scholarly journals In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample

2013 ◽  
Vol 102 (20) ◽  
pp. 201902 ◽  
Author(s):  
John M. Gregoire ◽  
Kechao Xiao ◽  
Patrick J. McCluskey ◽  
Darren Dale ◽  
Gayatri Cuddalorepatta ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Sample ◽  
Film Sample ◽  
X Ray Diffraction ◽  
X Ray

Study of Different Dislocations in YBCO Thin Film

2003 ◽  
Vol 17 (18n20) ◽  
pp. 3530-3533
Author(s):  
S. X. Wang ◽  
W. L. Liu ◽  
S. H. Han ◽  
H. Zhang
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Screw Dislocation ◽  
Threading Dislocations ◽  
Thin Film Sample ◽  
Ybco Thin Film ◽  
Film Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Out Of Plane

A series thin film sample of YBCO with different value of Tc was studied by high-resolution X-ray diffraction. Two different threading dislocations, the in-plane twist and the out-of-plane tilt, were studied carefully. It is found that the value of Tc is much more sensitive to the substrate normal tilt than to the in-plane twist. Dislocations with different Burgers vectors are suggested to exert different influence on the value of Tc of the YBCO thin film. The screw dislocation in the film is strongly influences the properties of the YBCO.

Electromechanical Properties of Pb(Mg1/3Nb2/3)O3 Thin Film Capacitors

1998 ◽  
Vol 541 ◽  
Author(s):  
G. Catalan ◽  
M.H. Corbett ◽  
R.M. Bowman ◽  
J.M. Gregg
Keyword(s):  
Thin Film ◽  
Compressive Strain ◽  
X Ray Diffraction ◽  
Leakage Currents ◽  
Plan View ◽  
X Ray ◽  
Thin Film Capacitors ◽  
Transmission Electron ◽  
Tensile Strains

AbstractPulsed Laser Deposition was used to grow Pb(Mg1/3Nb2/3)O3 (PMN) thin film planar capacitor structures. PMN crystallography was verified by x-ray diffraction and plan-view Transmission Electron Microscopy (TEM). Capacitance of the thin film structures was measured as a function of temperature and frequency. Leakage current was also measured for each capacitor. A DC field was subsequently applied and crystallographic strain was monitored in-situ by X-ray diffraction. The electromechanical strain was found to strongly depend on the deposition conditions for each capacitor. Tensile strains of ∼0.2% and compressive strains of ∼0.3% parallel to the applied field were measured for capacitors of different oxygen contents and thicknesses. We propose that the compressive strain is caused by the combined effect of joule heating of the capacitor structure, caused by large leakage currents, and epitaxial coupling between substrate and films. Electrostrictive tensile strains are of the same order as observed inbulk.

In situ high temperature X-ray diffraction studies of ZnO thin film

2011 ◽  
Vol 20 (9) ◽  
pp. 096102 ◽  
Author(s):  
Xiang-Cun Chen ◽  
Jie-Ping Zhou ◽  
Hai-Yang Wang ◽  
Peng-Shou Xu ◽  
Guo-Qiang Pan
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
Zno Thin Film ◽  
X Ray Diffraction ◽  
X Ray

In situ X-ray Investigation of Hydrogen Charging in Thin Film Bimetallic Electrodes

1997 ◽  
Vol 12 (8) ◽  
pp. 2091-2098 ◽  
Author(s):  
Najeh M. Jisrawi ◽  
Harold Wiesmann ◽  
M. W. Ruckman ◽  
T. R. Thurston ◽  
G. Reisfeld ◽  
...  
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Hydrogen Uptake ◽  
Metallic Films ◽  
X Ray Diffraction ◽  
Cell Potential ◽  
Multilayered Thin Film ◽  
X Ray ◽  
Multilayer Electrode

Hydrogen uptake and discharge by thin metallic films under potentiostatic control was studied using x-ray diffraction at the National Synchroton Light Source (NSLS). The formation of metal-hydrogen phases in Pd, Pd-capped Nb, and Pd/Nb multilayer electrode structures was deduced from x-ray diffraction data and correlated with the cyclic voltammetry (CV) peaks. The x-ray data were also used to construct a plot of the hydrogen concentration as a function of cell potential for a multilayered thin film.

In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction

2007 ◽  
Vol 126 (1) ◽  
pp. 332-337 ◽  
Author(s):  
R MARTINS ◽  
N SCHELL ◽  
R SILVA ◽  
L PEREIRA ◽  
K MAHESH ◽  
...  
Keyword(s):  
Thin Film ◽  
Intermediate Layer ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Study

Drastic improvement in detection limits in energy dispersive X-ray fluorescence geometry utilizing micro-focused bremsstrahlung excitation in thin-film sample specimen

2021 ◽  
Vol 36 (4) ◽  
pp. 803-812
Author(s):  
Kaushik Sanyal ◽  
Buddhadev Kanrar ◽  
Sangita Dhara
Keyword(s):  
Thin Film ◽  
Detection Limit ◽  
Detection Limits ◽  
Energy Dispersive ◽  
Thin Film Sample ◽  
Film Sample ◽  
X Ray

Lowest detection limit achieved down to 0.4–4 ng mL−1 till date in a lab based XRF instrument.

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