential for future low power high speed devices (such as MOSFETs, QWFETs, TFETs and NWFETs) application due to their high carrier mobility and drift velocity. The development of good quality high k gate oxide as well as high k/III-V interfaces is prerequisite to realize high performance working devices. Besides, the downscaling of the gate oxide into sub-nanometer while maintaining appropriate low gate leakage current is also needed. The lack of high quality III-V native oxides has obstructed the development of implementing III-V based devices on Si template. In this presentation, we will discuss our efforts to improve high k/III-V interfaces as well as high k oxide quality by using chemical cleaning methods including chemical solutions, precursors and high temperature gas treatments. The electrical properties of high k/InSb, InGaAs, InSb structures and their dependence on the thermal processes are also discussed. Finally, we will present the downscaling of the gate oxide into sub-nanometer scale while maintaining low leakage current and a good high k/III-V interface quality.


2021 ◽  
Vol 42 (2) ◽  
pp. 241-249
Author(s):  
Jian-bin WANG ◽  
◽  
Xiao-sheng TANG ◽  
Bi ZHOU ◽  
Xia-hui ZENG ◽  
...  

2021 ◽  
Vol 42 (07) ◽  
pp. 1057-1064
Author(s):  
Jian-bin WANG ◽  
◽  
Xiao-sheng TANG ◽  
Bi ZHOU ◽  
Xia-hui ZENG ◽  
...  

2022 ◽  
Vol 48 ◽  
pp. 103953
Author(s):  
Madan R. Biradar ◽  
Akshay V. Salkar ◽  
Pranay P. Morajkar ◽  
Sheshanath V. Bhosale ◽  
Sidhanath V. Bhosale

Electronics ◽  
2019 ◽  
Vol 8 (3) ◽  
pp. 312 ◽  
Author(s):  
Woo-Young Choi ◽  
Min-Kwon Yang

The conventional single-phase quasi-Z-source (QZS) inverter has a high leakage current as it is connected to the grid. To address this problem, this paper proposes a transformerless QZS inverter, which can reduce the leakage current for single-phase grid-tied applications. The proposed inverter effectively alleviates the leakage current problem by removing high-frequency components for the common-mode voltage. The operation principle of the proposed inverter is described together with its control strategy. A control scheme is presented for regulating the DC-link voltage and the grid current. A 1.0 kW prototype inverter was designed and tested to verify the performance of the proposed inverter. Silicon carbide (SiC) power devices were applied to the proposed inverter to increase the power efficiency. The experimental results showed that the proposed inverter achieved high performance for leakage current reduction and power efficiency improvement.


2013 ◽  
Vol 740-742 ◽  
pp. 801-804 ◽  
Author(s):  
Tim Behrens ◽  
Thomas Suenner ◽  
Eckart Geinitz ◽  
Andreas Schletz ◽  
Lothar Frey

While aluminum-based metallization schemes on Si have been optimized for the last decades, only few investigations have been done on copper metallization with SiC-devices. Thus, in this work the mechanical as well as the electrical interactions of this metallization system have been analyzed and optimized for SiC-devices in high reliability applications. For optimizing the adhesion of the copper metallization stack on SiC devices, different metallization schemes consisting of adhesion promoters (Ti, Cr, Al, Ta, WTi), diffusion barriers (TiN, Ta, WTi), and the final copper layer have been tested by peel-tests. For investigating the electrical interactions TLM measurements as well as leakage-current measurements have been done on copper metalized SiC samples.


2018 ◽  
Vol 6 (16) ◽  
pp. 7027-7033 ◽  
Author(s):  
Mikko Nisula ◽  
Maarit Karppinen

We demonstrate that the high-capacity organic electrode material, p-benzoquinone, is able to sustain ultrahigh redox reaction rates without any conductive additives when applied as ultrathin layers in an all-solid-state thin-film battery setup, viable for e.g. high-performance power sources in microelectronic devices.


Author(s):  
P.N. Metange ◽  
K. B. Khanchandani

<p>This paper presents the analysis and design of high performance phase frequency detector, charge pump and loop filter circuits for phase locked loop in wireless applications. The proposed phase frequency detector (PFD) consumes only 8 µW and utilises small area. Also, at 1.8V voltage supply the maximum operation frequency of the conventional PFD is 500 MHz whereas proposed PFD is 5 GHz. Hence, highly suitable for low power, high speed and low jitter applications.  The differential charge pump uses switches using NMOS and the inverter delays for up and down signals do not generate any offset due to its fully symmetric operation. This configuration doubles the range of output voltage compliance compared to single ended charge pump. Differential stage is less sensitive to the leakage current since leakage current behaves as common mode offset with the dual output stages. All the circuits are implemented using cadence 0.18 μm CMOS Process.</p>


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