Designing indirect–direct bandgap transitions in double perovskites

2017 ◽  
Vol 4 (4) ◽  
pp. 688-693 ◽  
Author(s):  
T. Thao Tran ◽  
Jessica R. Panella ◽  
Juan R. Chamorro ◽  
Jennifer R. Morey ◽  
Tyrel M. McQueen

A general design strategy is presented for tuning the convergence of direct and indirect bandgaps based on chemical adjustment of the s- and p-orbital character of the conduction band minimum.

1964 ◽  
Vol 25 (4) ◽  
pp. 443-447 ◽  
Author(s):  
W.G. Spitzer ◽  
C.A. Mead

2020 ◽  
Author(s):  
Yassine Raoui ◽  
Hamid Ez-Zahraouy ◽  
Samrana Kazim ◽  
Shahzada Ahmad

<p>Mixed cation and anion based perovskites solar cells (FAPbI<sub>3</sub>)<sub>0.85</sub>(MAPbBr<sub>3</sub>)<sub>0.15</sub> gave enhanced stability under outdoor conditions, however, it yielded limited power conversion efficiency when SnO<sub>2</sub> and Spiro-OMeTAD were employed as electron and hole transport layer (ETL/HTL). The inevitable interfacial recombination of charge carriers at ETL/perovskite and perovskite/HTL interface diminished the efficiency in planar (n-i-p) perovskite solar cells. Employing computational approach for uni-dimensional device simulator, the effect of band offset on charge recombination at both interfaces were investigated. We noted that it acquired cliff structure when the conduction band minimum of the ETL is lower than that of the perovskite, and thus maximizes interfacial recombination. However, if the conduction band minimum of ETL is higher than perovskite, i.e. spike structure is formed, which improve the performance of solar cell up to an optimum value of conduction band offset allowing to reach performance of 25.21%, with an open circuit voltage (<i>V</i><sub>oc</sub>) of 1231 mV, a current density <i>J</i><sub>sc</sub> of 24.57 mA/cm<sup>2</sup> and a fill factor of 83.28%. Additionally, we found that beyond the optimum offset value, large spike structure could decrease the performance. With an optimized, energy level of Spiro-OMeTAD and the thickness of mixed-perovskite layer performance of 26.56 % can be attained. Our results demonstrate a detailed understanding about the energy level tuning between the charge selective layers and perovskite and furthermore how the improvement in PV performance can be achieved by adjusting the energy level offset.</p>


1964 ◽  
Vol 2 (2) ◽  
pp. 62
Author(s):  
W.G. Spitzer ◽  
C.A. Mead

Nanoscale ◽  
2021 ◽  
Author(s):  
Dan-Dong Wang ◽  
Xin-Gao Gong ◽  
Jihui Yang

Interlayer interactions play important roles in manipulating the electronic properties of layered semiconductors. One common mechanism is that the valance band maximum (VBM) and the conduction band minimum (CBM) in...


1996 ◽  
Vol 451 ◽  
Author(s):  
E. Schroten ◽  
A. Goossens ◽  
J. Schoonman

ABSTRACTAn electrolyte electroreflectance study has been performed on boron phosphide thin films epitaxially grown on silicon (100) substrates. To our knowledge, this paper is the first report on the electrolyte electroreflectance spectrum of BP. All our boron phosphide of 1.5 μm thick films show a pronounced peak at the energy 4.25 eV, indicating a critical point in the valence or conduction band of the semiconductor. Photoreflectance measurements confirm these results. The 4.25 eV energy level is much lower than previously reported direct bandgap values of BP. The electrolyte electroreflectance spectrum of much thinner layers shows, besides the 4.25 eV peak, some other features at still lower incident photon energies caused by interference effects.


2014 ◽  
Vol 11 (11) ◽  
pp. 1154-1160 ◽  
Author(s):  
Simon Ausländer ◽  
Pascal Stücheli ◽  
Charlotte Rehm ◽  
David Ausländer ◽  
Jörg S Hartig ◽  
...  

2005 ◽  
Vol 865 ◽  
Author(s):  
S.H. Kong ◽  
H. kashiwabara ◽  
K. Ohki ◽  
K. Itoh ◽  
T. Okuda ◽  
...  

AbstractDirect characterization of band alignment at chemical bath deposition (CBD)-CdS/Cu0.93 (In1-xGax)Se2 has been carried out by photoemission spectroscopy (PES) and inverse photoemission spectroscopy (IPES). Ar ion beam etching at the condition of the low ion kinetic energy of 350 eV yields a removal of surface contamination as well as successful measurement of the intrinsic properties of each layer and the interfaces. Especially interior regions of the wide gap CIGS layers with a band gap of 1.4 ∼ 1.6 eV were successfully exposed. IPES spectra revealed that the conduction band offset (CBO) at the interface region of the wide gap CIGS with x = 0.60 and 0.75 was negative, where the conduction band minimum of CdS was lower than that of CIGS. It was also observed that the energy spacing between conduction band minimum (CBM) of CdS layer and valence band maximum (VBM) of Cu0.93(In0.25Ga0.75)Se2 layer at interface region was no wider than that of the interface over the Cu0.93(In0.60Ga0.40)Se2 layer.


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