Drastic improvement in detection limits in energy dispersive X-ray fluorescence geometry utilizing micro-focused bremsstrahlung excitation in thin-film sample specimen

2021 ◽  
Vol 36 (4) ◽  
pp. 803-812
Author(s):  
Kaushik Sanyal ◽  
Buddhadev Kanrar ◽  
Sangita Dhara
Keyword(s):  
Thin Film ◽  
Detection Limit ◽  
Detection Limits ◽  
Energy Dispersive ◽  
Thin Film Sample ◽  
Film Sample ◽  
X Ray

Lowest detection limit achieved down to 0.4–4 ng mL−1 till date in a lab based XRF instrument.

Study of Different Dislocations in YBCO Thin Film

2003 ◽  
Vol 17 (18n20) ◽  
pp. 3530-3533
Author(s):  
S. X. Wang ◽  
W. L. Liu ◽  
S. H. Han ◽  
H. Zhang
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Screw Dislocation ◽  
Threading Dislocations ◽  
Thin Film Sample ◽  
Ybco Thin Film ◽  
Film Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Out Of Plane

A series thin film sample of YBCO with different value of Tc was studied by high-resolution X-ray diffraction. Two different threading dislocations, the in-plane twist and the out-of-plane tilt, were studied carefully. It is found that the value of Tc is much more sensitive to the substrate normal tilt than to the in-plane twist. Dislocations with different Burgers vectors are suggested to exert different influence on the value of Tc of the YBCO thin film. The screw dislocation in the film is strongly influences the properties of the YBCO.

A curved vacuum deposited thin film sample holder for Seemann-Bohlin diffractometer

1994 ◽  
Vol 209 (6) ◽  
Author(s):  
R. L. Banerjee ◽  
A. Richard
Keyword(s):  
Thin Film ◽  
Maximum Intensity ◽  
Radius Of Curvature ◽  
Thin Film Sample ◽  
Sample Holder ◽  
Film Sample ◽  
X Ray ◽  
Peak Intensity ◽  
Mechanical Linkage

AbstractA sample holder is designed and constructed for the Seemann-Bohlin diffractometer obtained by converting a Siemens horizontal X-ray diffractometer with the help of a mechanical linkage. This sample holder allows one to use a vacuum deposited thin film sample, curved to a radius of curvature equal to that of the diffraction circle. It is found that using a curved sample instead of a flat one increases the peak intensity by about 20% and reduces the profile broadening, measured at half its maximum intensity, from (0.85 ± 0.10)° 4

Thin Film Sample Holder for an X‐Ray Powder Camera

1971 ◽  
Vol 42 (4) ◽  
pp. 539-540
Author(s):  
A. K. Hochberg
Keyword(s):  
Thin Film ◽  
Thin Film Sample ◽  
Sample Holder ◽  
Film Sample ◽  
X Ray

scholarly journals In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample

2013 ◽  
Vol 102 (20) ◽  
pp. 201902 ◽  
Author(s):  
John M. Gregoire ◽  
Kechao Xiao ◽  
Patrick J. McCluskey ◽  
Darren Dale ◽  
Gayatri Cuddalorepatta ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Sample ◽  
Film Sample ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals A Method for Metal/Protein Stoichiometry Determination Using Thin-Film Energy Dispersive X-ray Fluorescence Spectroscopy

2019 ◽  
Vol 91 (18) ◽  
pp. 11502-11506 ◽  
Author(s):  
Silvia Fruncillo ◽  
Matteo Trande ◽  
Christopher F. Blanford ◽  
Alessandra Astegno ◽  
Lu Shin Wong
Keyword(s):  
Thin Film ◽  
Fluorescence Spectroscopy ◽  
Energy Dispersive ◽  
X Ray

scholarly journals Effect of Analysis Time on Detection Limit by Energy Dispersive X-Ray Fluorescence Spectrometry

2013 ◽  
Vol 25 (5) ◽  
pp. 2557-2560 ◽  
Author(s):  
Raci Ekinci ◽  
Neslihan Ekinci ◽  
Ebru Senemtasi
Keyword(s):  
Detection Limit ◽  
Energy Dispersive ◽  
Analysis Time ◽  
Fluorescence Spectrometry ◽  
X Ray

Determining Thin Film Density by Energy-Dispersive X-Ray Reflectivity: Application to a Spin-on-Glass Dielectric

1995 ◽  
Vol 405 ◽  
Author(s):  
W. E. Wallace ◽  
W. L. Wu
Keyword(s):  
Thin Film ◽  
Critical Angle ◽  
Energy Dispersive ◽  
Ion Scattering ◽  
Reflectivity Measurement ◽  
X Ray ◽  
Film Density ◽  
Novel Method ◽  
Improved Accuracy

AbstractA novel method for determining thin film density by energy dispersive x-ray reflectivity is demonstrated for a polymer-derived spin-on-glass dielectric intended for microelectronics applications. The effects of sample misalignment limit the accuracy of x-ray reflectivity as typically practiced. These effects may be properly accounted for by measuring the critical angle for reflection at many different x-ray wavelengths simultaneously. From this measurement, thin film density can be ascertained with much improved accuracy. The results of the x-ray reflectivity measurement are compared to those derived from MeV ion scattering.

Thin-Film Analysis of Clay Particles Using Energy Dispersive X-ray Analysis1

1982 ◽  
Vol 30 (5) ◽  
pp. 375-382 ◽  
Author(s):  
G. N. White
Keyword(s):  
Thin Film ◽  
Energy Dispersive ◽  
Film Analysis ◽  
Clay Particles ◽  
X Ray ◽  
Thin Film Analysis
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