scholarly journals Quantitative measurement of charge accumulation along a quasi-one-dimensional W5O14 nanowire during electron field emission

Nanoscale ◽  
2020 ◽  
Vol 12 (19) ◽  
pp. 10559-10564
Author(s):  
Fengshan Zheng ◽  
Giulio Pozzi ◽  
Vadim Migunov ◽  
Luka Pirker ◽  
Maja Remškar ◽  
...  

Electric field map and equipotential contour lines of a quasi-one-dimensional W5O14 nanowire under an electrical bias of 150 V. Experimental cumulative charge profiles along the length of the nanowire are consistent with theoretical simulations.

2013 ◽  
Vol 566 ◽  
pp. 175-178
Author(s):  
Shinji Ohtani ◽  
Kenkichiro Kobayashi

Films of hexagonal BN (h-BN) codoped with Mg and O atoms were grown on n-type Si and quartz substrates heated at 500 °C by sputtering targets consisting of h-BN and MgO powders. An absorption is seen at a wavelength < 400 nm for h-BN films prepared in an Ar atmosphere. In contrast, films prepared from the target containing 0.25 mol% MgO in an atmosphere of Ar + 1% O2 shows an absorption at a wavelength < 260 nm and an electron field emission at a lower electric field of 3.6 V/μm.


2001 ◽  
Vol 704 ◽  
Author(s):  
S.G. Wang ◽  
Q. Zhang ◽  
S.F. Yoon ◽  
J. Ahn ◽  
Q. Wang ◽  
...  

AbstractIn this paper, the field emission properties of nano-diamond films were investigated by measuring the curves of emission current density (J) versus applied electric field (E). The nano-diamond films were prepared on n-type (100) silicon substrate by microwave plasma enhanced chemical vapor deposition (MPECVD) technique using a gas mixture of nitrogen-methane-hydrogen. Field emission results show that, with increasing hydrogen gas flow ratio of [H2]/[N2+CH4+H2] from 0 to 10 %, diamond grain size increases from 5 to 60 nm, threshold electric field for electron field emission increases from 1.2 to 5.75 V/μm, and emission current density decreases from 820 to 560 μA/cm2, demonstrating that small grain size nano-diamond films are promising as a cathode material for low-field electron emitters.


2010 ◽  
Vol 21 (45) ◽  
pp. 455601 ◽  
Author(s):  
Hung-Chi Wu ◽  
Te-Chien Hou ◽  
Yu-Lun Chueh ◽  
Lih-Juann Chen ◽  
Hsin-Tien Chiu ◽  
...  

2000 ◽  
Vol 621 ◽  
Author(s):  
Makoto Kasu ◽  
Naoki Kobayashi

ABSTRACTWe investigated electron field emission (FE) from heavily Si-doped AlN grown by metalorganic vapor phase epitaxy. We found that, as the Si-dopant density increases, the threshold electric field decreases, which indicates that electrons are supplied to the surface effectively as a result of Si doping. We show that heavily Si-doped AlN has a maximum FE current of 347 μA (the maximum current density of 11 mA/cm2), stable FE current (fluctuation: 3%), and a threshold electric field of 34 V/μm. We observed visible light emission (luminance: about 1200 cd/m2) from phosphors excited by the field-emitted electrons.


2011 ◽  
Vol 49 (4) ◽  
pp. 342-347
Author(s):  
Kyoungwan Park ◽  
Seungman An ◽  
Taekyung Yim ◽  
Kyungsu Lee ◽  
Jeongho Kim ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document