Decomposing and Analyzing Contact Resonance Frequency in Contact Mode Voltage Modulated Scanning Probe Microscopies

2022 ◽  
Author(s):  
Yue Liu ◽  
Bingxue Yu ◽  
Hongli Wang ◽  
Kaiyang Zeng
Keyword(s):  
Resonance Frequency ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Contact Mode ◽  
Probe Microscopy ◽  
Contact Resonance

The contact mode voltage modulated scanning probe microscopy (SPM) techniques, such as switching spectroscopy piezoresponse force microscope (SS-PFM), are powerful tools for detecting local electromechanical behaviors. However, interpreting their signals,...

Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy

2007 ◽  
Vol 280-283 ◽  
pp. 1903-1908
Author(s):  
Sheng Guo Lu ◽  
Haydn Chen ◽  
C.L. Mak ◽  
K.H. Wong ◽  
H.W.L. Chan ◽  
...  
Keyword(s):  
Thin Films ◽  
Strontium Titanate ◽  
Barium Strontium Titanate ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Single Crystal Substrate ◽  
Contact Mode ◽  
Probe Microscopy ◽  
Barium Strontium ◽  
Graded Structures

Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3 (x = 0.75, 0.8, 0.9, 1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperaturedependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric – paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

Intermittent Contact Dynamics of a Micro-Cantilever in High Speed Contact Mode Scanning Probe Microscopy

2015 ◽  
Author(s):  
Somnath Dey ◽  
V. Kartik
Keyword(s):  
Scanning Probe Microscopy ◽  
High Speed ◽  
Image Resolution ◽  
Contact Dynamics ◽  
Scanning Probe ◽  
Contact Mode ◽  
Frequency Spectra ◽  
Probe Microscopy ◽  
Intermittent Contact ◽  
Micro Cantilever

The intermittent contact dynamics of a scanning probe microscopy (SPM) micro-cantilever are investigated in the context of high speed imaging in contact mode. At high scan speeds the cantilever can completely detach from the sample surface, and this lowers the achievable image resolution and limits the imaging speed. An analysis is performed, modeling the micro-cantilever as an Euler-Bernoulli beam and approximating the effect of the tip’s contact with the surface by an attached spring with an end mass that is subjected to attractive/repulsive interaction force. At low scan speeds, the cantilever follows the surface profile, while the frequency spectra exhibit a number of side-bands, while at higher speeds, the contact is intermittent. The sensitivity of the cantilever’s deflection varies along the length and hence the image resolution strongly depends on the point selected for optical laser deflection.

scholarly journals Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

Sensors ◽  
2019 ◽  
Vol 19 (20) ◽  
pp. 4510 ◽  
Author(s):  
Omur E. Dagdeviren ◽  
Yoichi Miyahara ◽  
Aaron Mascaro ◽  
Tyler Enright ◽  
Peter Grütter
Keyword(s):  
Resonance Frequency ◽  
Frequency Shift ◽  
Scanning Probe Microscopy ◽  
Oscillation Amplitude ◽  
Operating Conditions ◽  
Numerical Calculations ◽  
Scanning Probe ◽  
Amplitude Dependence ◽  
Interaction Potentials ◽  
Probe Microscopy

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based on the accurate measurement of the resonance frequency shift due to the tip-sample interaction. Here, we experimentally show that the resonance frequency of oscillating probes used for SPM experiments change systematically as a function of oscillation amplitude under typical operating conditions. This change in resonance frequency is not due to tip-sample interactions, but rather due to the cantilever strain or geometric effects and thus the resonance frequency is a function of the oscillation amplitude. Our numerical calculations demonstrate that the amplitude dependence of the resonance frequency is an additional yet overlooked systematic error source that can result in nonnegligible errors in measured interaction potentials and forces. Our experimental results and complementary numerical calculations reveal that the frequency shift due to this amplitude dependence needs to be corrected even for experiments with active oscillation amplitude control to be able to quantify the tip-sample interaction potentials and forces with milli-electron volt and pico-Newton resolutions.

Evaluation of the electrical contact area in contact-mode scanning probe microscopy

2015 ◽  
Vol 117 (21) ◽  
pp. 214305 ◽  
Author(s):  
Umberto Celano ◽  
Thomas Hantschel ◽  
Guido Giammaria ◽  
Ravi Chandra Chintala ◽  
Thierry Conard ◽  
...  
Keyword(s):  
Contact Area ◽  
Scanning Probe Microscopy ◽  
Electrical Contact ◽  
Scanning Probe ◽  
Contact Mode ◽  
Probe Microscopy

scholarly journals Contact resonance frequencies and their harmonics in scanning probe microscopy

2021 ◽  
Author(s):  
Eduardo A. Murillo‐Bracamontes ◽  
Juan J. Gervacio‐Arciniega ◽  
Edgar Cruz‐Valeriano ◽  
Christian I. Enríquez‐Flores ◽  
Martha A. Palomino‐Ovando ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Resonance Frequencies ◽  
Contact Resonance

The Role of Scanning Probe Microscopy in Drug Delivery Research

1996 ◽  
Vol 13 (3-4) ◽  
pp. 225-256 ◽  
Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams
Keyword(s):  
Drug Delivery ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
Sign in / Sign up

Export Citation Format

Share Document