scholarly journals Controlling Cu Migration on Resistive Switching, Artificial Synapse, and Glucose/Saliva Detection by Using an Optimized AlOx Interfacial Layer in a-COx-Based Conductive Bridge Random Access Memory

ACS Omega ◽  
2020 ◽  
Vol 5 (12) ◽  
pp. 7032-7043
Author(s):  
Sreekanth Ginnaram ◽  
Jiantai Timothy Qiu ◽  
Siddheswar Maikap
Keyword(s):  
Resistive Switching ◽  
Interfacial Layer ◽  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Artificial Synapse ◽  
Conductive Bridge ◽  
Cu Migration

Complementary resistive switching behavior for conductive bridge random access memory

2016 ◽  
Vol 9 (6) ◽  
pp. 064201 ◽  
Author(s):  
Hao-Xuan Zheng ◽  
Ting-Chang Chang ◽  
Kuan-Chang Chang ◽  
Tsung-Ming Tsai ◽  
Chih-Cheng Shih ◽  
...  
Keyword(s):  
Resistive Switching ◽  
Random Access ◽  
Random Access Memory ◽  
Switching Behavior ◽  
Access Memory ◽  
Resistive Switching Behavior ◽  
Conductive Bridge

Atomistic study of dynamics for metallic filament growth in conductive-bridge random access memory

2015 ◽  
Vol 17 (14) ◽  
pp. 8627-8632 ◽  
Author(s):  
Shengjun Qin ◽  
Zhan Liu ◽  
Guo Zhang ◽  
Jinyu Zhang ◽  
Yaping Sun ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Resistive Switching ◽  
Kinetic Monte Carlo ◽  
Random Access ◽  
Growth Dynamics ◽  
Random Access Memory ◽  
Access Memory ◽  
Metallic Filament ◽  
Conductive Bridge ◽  
Atomistic Study

The growth dynamics for metallic filaments in conductive-bridge resistive-switching random access memory (CBRAM) are studied using the kinetic Monte Carlo (KMC) method.

Non-volatile resistive switching in CuBi-based conductive bridge random access memory device

2018 ◽  
Vol 112 (25) ◽  
pp. 253503 ◽  
Author(s):  
Sujaya Kumar Vishwanath ◽  
Hyunsuk Woo ◽  
Sanghun Jeon
Keyword(s):  
Resistive Switching ◽  
Random Access ◽  
Random Access Memory ◽  
Memory Device ◽  
Access Memory ◽  
Conductive Bridge

An Analytical Model for the Forming Process of Conductive-Bridge Resistive-Switching Random-Access Memory

2014 ◽  
Vol 61 (9) ◽  
pp. 3166-3171 ◽  
Author(s):  
Shaoli Lv ◽  
He Wang ◽  
Jinyu Zhang ◽  
Jun Liu ◽  
Lingling Sun ◽  
...  
Keyword(s):  
Analytical Model ◽  
Resistive Switching ◽  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Forming Process ◽  
Conductive Bridge

Uniformity and Retention Improvement of TaOx-Based Conductive Bridge Random Access Memory by CuSiN Interfacial Layer Engineering

2017 ◽  
Vol 38 (9) ◽  
pp. 1232-1235 ◽  
Author(s):  
Tiancheng Gong ◽  
Qing Luo ◽  
Xiaoxin Xu ◽  
Peng Yuan ◽  
Haili Ma ◽  
...  
Keyword(s):  
Interfacial Layer ◽  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Conductive Bridge
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