Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys measured by Atomic Force Microscopy

2003 ◽  
Vol 803 ◽  
Author(s):  
J. Kalb ◽  
F. Spaepen ◽  
M. Wuttig
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Data Storage ◽  
Optical Data Storage ◽  
Crystal Nucleation ◽  
Ex Situ ◽  
Optical Data ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTBoth the crystal nucleation rate and the crystal growth velocity of sputtered amorphous Ag0.055In0.065Sb0.59Te0.29 and Ge4Sb1Te5 thin films used for optical data storage were determined as a function of temperature. Crystals were directly observed using ex-situ atomic force microscopy, and their change in size after each anneal was measured. Between 140°C and 185°C, these materials exhibited similar crystal growth characteristics, but differed in their crystal nucleation characteristics. These observations provide an explanation for the different re-crystallization mechanisms observed upon laser-induced crystallization of amorphous marks.

Investigation of copper nanoscale electro-crystallization under directed and non-directed electrodeposition from dilute electrolytes

CrystEngComm ◽  
2021 ◽  
Author(s):  
Mark Aarts ◽  
Stefan van Vliet ◽  
Roland Bliem ◽  
Esther Alarcon-Llado
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Ex Situ ◽  
Gold Substrate ◽  
Force Microscopy ◽  
Atomic Force ◽  
Close Proximity

In situ and ex situ atomic force microscopy was used to investigate crystal growth in copper electro-crystallization localized and directed by a moving nanoelectrode in close proximity to a gold substrate in a highly dilute electrolyte.

A Study of the Surface Texture of Polycrystalline Phosphor Films Using Atomic Force Microscopy

1994 ◽  
Vol 343 ◽  
Author(s):  
R. Revay ◽  
J. Schneir ◽  
D. Brower ◽  
J. Villarrubia ◽  
J. Fu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Size ◽  
Surface Texture ◽  
Film Surface ◽  
Optical Data Storage ◽  
Optical Data ◽  
Film Material ◽  
Phosphor Material ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTStimulable phosphor thin films are being investigated for use as optical data storage media. We have successfully applied atomic force microscopy (AFM) to the measurement of the surface texture of these films. Determination of the surface texture of the films is important for evaluating the effect of surface quality on optical scatter. In other thin film material systems it has been found that the surface “bumps” revealed by AFM correspond to grains in the film. This is not the case for the stimulable phosphor films used in our study. We have determined the grain size of our phosphor films by transmission electron microscopy (TEM) and x-ray diffraction (XRD). The grain size from TEM and XRD does not correlate with the size of the AFM surface “bumps.” For example, in two of the five films studied, the XRD derived grain size varies by a factor of two but the size of the surface “bumps” remains the same. We conclude that the texture of the film surface is not directly determined by the grain size of the phosphor material.

scholarly journals Crystal growth of the core and rotated epitaxial shell of a heterometallic metal-organic framework revealed with atomic force microscopy

2021 ◽  
Author(s):  
Fajar Inggit Pambudi ◽  
Michael William Anderson ◽  
Martin Attfield
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Metal Organic Framework ◽  
Metal Organic Frameworks ◽  
Force Microscopy ◽  
The Core ◽  
Atomic Force ◽  
Metal Organic ◽  
Surface Crystal ◽  
Organic Framework

Atomic force microscopy has been used to determine the surface crystal growth of two isostructural metal-organic frameworks, [Zn2(ndc)2(dabco)] (ndc = 1,4-naphthalene dicarboxylate, dabco = 4-diazabicyclo[2.2.2]octane) (1) and [Cu2(ndc)2(dabco)] (2) from...

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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