scholarly journals Magnetic Driven Two-Finger Micro-Hand with Soft Magnetic End-Effector for Force-Controlled Stable Manipulation in Microscale

Micromachines ◽  
2021 ◽  
Vol 12 (4) ◽  
pp. 410
Author(s):  
Dan Liu ◽  
Xiaoming Liu ◽  
Pengyun Li ◽  
Xiaoqing Tang ◽  
Masaru Kojima ◽  
...  
Keyword(s):  
Magnetic Force ◽  
Force Feedback ◽  
Soft Magnetic ◽  
End Effector ◽  
Force Microscopy ◽  
System A ◽  
Atomic Force ◽  
Afm Probe ◽  
End Effectors ◽  
Fixed End

In recent years, micromanipulators have provided the ability to interact with micro-objects in industrial and biomedical fields. However, traditional manipulators still encounter challenges in gaining the force feedback at the micro-scale. In this paper, we present a micronewton force-controlled two-finger microhand with a soft magnetic end-effector for stable grasping. In this system, a homemade electromagnet was used as the driving device to execute micro-objects manipulation. There were two soft end-effectors with diameters of 300 μm. One was a fixed end-effector that was only made of hydrogel, and the other one was a magnetic end-effector that contained a uniform mixture of polydimethylsiloxane (PDMS) and paramagnetic particles. The magnetic force on the soft magnetic end-effector was calibrated using an atomic force microscopy (AFM) probe. The performance tests demonstrated that the magnetically driven soft microhand had a grasping range of 0–260 μm, which allowed a clamping force with a resolution of 0.48 μN. The stable grasping capability of the magnetically driven soft microhand was validated by grasping different sized microbeads, transport under different velocities, and assembly of microbeads. The proposed system enables force-controlled manipulation, and we believe it has great potential in biological and industrial micromanipulation.

scholarly journals Simultaneous acquisition of current and lateral force signals during AFM for characterising the piezoelectric and triboelectric effects of ZnO nanorods

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Yijun Yang ◽  
Kwanlae Kim
Keyword(s):  
Linear Regression Analysis ◽  
Zno Nanorods ◽  
Lateral Force ◽  
Mechanical Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Simultaneous Acquisition ◽  
Afm Probe ◽  
Triboelectric Effect ◽  
Conversion Efficiencies

AbstractAtomic force microscopy (AFM) is central to investigating the piezoelectric potentials of one-dimensional nanomaterials. The AFM probe is used to deflect individual piezoelectric nanorods and to measure the resultant current. However, the torsion data of AFM probes have not been exploited to elucidate the relationship between the applied mechanical force and resultant current. In this study, the effect of the size of ZnO nanorods on the efficiency of conversion of the applied mechanical force into current was investigated by simultaneously acquiring the conductive AFM and lateral force microscopy signals. The conversion efficiency was calculated based on linear regression analysis of the scatter plot of the data. This method is suitable for determining the conversion efficiencies of all types of freestanding piezoelectric nanomaterials grown under different conditions. A pixel-wise comparison of the current and lateral force images elucidated the mechanism of current generation from dense arrays of ZnO nanorods. The current signals generated from the ZnO nanorods by the AFM probe originated from the piezoelectric and triboelectric effects. The current signals contributed by the triboelectric effect were alleviated by using an AFM probe with a smaller spring constant and reducing the normal force.

Dynamic Modeling and Simulation of Rough Cylindrical Micro/Nanoparticle Manipulation with Atomic Force Microscopy

2014 ◽  
Vol 20 (6) ◽  
pp. 1692-1707 ◽  
Author(s):  
Moharam H. Korayem ◽  
Hedieh Badkoobeh Hezaveh ◽  
Moein Taheri
Keyword(s):  
Critical Force ◽  
Cylindrical Particle ◽  
Force Microscopy ◽  
Real Area Of Contact ◽  
Atomic Force ◽  
Rough Substrate ◽  
Simulation Results ◽  
Afm Probe ◽  
Cylindrical Particles ◽  
Simulation Condition

AbstractIn this paper, the process of pushing rough cylindrical micro/nanoparticles on a surface with an atomic force microscope (AFM) probe is investigated. For this purpose, the mechanics of contact involving adhesion are studied first. Then, a method is presented for estimating the real area of contact between a rough cylindrical particle (whose surface roughness is described by the Rumpf and Rabinovich models) and a smooth surface. A dynamic model is then obtained for the pushing of rough cylindrical particles on a surface with an AFM probe. Afterwards, the process is simulated for different particle sizes and various roughness dimensions. Finally, by reducing the length of the cylindrical particle, the simulation condition is brought closer to the manipulation condition of a smooth spherical particle on a rough substrate, and the simulation results of the two cases are compared. Based on the simulation results, the critical force and time of manipulation diminish for rough particles relative to smooth ones. Reduction in the aspect ratio at a constant cross-section radius and the radius of asperities (height of asperities based on the Rabinovich model) results in an increase in critical force and time of manipulation.

AFM and Ellipsometry Studies of Ultra Thin Ti Film Deposited on a Silicon Wafer

2013 ◽  
Vol 773-774 ◽  
pp. 616-625 ◽  
Author(s):  
Bing Jing Lin ◽  
Hong Tao Zhu ◽  
A. Kiet Tieu ◽  
Gerry Triani
Keyword(s):  
Silicon Wafer ◽  
Smooth Structure ◽  
Force Microscopy ◽  
System A ◽  
Atomic Force ◽  
Combined Use ◽  
Height Step ◽  
Deposited Film ◽  
Arc Deposition ◽  
Coated Area

An ultra- thin Ti film with a thickness of less than 30 nm was deposited on the surface of a silicon wafer by the filtered arc deposition system. A novel technique was adopted to create a height step between the coated area and non-coated area (silicon wafer) during deposition. The surface morphology and thickness of the film was detected by atomic force microscopy (AFM). The AFM results showed that the deposited film formed a smooth structure on the silicon wafer and the height step between the coating and silicon wafer was clear enough to give the thickness of the deposited film. The composition of the deposited film was detected by a combined use of Ellipsometry and AFM. Natural oxidisation of Ti (TiO2) was found on the top of the Ti film after deposition, and the thickness of TiO2 was determined by ellipsometry to be about 0.6 nm.

Analysis of Indentation: Implications for Measuring Mechanical Properties With Atomic Force Microscopy

1999 ◽  
Vol 121 (5) ◽  
pp. 462-471 ◽  
Author(s):  
K. D. Costa ◽  
F. C. P. Yin
Keyword(s):  
Indentation Depth ◽  
Constitutive Law ◽  
Elastic Materials ◽  
Force Microscopy ◽  
Linear Elastic ◽  
Afm Indentation ◽  
Atomic Force ◽  
Afm Probe ◽  
Nonlinear Elastic ◽  
Indenter Geometry

Indentation using the atomic force microscope (AFM) has potential to measure detailed micromechanical properties of soft biological samples. However, interpretation of the results is complicated by the tapered shape of the AFM probe tip, and its small size relative to the depth of indentation. Finite element models (FEMs) were used to examine effects of indentation depth, tip geometry, and material nonlinearity and heterogeneity on the finite indentation response. Widely applied infinitesimal strain models agreed with FEM results for linear elastic materials, but yielded substantial errors in the estimated properties for nonlinear elastic materials. By accounting for the indenter geometry to compute an apparent elastic modulus as a function of indentation depth, nonlinearity and heterogeneity of material properties may be identified. Furthermore, combined finite indentation and biaxial stretch may reveal the specific functional form of the constitutive law—a requirement for quantitative estimates of material constants to be extracted from AFM indentation data.

scholarly journals Configuration Transitions of Free Circular DNA System Induced by Nicks

2015 ◽  
Vol 2015 ◽  
pp. 1-7
Author(s):  
Chao Ji ◽  
Lingyun Zhang ◽  
Pengye Wang
Keyword(s):  
Physical Mechanism ◽  
Effective Length ◽  
Base Pairs ◽  
Circular Dna ◽  
Force Microscopy ◽  
System A ◽  
Atomic Force ◽  
Torsional Energy ◽  
Dna Base ◽  
Quantitative Results

Nicks have important functions in the biological functions of DNA-mediated systems. However, the configuration transitions of DNA molecules induced by the presence of nicks have not been quantitatively investigated. This study aims to analyze the configuration transitions of free circular DNA system induced by nicks. Using atomic force microscopy, two configuration states were observed in the free circular DNA system with different nick numbers. To understand the transmission of torsional energy among DNA base pairs, we defined the effective length and nicking angle. In the free DNA system, a torsional energy of 233 bp can be completely released by nicks. Based on the experimental and quantitative results, we propose a physical mechanism to explain the configuration transitions of the free circular DNA system induced by nicks. This study and the presented method are very useful in understanding the physical mechanism of nicks in DNA-mediated systems.

scholarly journals The Moving Finger Writes: Carbon Nanotubes as AFM Probe Tips

2004 ◽  
Vol 12 (1) ◽  
pp. 34-37
Author(s):  
Katerina Moloni
Keyword(s):  
Carbon Nanotubes ◽  
Surface Science ◽  
Scanning Probe Microscopy ◽  
Integrated Circuit ◽  
Surface Characterization ◽  
Semiconductor Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Probe ◽  
Immense Potential

After carbon nanotubes (CNT) were discovered in 1991, many applications have been proposed that utilize their extraordinary electrical and mechanical properties. One application is as tips for scanning probe microscopy where CNTs offer several advantages including high resolution and the capability to image deep, narrow structures. A recent study of CNT scanning probes for atomic force microscopy (AFM) in semiconductor surface science concluded that an AFM with CNT tips has immense potential as a surface characterization tool in integrated circuit manufacture. Previously researchers had to construct their own CNT probes, but recently CNT AFM probes have become commercially available.Carbon nanotubes (sometimes called buckytubes) are closed seamless shells ot graphitic carbon typically one to tens of nanometers in diameter and several micrometers long. The structure of a closed-dome single-walled nanotube is illustrated in Figure 1. Carbon nanotube probe tips offer several advantages.

Digital force-feedback for protein unfolding experiments using atomic force microscopy

2006 ◽  
Vol 18 (4) ◽  
pp. 044022 ◽  
Author(s):  
Christian A Bippes ◽  
Harald Janovjak ◽  
Alexej Kedrov ◽  
Daniel J Muller
Keyword(s):  
Atomic Force Microscopy ◽  
Protein Unfolding ◽  
Force Feedback ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Revealing the planar chemistry of two-dimensional heterostructures at the atomic level

2015 ◽  
Vol 6 (1) ◽  
Author(s):  
Harry Chou ◽  
Ariel Ismach ◽  
Rudresh Ghosh ◽  
Rodney S. Ruoff ◽  
Andrei Dolocan
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Layer Structure ◽  
Atomic Level ◽  
Chemical Information ◽  
Two Dimensional ◽  
Force Microscopy ◽  
System A ◽  
Atomic Force

Abstract Two-dimensional (2D) atomic crystals and their heterostructures are an intense area of study owing to their unique properties that result from structural planar confinement. Intrinsically, the performance of a planar vertical device is linked to the quality of its 2D components and their interfaces, therefore requiring characterization tools that can reveal both its planar chemistry and morphology. Here, we propose a characterization methodology combining (micro-) Raman spectroscopy, atomic force microscopy and time-of-flight secondary ion mass spectrometry to provide structural information, morphology and planar chemical composition at virtually the atomic level, aimed specifically at studying 2D vertical heterostructures. As an example system, a graphene-on-h-BN heterostructure is analysed to reveal, with an unprecedented level of detail, the subtle chemistry and interactions within its layer structure that can be assigned to specific fabrication steps. Such detailed chemical information is of crucial importance for the complete integration of 2D heterostructures into functional devices.

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