Balancing the Source and Sink of Oxygen Vacancies for the Resistive Switching Memory

2018 ◽  
Vol 10 (25) ◽  
pp. 21445-21450 ◽  
Author(s):  
Tae Hyung Park ◽  
Young Jae Kwon ◽  
Hae Jin Kim ◽  
Hyo Cheon Woo ◽  
Gil Seop Kim ◽  
...  

InfoMat ◽  
2020 ◽  
Vol 2 (5) ◽  
pp. 960-967 ◽  
Author(s):  
Mengting Zhao ◽  
Xiaobing Yan ◽  
Long Ren ◽  
Mengliu Zhao ◽  
Fei Guo ◽  
...  


2009 ◽  
Vol 190 ◽  
pp. 012074 ◽  
Author(s):  
B P Andreasson ◽  
M Janousch ◽  
U Staub ◽  
G I Meijer ◽  
A Ramar ◽  
...  


2019 ◽  
Vol 5 (5) ◽  
pp. 1800833 ◽  
Author(s):  
Rulin Zhang ◽  
Hong Huang ◽  
Qing Xia ◽  
Cong Ye ◽  
Xiaodi Wei ◽  
...  


RSC Advances ◽  
2016 ◽  
Vol 6 (26) ◽  
pp. 21736-21741 ◽  
Author(s):  
Kyuhyun Park ◽  
Jang-Sik Lee

Reliable resistive switching memory devices were developed by controlling the oxygen vacancies in aluminum oxide layer during atomic layer deposition and by adopting bilayer structures.



RSC Advances ◽  
2016 ◽  
Vol 6 (59) ◽  
pp. 54113-54118 ◽  
Author(s):  
Pengfei Hou ◽  
Jinbin Wang ◽  
Xiangli Zhong ◽  
Yuexian Wu

Ferroelectric resistive switching memory is a non-destructive and easy to achieve multilevel storage, which is a breakthrough for further improving the density in the random access memory.



2020 ◽  
Vol 87 ◽  
pp. 105932 ◽  
Author(s):  
Jitendra Singh ◽  
R.G. Singh ◽  
Subodh K. Gautam ◽  
Himanshi Gupta ◽  
Fouran Singh




2021 ◽  
pp. 211-246
Author(s):  
Qazi Muhammad Saqib ◽  
Muhammad Umair Khan ◽  
Jinho Bae


Sign in / Sign up

Export Citation Format

Share Document