Investigation of copper nanoscale electro-crystallization under directed and non-directed electrodeposition from dilute electrolytes

CrystEngComm ◽  
2021 ◽  
Author(s):  
Mark Aarts ◽  
Stefan van Vliet ◽  
Roland Bliem ◽  
Esther Alarcon-Llado
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Ex Situ ◽  
Gold Substrate ◽  
Force Microscopy ◽  
Atomic Force ◽  
Close Proximity

In situ and ex situ atomic force microscopy was used to investigate crystal growth in copper electro-crystallization localized and directed by a moving nanoelectrode in close proximity to a gold substrate in a highly dilute electrolyte.

Ex Situ and In Situ Thermal Transformations of M-50 Pitch Revealed by Non-contact Atomic Force Microscopy

2021 ◽  
Author(s):  
Pengcheng Chen ◽  
Jordan N. Metz ◽  
Adam S. Gross ◽  
Stuart E. Smith ◽  
Steven P. Rucker ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ex Situ ◽  
Thermal Transformations ◽  
Force Microscopy ◽  
Atomic Force

Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys measured by Atomic Force Microscopy

2003 ◽  
Vol 803 ◽  
Author(s):  
J. Kalb ◽  
F. Spaepen ◽  
M. Wuttig
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Data Storage ◽  
Optical Data Storage ◽  
Crystal Nucleation ◽  
Ex Situ ◽  
Optical Data ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTBoth the crystal nucleation rate and the crystal growth velocity of sputtered amorphous Ag0.055In0.065Sb0.59Te0.29 and Ge4Sb1Te5 thin films used for optical data storage were determined as a function of temperature. Crystals were directly observed using ex-situ atomic force microscopy, and their change in size after each anneal was measured. Between 140°C and 185°C, these materials exhibited similar crystal growth characteristics, but differed in their crystal nucleation characteristics. These observations provide an explanation for the different re-crystallization mechanisms observed upon laser-induced crystallization of amorphous marks.

In situ crystal growth of nanoporous zincophosphate observed by atomic force microscopy

2010 ◽  
Vol 46 (7) ◽  
pp. 1047 ◽  
Author(s):  
Mark A. Holden ◽  
Pablo Cubillas ◽  
Michael W. Anderson
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Force Microscopy ◽  
Atomic Force

In situ atomic force microscopy of layer-by-layer crystal growth and key growth concepts

2006 ◽  
Vol 51 (6) ◽  
pp. 1063-1074 ◽  
Author(s):  
L. N. Rashkovich ◽  
J. J. De Yoreo ◽  
C. A. Orme ◽  
A. A. Chernov
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Layer By Layer ◽  
Force Microscopy ◽  
Atomic Force

Real-Time In Situ Atomic Force Microscopy Imaging of Bismuth Crystal Growth

Langmuir ◽  
2009 ◽  
Vol 25 (19) ◽  
pp. 11228-11231 ◽  
Author(s):  
Sara E. C. Dale ◽  
Simon J. Bending ◽  
Laurence M. Peter
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Real Time ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bismuth Crystal ◽  
Atomic Force Microscopy Imaging
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